Nikon Metrology

Nikon Mexico opens new metrology showroom

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Due to increased business in Latin America, Nikon Mexico  inaugurated on January 26 a new metrology showroom in Queretaro, Mexico. Nikon hosted an open house event to celebrate the grand opening , showcasing their new state-of-the-art show room. The event which was open to the public included tours of the new facility and a variety of interactive product demonstrations. A vast range of products were displayed to showcase some of Nikon’s capabilities including: Industrial and Measuring microscopes Portable arm & Scanners Computed Tomography (CT) Read more...

Inspect-X 5.0 enables higher resolution scans for an improved insight into defects

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Nikon Metrology introduces Inspect-X 5.0, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems. Inspect-X 5.0 is now a native 64-bit application and supports a new 16Mpixel flat panel detector enabling much higher resolution CT scans. Another new feature is the Golden Image Comparison tool, enabling operators to intelligently and immediately make a pass/fail sentence on the part being inspected. Introducing an all-new 64-bit platform Inspect-X 5.0 is now anative 64-bit application,enabling the Read more...

New Knowledge From Ancient Specimens Using X-Ray Computed Tomography (CT)

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The Smithsonian’s Natural History Museum together with Chesapeake Testing consulting firm are using computed tomography (micro CT) to not only scan marine mammal fossils, but also make 3D scans and data available for knowledge-seekers around the world. The mission of the Smithsonian Institution, the world’s largest museum and research complex, is admirably brief: “The increase and diffusion of knowledge.” The vision statement, a bit longer, is no less cogent: “Shaping the future by preserving our heritage, discovering new knowledge, and Read more...

Upcoming Webinar: Taking Micro-CT out of the Research Lab and onto the Production Line

Industrial micro-CT: From the research lab to the production line. Feb 17th, 2016 (2:00 PM – 3:00 PM EST — 8:00PM – 9:00PM CET) Typically X-ray micro computed tomography (CT) has been seen as a slow process carried out in the research lab to evaluate failures or spot defects. It has never been fast enough to be used on a production line – that is until now! Recent advances in high-resolution high-flux rotating targets for Read more...

Richard Weston “The architect with a microscope”

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Revisiting the Richard Weston studio Here you can follow Richard Weston’s story, from his silk scarves at London’s Liberty store and images in the Olympic village to the application of the Nikon microscope solution. In the article “The architect with a microscope” written by Rebecca Pool for Microscopy & Analysis, some special images can be found. The link to the online article is below, alongside our previous blog item featuring Richard.   Take a look at the Microscopy & Analysis piece here or to revisit our previous article please Read more...

Nikon Mexico Opens New Metrology Showroom

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Nikon Mexico Opens New Metrology Showroom Brighton, MI – December 22, 2015 – As a result of increased business in Latin America, Nikon Mexico will be opening a new metrology showroom located in Queretaro, Mexico. To celebrate their grand opening they will be hosting an open house on Tuesday, January 26, 2016 from 1:00 pm – 3:00 pm. The open house is free to the public and will showcase their new state of the art metrology showroom. In addition to tours of the new office, application engineers will be available to provide customers with interactive Read more...

Nikon microscope enables more efficient rock sample categorisation

Dr Simon Schneider using the Nikon Metrology SMZ18 stereomicroscope at CASP

CASP researchers choose “brilliant” stereomicroscope for geological research CASP is a non-profit, charitable trust carrying out field- literature-, and analysis-based geological research in prospective hydrocarbon basins. Funding comes entirely from subscriptions by the oil and gas industry. CASP members of staff publish the results of their research in internationally renowned peer-reviewed scientific journals after a suitable delay. Fieldwork forms the core of CASP’s work. This not only involves field descriptions and photographs of rock Read more...

New Case Story: Open University establishes world lead in weld testing for safety-critical applications

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Nikon Metrology photomicrography equipment supports high precision stress-strain analysis at elevated temperatures and under vacuum To assist research into optimal procedures for welding aero engine fan blades, nuclear pressure vessels and other safety-critical fabrications, a new material testing capability has been developed at the Open University in Milton Keynes, UK. The digital image correlation-based technique uses digital images to measure spatially resolved deformation of test samples at elevated temperatures under vacuum. This method allows Read more...

Computed Tomography depicts the evolution of electric light bulbs

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This stunning X-ray image depicts the evolution of electric light bulbs. From left to right: an Edison-style incandescent light bulb, a fluorescent light bulb and a light-emitting-diode (LED) bulb. This picture recently was awarded with the 3rd place in the “2015 After Image photo contest organized by OSA’s Optics & Photonics News”. The Nikon Metrology XT H 225 Computed Tomography (CT) system used boasts a wide range of applications from quality control and failure analysis to material research. The powerful micro-focus X-ray source Read more...

Nikon Metrology announces new benchtop JCM-6000Plus NeoScope™

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The new benchtop scanning electron microscope, JCM-6000Plus NeoScope™, is designed to fulfill the diversifying needs of customers. The JCM-6000Plus is the third generation of the popular NeoScope benchtop SEM designed for convenience and ease of use. Nikon and JEOL have established a firm partnership in 2008 and this combination of experience and technology helps customers to obtain better insight in their products and finally increasing the daily productivity. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in Read more...