Laser Scanning Casts Savings Into Foundry’s Bottom Line

May 28, 2010

When your livelihood depends on an inventory of tools worth millions of dollars, you’re going to play it smart. You’re going to take care of that inventory. At least, you will if you’re Grede Foundries Inc., a Milwaukee-based company specializing in ferrous castings.

While its plant in Reedsburg, Wisconsin, USA, casts suspension parts, differential cases, crankshafts, and like parts, inspectors there check hundreds of tools regularly with a coordinate measuring machine (CMM) retrofitted with an LC50 laser scanner from Nikon Metrology in Brighton, Michigan. Their goal is to prevent the inevitable wear on the surface of the tool from progressing to the point that it causes quality problems and damage that is expensive to repair.

In casting, a tool called a pattern creates impressions in sand to create a mold into which molten steel is poured.

The constant pushing of the pattern against the sand causes a grinding action that abrades the surface and wears away important details. To retard this wear, Grede protects the surfaces by applying hard, abrasion-resistant chromium based coatings chosen carefully for each job. In time, though, the sand eventually wears them away too.

“After a specified number of cycles or when the operator can see wear, a pattern has to be inspected,” says Bernie Bill, Grede’s Layout Supervisor in charge of the Quality Laboratory. “We will rescan it and compare the measurements to the baseline.”

The baseline is the scan of a pattern that has been proven to produce good castings. “We don’t compare measurements to the original CAD model of the part because the pattern has to vary from it slightly to accommodate shrinkage,” says Bill. “We have to tweak the pattern to get the castings to meet customer specifications.” Once the patterns are able to make good castings and the customer approves them, Bill’s team scans the tool and stores the cloud of points as an STL file. The inspector aligns the pattern to a jig mounted on the CMM, retrieves the program used to create the baseline STL model of the pattern, and lets the CMM inspect the tool.

Then, Bill uses Nikon Metrology’s Focus Inspect software to compare the cloud of measurement points to the baseline and generate a color-coded map of the part. “You can have results within 15 minutes to a half an hour,” he says. Because each color represents a deviation from nominal, production can see at a glance where wear is occurring and how much wear has occurred.

“The results tell them what the plan for the pattern is going to be,” says Bill. “They know that they might be able to get by with running 5000 more cycles before sending the tool out for stripping and recoating.” Or they might pull the tool immediately to prevent further wear that would require welding and grinding the tool to bring it back into specification. If, however, they were to find that they were too late and that repairs were necessary, then the scanner would check the repairs afterward against the baseline to ensure that they returned the pattern to the approved specifications.

Monitoring wear is not the only use of the laser scanner and baseline scans. Scanning also comes in handy for helping engineering troubleshoot problems. For example, scanning can help diagnose an alignment problem that might prevent the two halves of the mold from fitting together just right to create a good seal. Without enough clearance, the two sandbanks on the outer edges of the two halves of the mold will crush each other, which can cause some sand to fall into the cavity. Iron forms around the sand, creating holes in the casting. Too much clearance, on the other hand, will let some molten metal leak from the parting line. The resulting thin, but hard flashing must be cut and ground away.

“So we scan both patterns, put the scans together, and check for clearance and crush electronically,” says Bill. “When we put it on the screen, we can see whether it’s a pattern problem and, if it is, exactly what they’ve got to fix.” Not only do the color maps eliminate the need to pour over tables of measurement data, but they also can be attached to work orders to show the problem clearly and exactly to toolmakers in the pattern shop.

In the past, the toolmakers would have had to weld and grind the patterns based upon their experience. Sometimes, the toolmakers would be lucky the first time, but most of the time, four to six iterations would be necessary to correct the problem. With laser scanning, however, diagnosing problems and repairing patterns is no longer a trial-and-error process. Because scanning collects more data in less time and presents it in a format that can be easily read, it eliminates guesswork. “Most of the time now, the pattern shop is making the right correction on the first try,” says Bill.

Moreover, scrap rates are way down. A good example is a set of tools for making a bracket for automobile brakes. Laser scanning helped engineering to find not only some clearance in the patterns but also some variation in the machine that exacerbated the problem and caused a lot of scrap. Based on the information gleaned from the color maps, engineering was able to reduce a 5.2% scrap rate down to 1.0%, thereby saving the company $48,000 a year on that job.

After using the scanner for six months, Grede estimated that using the laser scanner only one shift a day would save the company about $81,000 during the first year by reducing scrap alone – and that was after paying for the Nikon Metrology laser scanner and software. Almost six months later, he could see that he was going to have to revise his estimate upwards. So plans are to play it even smarter –to scale up and run the scanner another shift.

Click here to read this article on Tooling & Production.com.

Click here to read more about laser scanners.


Meet our laser scanning expert, Alex Lucas!

May 27, 2010

Alex Lucas is a Business Development Manager for Nikon Metrology, Inc.  He has spent the last seven years demonstrating various Nikon Metrology products, most recently CMM-based and handheld laser scanners complemented with Nikon Metrology’s Focus Inspection point cloud analysis software. Lucas has grown to be an expert in the laser scanning field having composed various articles that have appeared in Quality Magazine and Quality Digest.  In addition to composing articles in trade publications, Lucas has also been a featured speaker at previous Quality Expos in Chicago and Charlotte.  With his ongoing webinar series, Lucas delivers a refreshing and easy-to-understand take on the benefits and uses for laser scanning technology.  A graduate of the University of Michigan, Lucas has a degree in Mechanical Engineering and uses this expertise to understand customers’ metrology problems and deliver quality turnkey solutions incorporating Nikon Metrology laser scanning and software products.

Lucas has been married to his wife – and best friend, Erin, for five years and the two have a newborn son, Xavier and a daughter, Isabelle, that is one and a half.  In his spare time, Lucas enjoys spending time with his family, playing golf, soccer, and Nintendo Wii, and avidly watching his beloved University of Michigan Wolverines play football.  Having developed a green thumb over the past few years, Lucas meticulously tends to his herb and vegetable garden throughout the far too short summer months in Michigan.  When his metrology career draws to an end upon his retirement – which will be many decades from now – Lucas hopes to become a coffee shop barista and apply some of the same quality control methods learned from his time at Nikon Metrology to the world of coffee connoisseurs.

Click here to learn more about Nikon Metrology’s laser scanning solutions

Click here to read Alex’s latest laser scanning article in Quality Magazine.

 


Product News: Renishaw Five-Axis Probe Head Increases CMM Throughput

May 26, 2010

PH20 probe head increases touch-trigger coordinate measurement machine inspection throughput up to three times

Renishaw’s new PH20 probe head increases touch-trigger coordinate measurement machine (CMM) inspection throughput up to three times using fast, infinite, rotary positioning and unique “head touch” capability for high-speed point capture with minimal CMM movement.

Designed for use with the industry-standard TP20 touch-trigger probe, the new PH20 head brings five-axis inspection capability to smaller CMMs for the first time by optimizing the working volume of the measurement platform. The PH20 is available for new CMMs, as well as retrofit machines using shank or quill mounting. It can use most existing inspection programs for indexing heads without modification and requires no compressed air.

 

Renishaw’s new PH20 probe head can be retrofitted to your existing Nikon Metrology CMM.  Call (810) 220-4360 for details.

Or visit Renishaw at Eastec 2010, Booth #3128 to see the PH20 probe head using the TP20 touch-trigger probe in action on Nikon Metrology’s LK CMM.

Check out our retrofit options

Visit Quality Digest Magazine to read this full article.


Visit Nikon Metrology at Eastec 2010

May 25, 2010

AEastec this year, Nikon Metrology – Booth #3233, will feature the most complete and innovative metrology product portfolio, including:

130-inexiv-email.jpg  The iNEXIV Multi-Sensor Measuring System, a high-speed, fully-automated benchtop metrology and imaging system ideal for measuring dimensional features.
metris krypton system with k-scan.jpg The K-Series Optical CMM, a portable and highly accurate optical motion measurement system suitable for measuring the 3D positions of multiple targets in space.
144-mm-200.jpg The MM-200 Measuring Microscope, a powerful toolmakers microscope ideal for measuring a variety of metal, plastic and electronic parts.
smz745t_ds.jpg The SMZ745 Digital Stereomicroscope System, a trinocular stereoscopic microscope ideally suited for observation and digital imaging. Featuring an impressive 7.5x zoom range. 

We hope to see you at the show!

Contact us today to set up a demo at the show.


iGPS-enabled factory on YouTube

May 24, 2010

Nikon Metrology Adaptive Control solutions allow for metrology-assisted production. These solutions have proven to both save time, and to drive quality into the production process. The metrology-enabled into a robotic drilling solution allows for the metrology device to position, verify, and validate during the process.


Rachel Maddow of msnbc: “Metrology Rules!”

May 21, 2010

You have to watch this great video! 

Rachel Maddow, of the Rachel Maddow show on msnbc, celebrates World Metrology Day by exploring how measurement affects our lives. 

Also included in the segment is a great interview with Tom O’Brian, Chief of the Time and Frequency Division at NIST (National Institute of Standards and Technology).

Rachel relates some very interesting stories of what happens when metrology fails.  For example, in 1999, NASA lost a Mars orbiter when it missed its target.  Watch the video to find out why.

Click here to watch the video on msnbc


Dimensions in Medical Metrology

May 21, 2010

From optical comparators to computed tomography, metrology equipment is adapting to aid advances in medical manufacturing

Medical devices extend life or make living more comfortable. Driven by advances in machining, new devices are getting smaller and more complicated. Other devices, while not getting smaller, are increasing in demand, meaning production volumes are increasing. From looking into parts more deeply, combining sensors for more complete coverage, or speeding up processes in time, metrology equipment is improving in many dimensions for medical devices. This includes optical comparators, video metrology systems, CMMs, touch probes, and laser scanners. Even metrologygrade X-ray Computed Tomography (CT) is now offered. Each sensor has limitations and strengths.

CT Scan of Lizard Skull

In this Medical Manufacturing Magazine, x-ray and CT expert David Bate from Nikon Metrology talks about the various solutions that Computed Tomography (CT) machines have provided to the medical manufacturing industry.

Click here to read this entire article.


Celebrate World Metrology Day!

May 20, 2010

During World Metrology Day more than eighty States celebrate the impact of measurement on our daily life, no part of which is untouched by this essential, and largely hidden, aspect of modern society. Previous themes have included topics such as measurements in sport, the environment, medicine, and trade. The 2010 theme concentrates on how measurement influences science and stimulates innovation.

As the world strives to move on from its recent financial problems, and as Governments work to regenerate economies, we shall find that science and technology are the engines of economic growth and prosperity. These, in turn, rely on being able to measure correctly and to refer measurements to the same international reference standards. A world without accurate measurement is a world where science, technology, trade and society can’t communicate and where error and uncertainty would reign supreme.

Visit the World Metrology Day website at http://www.worldmetrologyday.org/ 

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Celebrate World Metrology Day with CMSC!

Register for this year’s CMSC conference on World Metrology Day, Thursday, May 20th, and we’ll knock $50 off the cost of a weekly registration.  This offer is good for today only.
 
Now that’s savings you can measure!

Register Today!
 
 
 
 

 

Why Should I Attend?

CMSC is an international group of close tolerance industrial measurement specialists and manufacturers and developers of alignment systems, targeting hardware, Portable Coordinate Measurement Machine’s (PCMMs), electronic theodolites, laser projection systems, laser trackers, laser radar, photogrammetry / videogrammetry systems and metrology software. No other conference or seminar in the country focuses specifically on 3D coordinate metrology.

Show Location

Grand Sierra Resort

 2500 E. Second Street
Reno, NV 89595

2010 Show Dates & Hours

July 12 – 16, 2010
 
Monday:
1-5pm (Registration)
7-9pm (Ice breaker)
Tues-Thurs:
8am-5pm
 
 
 
 

Click on image to enlarge and then right-click to save to your computer

Download the CMSC wallpaper to your desktop

 

  


ModelMaker MMDx facilitates handheld scanning

May 19, 2010

At the Rapid show, Nikon Metrology releases the ModelMaker MMDx series with digital ESP3 technology. MMDx now scans nearly all sample materials and surface finishes by automatically using the most optimal laser stripe settings. ModelMaker MMDx comes in different stripe widths and fits on Nikon Metrology and most other articulated arm brands.

Nikon Metrology, a new Nikon daughter company, markets the products of former Metris and the industrial inspection solutions of the Nikon Instruments division. Building on the legacy of being a leading innovator in non-contact metrology, Nikon Metrology introduces exciting laser scanning solutions for CMM and handheld applications.

ModelMaker MMDx scanners feature digital camera technology and Enhanced Sensor Performance of the 3rd generation (ESP3) to scan all sample materials and surface finishes. Through ESP3 technology, MMDx digitizes surfaces with varying color or abrupt surface finish transitions under any lighting conditions by dynamically adapting laser beam intensity point per point. ESP3 combined with a latest-generation reflection filter ensures that even highly reflective objects can be scanned without requiring spraying.

ModelMaker MMDx laser scanners come in 50, 100 and 200mm laser stripe widths, to suit every inspection need. The scanner is compatible with Nikon Metrology arms and most leading 3rd party articulated arms, including Faro and Romer / CimCore. For applications involving larger parts, modelMaker MMDx technology is also available as part of the K-Scan Optical CMM system. This unique scanning system allows the operator to freely walk around and take scans as desired. Nikon Metrology Focus Handheld software supports the MMDx scanner, in addition to most 3rd party point cloud software applications.

Click here for more information on the new MMDx handheld scanner.


High-Accuracy Robot Drilling: Demo at Control show

May 18, 2010

This application example shows a drilling fixture built from BoxJoint components. The fixture was designed by DELFOi and physically built by Nikon Metrology. It was demonstrated in Nikon Metrology’s booth at the CONTROL 2010 fair in Stuttgart. Nikon Metrology needed a fixture to locate a small wing component during drilling. You robot users out there understand that robots are not accurate machines. Even if some robots today are accurate down to +/-0.3 mm, once a robot comes in contact with an object, such as drilling, the robot will deflect and maybe even skid along the surface of the part in contact. One way to maintain high accuracy in a robot is to measure its TCP (Tool Center Point) each time the accuracy is required, such as just before engaging the drilling. The idea is to integrate the robot controller with the metrology controller.

Nikon Metrology provides just such a solution by integrating their K600 optical CMM camera to the robot controller. The CCD cameras see LEDs, flashing in infrared frequency, and measure their spatial locations using photogrammetry . One set of LEDs were glued to the drilling machine, and one set of LEDs were glued to the BoxJoint fixture framework. By measuring the tooling pins relative to the framework LEDs the system detects the position of the part. When the robot moves along its programmed drilling positions the robot will go into a measurement loop and ask the metrology system about the location of the drilling machine. 2-3 iterations are performed where the robot updates its position to meet the accuracy requirements. The accuracy setting for this cell was better than +/- 0.1 mm.

Check out other case studies using Nikon Metrology’s K-Robot

Read the full article

Watch a video on a robotic drilling solution


Nikon Metrology corporate movie just added to YouTube

May 17, 2010

Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircraft. Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time.

Nikon Metrology Corporate Movie

Additional information is available on www.nikonmetrology.com.


Nikon Small World Photomicrography Competition

May 14, 2010

Nikon Small World Photomicrography Competition. For 36 years, the competition has featured some of the most esteemed names in science and science journalism on its judging panel, and this year is no exception. Since its founding in 1974, Nikon Small World has seen consistent growth due in part to the amazing image submissions and the distinguished judges who have offered their insight to the contest.

Arabidopsis thaliana (thale cress) anther (10x) - 1st place, 2009

The judges for the 2010 Nikon Small World Photomicrography Competition are:

  • Jeremy Kaplan, Science & Technology Editor, FoxNews.com
  • Betsy Mason, Science Editor, Wired.com
  • Alison J. North, Ph.D., Director of the Bio-Imaging Resource Center and Assistant Professor, Rockefeller University
  • Shirley A. Owens, Ph.D., Retired Director of the Confocal Lab in the Center for Advanced Microscopy, Michigan State University

Sonchus asper (spiny sowthistle) flower stem (150x) - 2nd place, 2009

Nikon Small World recognizes the world’s best photomicrographers who are making key contributions to life sciences, bio-research and industrial science, while also demonstrating acute comprehension of the pleasing aesthetics when science and art come together. The competition is the preeminent forum for showcasing the beauty and complexity of life as seen through the light microscope and over the years has received international recognition in the science community, among art and photography lovers, and in the media.

Winners of the Nikon Small World Competition will be announced in October. For additional information, please visit www.nikonsmallworld.com, or follow the conversation on Facebook and Twitter @NikonSmallWorld.


Nikon Metrology exhibits at OrthoTec Conference in Warsaw, IN

May 13, 2010

OrthoTec is a new conference this year hosted by Canon Communications, the world’s leading exposition organizer. OrthoTec is a dedicated exposition and conference for orthopaedic manufacturers.

Nikon Metrology is exhibiting at the conference this year featuring a product line that is prominent in the medical field including the iNexiv TP, the MM200V/Emax, and the SMZ-745T/DS-Vi1.

 Come visit us at booth #120

Nikon Metrology Booth #120 at OrthoTec 2010


Last day to register for the CMSC conference before price goes up!

May 12, 2010

Don’t wait! Register today for CMSC 2010. The rate increases by $55 after Wednesday, May 12th.

CMSC 2010

Come join us on July 12th through the 16th in Reno, Nevada at the spacious Grand Sierra Resort.

Register Now

* Registration includes annual membership to Coordinate Metrology Society.

Why Should I Attend?

CMSC is an international group of close tolerance industrial measurement specialists and manufacturers and developers of alignment systems, targeting hardware, Portable Coordinate Measurement Machines (PCMMs), electronic theodolites, laser projection systems, laser radar, laser trackers, photogrammetry / videogrammetry systems and metrology software. No other conference or seminar in the country focuses specifically on 3D coordinate metrology.  Learn More>>

Don’t miss out!  Over 30,000 square feet of exhibit space showcasing the latest in cutting-edge Portable Coordinate Metrology Systems, Software and supporting Hardware.

Four days filled with Seminars, Workshops and Technical Presentations.

Show Location

Grand Sierra Resort
2500 E. Second Street
Reno, NV 89595
(775) 789-2000

2010 Show Dates & Hours
July 12 – 16, 2010
 

Monday:
1-5pm (Registration)
7-9pm (Ice breaker)

Show Hours:
Tues:
10:00am-5:00pm
Wed: 9:30am-5:00pm
Thurs: 9:30am-4:00pm

Visit www.cmsc.org for more details or call (425) 802-5720


The new LC60Dx brings CMM laser scanning in the accuracy range of tactile measurement

May 11, 2010

Nikon Metrology introduces the all-digital LC60Dx / LC50Cx scanners. The next-generation LC60Dx CMM laser scanner, evolved from the successful LC60D scanner, brings laser scanning in the accuracy range of tactile measurement. The affordable, yet powerful LC50Cx scanner features higher scanning rate and captures surfaces of varying color and high reflectivity without user interaction. Nikon Metrology also presents new subreleases of Focus and Camio.

Nikon Metrology, a new Nikon daughter company, markets the products of former Metris and the industrial inspection solutions of the Nikon Instruments division. Building on the legacy of being a leading innovator in non-contact metrology, Nikon Metrology introduces exciting laser scanning solutions for CMM and handheld applications.

 

Realizing high scanning accuracy and speed

Nikon Metrology introduces the all-digital LC60Dx scanner with powerful CMOS technology, an evolution from the LC60D CMM laser scanner. The major improvement for LC60Dx is higher accuracy, resulting in a typical MPEp value of 7 micron according to EN ISO 10360-5. This brings the scanner in the accuracy range of tactile measurement, while capturing 75,000 measurement points a second. By acquiring a multitude of measurement points, LC60Dx reliably digitizes freeform shapes and supports highly accurate feature extraction.

Also new in the LC family is the LC50Cx laser scanner. This entirely digital scanner benefits from an upgraded scanning rate of 45 stripes per second and Enhanced Sensor Performance of the 3rd generation (ESP3) as incorporated into the LC60Dx. Through ESP3 technology, LC scanners digitize surfaces with varying color, high reflectivity or abrupt transitions under any lighting conditions by dynamically adapting laser beam intensity point per point. Altogether, the LC50Cx is an affordable, yet powerful CMM scanner offering adequate productivity for a broad range of inspection and reverse engineering applications.

Faster and more versatile point metrology software

Defining scanner motion paths for a laser scanning inspection job is straightforward compared to the traditional programming of many touch sensor points. The new 6.3 sub-release of Camio software speeds up data acquisition even further. New in this regard is the so-called Fly-by Scanning mode. Using this mode, the software automatically calculates optimum and continuous scanner motion path curves, resulting in up to 25% faster scanning and simplified programming. Furthermore, Focus inspection 9.2 offers a complete set of functions for digital surface and feature inspection. It instantly delivers geometric feedback that is essential in tuning final part design and monitor product quality in the fabrication process. In addition to supporting infinite point cloud size on 64-bit computers, Focus introduces extended language support, CATIA V5 file import, enhanced feature extraction and new GD&T capabilities compliant with the ASME Y14.5M standard.

Click here to read more about the new LC60Dx/LC50c laser scanner.


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