July 30, 2010
From ScienceDaily — If you’ve ever been sleep-deprived, you know the feeling that your brain is full of wool.
Now, a study published in the journal Science has molecular and structural evidence of that woolly feeling — proteins that build up in the brains of sleep-deprived fruit flies and drop to lower levels in the brains of the well-rested. The proteins are located in the synapses, those specialized parts of neurons that allow brain cells to communicate with other neurons.

On the left, the brain of the well-rested blue fly has low levels of a synaptic protein called BRP in this 3D view from a confocal mircoscope. On the right, the brain of the sleep-deprived fly glows orange in areas of BRP concentration. (Bruchpilot or BRP is a protein involved in communication between neurons.) In the tired fly, the protein is present at high concentrations in three major areas of the fly's brain that are associated with learning. Sleep reduces the levels of this protein, an indication that synapses get smaller and/or weaker. This process of "downscaling" may be important so the brain is reset to normal levels of synaptic activity and can begin learning again the next day. (Credit: Courtesy of UW Health Public Affairs)
Sleep researchers at the University of Wisconsin-Madison School of Medicine and Public Health believe it is more evidence for their theory of “synaptic homeostasis.” This is the idea that synapses grow stronger when we’re awake as we learn and adapt to an ever-changing environment, and that sleep refreshes the brain by bringing synapses back to a lower level of strength. This is important because larger synapses consume a lot of energy, occupy more space and require more supplies, including the proteins examined in this study.
Sleep — by allowing synaptic downscaling — saves energy, space and material, and clears away unnecessary “noise” from the previous day, the researchers believe. The fresh brain is then ready to learn again in the morning.
The researchers — Giorgio Gilestro, Giulio Tononi and Chiara Cirelli, of the Center for Sleep and Consciousness — found that levels of proteins that carry messages in the synapses (or junctions) between neurons drop by 30 to 40 percent during sleep.
In the Science paper, three-dimensional photos using confocal microscopy show the brains of sleep-deprived flies filled with a synaptic protein called Bruchpilot (BRP), a component of the machinery that allows communication among neurons. In well-rested flies, levels of BRP and four other synaptic proteins drop back to low levels, providing evidence that sleep resets the brain to allow more growth and learning the next day.
“We know that sleep is necessary for our brain to function properly, to learn new things every day, and also, in some cases, to consolidate the memory of what we learned during the day,” says Cirelli, associate professor of psychiatry. “During sleep, we think that most, if not all, synapses are downscaled: at the end of sleep, the strongest synapses shrink, while the weakest synapses may even disappear.”
The confocal microscope views show this happening in all three major areas of the fruit-fly brain, which are known to be very plastic (involved in learning).
In a paper published last year, Tononi, Cirelli and their co-investigators found similar chemical changes in the synapses of rats’ brains. They also showed that rats’ brains have a stronger “evoked response” to electrical stimulation after being awake, and a weaker one after sleep. That finding provided more evidence, using electrophysiological rather than molecular techniques, consistent with the idea that synapses grow stronger during the day, then weaker during sleep.
Because sleep performs the same function in the brains of species as diverse as fruit flies and rats, Cirelli says it was likely conserved by evolution because it is so important to an animal’s health and survival.
Click here to read more in Science Daily
For more information on microscopy, visit Nikon Microscopy U
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Nikon Metrology, Microscopes | Tagged: University of Wisconsin, confocal microscopy, Science Daily, Science, sleep, sleep deprivation, sleep research, synaptic homeostasis, Center for Sleep and Consciousness, Bruchpilot, Chiar Cirelli, Giorgio Gilestro, Giulio Tononi, Nikon Microscopy U |
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July 28, 2010
Palaeontologists rub shoulders with aircraft designers at the Henry Moseley X-ray Imaging Facility located at the University of Manchester. The Facility is openly available to academic and industrial users, who gather instant scientific proof regarding otherwise hidden information using radiography and computed tomography (CT).
Projects run on Nikon Metrology systems have shed new light on Velociraptor behavior and 3D vascular networks in animal organs. They also provide unique insights into power plant metal corrosion and damage propagation in lightweight composite aerospace structures.
Located at the School of Materials at the University of Manchester, the Henry Moseley X ray Imaging Facility houses a suite of six computed tomography (CT) systems. “Worldwide academic and industry researchers have access to top-class equipment that offers full resolution and length scale capabilities for samples ranging from heavy engineering items to micron-sized biological specimens,” says Professor Phil Withers, founder and Director of the X-ray imaging facility.
“Evaluating stunning 3D models reconstructed from a series of X-ray images revolutionizes many research fields, including materials science, biology, mineralogy, palaeontology, entomology, medicine and life science.”
About dinosaurs
The Henry Moseley X-ray Imaging Facility is shedding light on a diverse range of natural samples. Recently, fossilized portions of ungual claws of a Velociraptor dinosaur were inspected to generate an accurate 3D finite element (FE) microstructurally faithful model. Analogue material from a similar dinosaur as well as the pedal digit and claw of an eagle owl, were analysed to provide input data for the Velociraptor claw FE model. Strength and strain simulations confirmed that the claws were resistant to extreme forces in the longitudinal direction, and therefore well adapted for climbing.
“Medicine is undoubtedly a growth area in high resolution X-ray micro tomography,” says Chris Martin, Senior Experimental Officer managing the operation of the Henry Moseley Imaging Facility. “A nice example is a research project for investigating the action of cancer treatments. It encompasses ex-vivo studies of the vascular system of blood vessels in animal brains, livers, kidneys and lungs.”
Read this full article in Quality Manufacturing Today
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Case Studies, Nikon Metrology, X-ray and CT Inspection | Tagged: 3D vascular networks, biology, Chris Martin, computed tomography, ct inspection, Dinosaurs, entomology, evaluating 3D models, fossils, Henry Moseley, Henry Moseley X-Ray Imaging, materials science, Metris, mineralogy, Nikon Metrology, paleontology, Phil Withers, power plant metal corrosion, radiography, University of Manchester, velociraptor, x-ray, X-ray Imaging |
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July 27, 2010
Nikon Corporation and Jordan Valley Semiconductors
Win SEMICON West 2010 “Best of West” Awards
Prestigious Panel Recognizes Important Industry Innovations at SEMICON West
Nikon Corporation, Inc. (Tokyo, Japan) and Jordan Valley Semiconductors (Migdal Ha’Emek, Israel) are the winners of the prestigious “SEMICON Best of West” award. These awards, given at the SEMICON West 2010 exhibition, are given based on the products’ financial impact on the industry, engineering or scientific achievement, and/or societal impact.
At the award ceremony, Tom Morrow, the vice-president, global exhibitions and marketing of SEMI, said, “Our judging panel was impressed with the products from this year’s finalists. All of these products are worthy of recognition by the industry.”

The S620D has demonstrated successful 32 nm pitch splitting across the entire wafer, as well as 22 nm capabilities.
Nikon Corporation’s award-winning product is the NSR-S620D Ultra-High Productivity Immersion Scanner. According to Nikon, this tool incorporates the Streamlign platform and a 1.35 numerical aperture lens to satisfy the aggressive demands of double-patterned lithography at 32 nm, with extendibility to 22 nm applications. The S620D targets 200 wafers per hour, maximizes yield with 2 nm overlay and superior CDU, and enables rapid installation.
Stephen P. Renwick, a principal engineer with Nikon Precision, said, “It’s great to be recognized by this distinguished panel of judges for this tool. We think this is the right product for customers, and we’re looking forward to great success.”
Before the 2010 award presentation, Jacob Mor, the president and co-founder of Nano Green Technology, said, “Receiving this award in 2009 changed our company’s life. We immediately gained respect from the industry, and this award contributed to our success. We mentioned this award in all sales meetings, and we received orders for 70 of our units within the year.”
The selection of finalists was made by a prestigious panel of judges representing a broad spectrum of the microelectronics industry (a list of judges can be found at www.semiconwest.org/bestofwest).
About SEMI:
SEMI is the global industry association serving the manufacturing supply chains for the microelectronic, display and photovoltaic industries. SEMI member companies are the engine of the future, enabling smarter, faster and more economical products that improve our lives. For more information, visit www.semi.org.

to our sister division, Nikon Precision, on this prestigious award!
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Events, General Buzz | Tagged: Best of West award, immersion Scanner, lithography, microelectronics, Nikon Corporatation, Nikon Precision, NSR-S620D, photovoltaics, SEMI, SEMICON West, Stephen Renwick, Tom Morrow |
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July 26, 2010
Recently, Nikon Metrology installed an XT H system at NGI – Norwegian Geotechnical Institute – an internationally leading center for geosciences research and consulting. NGI researchers use this high-performance industrial computed tomography (CT) scanner to run in-depth non-destructive investigation of large rock and soil samples. Voids, inclusions and disturbances in soil samples are key characteristics when investigating stability issues in the design and construction phases of large infrastructure, such as buildings, pipelines and offshore platforms.
CT scanning serves a wide application spectrum
Companies and public authorities seek NGI expertise on the design and construction of infrastructure to obtain maximum stability on local soil structure and rock formations. NGI assists the oil, gas and energy industries with expertise regarding exploration, development and operation of offshore fields. Soil geotechnical expertise also supports international building and construction markets.
CT scanning results will complement the characterization of geological heterogeneities and fractures in rocks. By monitoring aspects like evolution of fractures and fluid flow inside rock samples, the stability and operation of reservoirs and wells can be addressed.
“To closely examine samples of soil and rock in the laboratory, we chose the industrial Nikon Metrology XT H225 CT system,” explains Magnus Soldal, laboratory technician at NGI headquarters in Oslo, Norway. “The purchase of this premium equipment fits with our strategy to acquire as much information as possible on expensive onshore and offshore rock and soil samples using non-destructive inspection technologies. Our choice for Nikon Metrology was based on the system’s fine image resolution along with the optional convertible roof and extra-large cabinet that allow additional instrumentation to be placed inside the machine.”
Capturing dynamic tests at high image resolution
Cylindrical rock and soil samples in plastic or metal tubes come in different sizes. They typically have diameters between 50 – 150 mm and lengths up to 1 meter. Magnus Soldal says that for the longer samples, the system is equipped to move the rotating sample up or down to subject different parts of the sample to three-dimensional CT scanning. “For the smaller samples, the plan is to be able to use the CT scanner in combination with a triaxial loading cell to monitor the evolution of fractures and fluid flow”.
“For large soil samples as well as detailed rock investigations, the intrinsic image quality of the Nikon Metrology XT H system is impressive,” states Magnus Soldal. “We opted for a panel detector that features a larger size and higher image resolution. This is particularly important when performing detailed investigations of inhomogeneous sample sections and areas that can only be detected through CT scanning. Voids, inclusions and fracture planes are key features when characterizing the sample. On the basis of the inspection results, we pick the sample sections that will be subjected to geotechnical testing for stability evaluation.”
A truly safe system requiring limited training
Magnus Soldal testifies that inspection times are relatively short. “On average, detailed rock samples take approximately 30 minutes for X-ray and 15 minutes to generate the three-dimensional CT reconstruction of the sample. The inspection of offshore clay or other larger samples go faster, as less attention is given to the reconstruction of 3D volumes.” After calibrating the relation between material density and image grey scales, NGI researchers will be able to map various types of features and materials in the rock and assess their importance.
Overall, NGI operators perceive the use of the XT H system as fairly straightforward. “To be able to activate the optimum settings for a particular inspection task, we received three days of training, with two more to follow shortly. In addition to intuitive system operation, the Nikon Metrology CT scanner is an instrument that can be installed without requiring special floor conditions. Even more important is operator safety with regard to radiation. Although the system already met strict safety standards, we had its radiation measured here in Norway, confirming the excellent safety status of the equipment.”
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Case Studies, Nikon Metrology, X-ray and CT Inspection | Tagged: computed tomography, CT, geological heterogeneities, geoscience research, Inspection of soil and rocks, Magnus Soldal, Metris, NGI, Nikon, Nikon Metrology, non-destructive testing, Norwegian Geotechnical Institute, triaxial loading cell, x-ray inspection, XT H, XT H 225 |
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July 23, 2010
Entries for the Nikon Photo Contest International 2010-2011 to Be Accepted
Nikon Corporation is pleased to announce that entries for the Nikon Photo Contest International 2010-2011 will be accepted between September 1 and November 30, 2010.
Nikon Photo Contest International 2010-2011
The 33rd Nikon Photo Contest International, sponsored by Nikon, is an international photo contest designed to provide an opportunity for photographers of all skill levels around the world to communicate and contribute to photographic culture. In recent years, the contest has been held every other year.
Since it was first held in 1969, this contest has steadily gained popularity with photographers from around the world with more than 320,000 photographers submitting over 1,310,000 photos. More than 18,000 photographers from 153 countries submitted over 51,000 photos for the 2008-2009 contest. These numbers represent records for the largest number of entries by the most applicants from the most countries ever, making the Nikon Photo Contest International a truly international event.
This year’s categories
Entries for the 2010-2011 contest will be accepted for two categories. The first category is a free subject category (A) and the second entitled “Energy” (B). Photos of any subject or theme are invited for the free subject category. Entries for the “Energy” category should be photos that capture the energy of sights and subjects that inspire, motivate or excite you or viewers. Photos covering a broad range of subject matter from throughout the world are expected for both categories.
The Emerging Talent Award is awarded to provide younger photographers with an opportunity to share their photos and a goal towards which they may work, and many photos are entered by young photographers each time this contest is held.
53 prizes awarded by a panel of international photographers
Entries will be judged by photographers currently active on the world stage. Of a total of 53 prizes awarded, one photo will receive the contest Grand Prize, 16 photos from each category will receive first, second and third prizes, four photos entered by photographers aged 29 or younger will receive Emerging Talent Awards, and 16 Emerging Talent Award runners up will be selected.
Winners will be announced in June 2011 with an exhibition of the winning photographs planned.
The goal of the Nikon Photo Contest International is to provide an opportunity for photographers to express themselves and to share their own feelings and impressions with people around the world through their photographs.
For further details, please access the official Nikon Photo Contest International Web site at:
Nikon Photo Contest International 2010-2011
Click here to see winning photos from the last Nikon Photo Contest International.
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Events, General Buzz | Tagged: Nikon, Nikon Corporation, photo contest |
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July 22, 2010

Determining dimensions and dimensional stability is key in the development of plastic applications. Some polymers (such as PA) demonstrate a complex behavior in dimensional stability. They have significant mold shrinkage, going through thermal cycles, they demonstrate significant post shrinkage and once assembled, they grow as they pick up moisture.
GE Advanced Materials’ Plastics Application Technology Center is well equipped to accurately characterize these properties. With a coordinate measuring device, the dimensions X, Y, and Z can be measured accurately. Conventional technology measures with single point measurement devices such as mechanical probes, optical cameras, and single point lasers. A disadvantage of these single point measurements is that only a limited number of points are measured, leaving most of the complex surface unexamined. The non-contact laser line scanner overcomes this challenge.
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GE Advanced Materials has installed a Nikon Metrology LC50 line scanner on a Wenzel CNC coordinate machine in the Plastics Application Technology laboratory. This scanner is able to scan an object at almost 20,000 points per second over a width of approximately 50 mm. The scanner also enables GE to rapidly capture an accurate 3D digital copy of the objects. In the development of car body panels GE Advanced Materials’ application technology has invested in measuring technology over the years and, this tool helps advance the process of determining the dimensional behavior of applications made in GE materials to higher quality levels.
The following example shows the advantages of this system in application development support. As GE promotes its Noryl* GTX (a PPE/PA Blend) for online painted fenders, the maximum possible dimension changes are achieved in this system, namely:
- Molding large parts with tool shrinkage of 1.5%.
- Going through E-coat bake ovens up to 200 °C results in a post shrinkage of 0.5%
- Part conditioning by absorbing more than 1% moisture over time, which leads to a moisture growth of about 0.2%.
Throughout different steps in the process, it is now possible to make a digital copy of the car fender by way of a CNC-based scanning program. The fender is completely scanned in 43 sub-scans at different angles in 47 minutes time. The different angles of the Renishaw PH10 are qualified with an automatic procedure before the measurement. Although the fender has a very dull, black surface, the laser light is sufficiently high to obtain enough reflection to acquire high quality measurements. The end result of scanning is a point cloud of more than 800,000 points. To speed up the data calculations, the point cloud is reduced using a curvature-based filter. Typically, the resolution is decreased to result in a point cloud of approximately 50,000 points.
Besides the scanning software, the CADcompare software based on AutoCAD Mechanical Desktop is used to compare point clouds to CAD models (IGES / VDA) or other previously measured point clouds – thereby enabling the visualization of dimensional changes at all stages in the process. There are alternative ways to align the data for comparison. An n-point alignment is commonly used. In this technique specific points in the point cloud are roughly aligned with the corresponding areas in the CAD model.
To obtain a satisfactory result, it is important to select areas where the distortion is expected to be low. The calculation of the delta values with the CAD model is iterated (changing the position of the point cloud slightly) to finally result in the most optimal fit – also called the best fit optimization. Once the best fit is achieved, the deviations are visualized in a 3D color map. In addition to the full 3D color map, it is also possible to compare sections sliced through the pointcloud and CAD model.
Another method is to align fixed points in the point cloud with corresponding fixed points in the CAD model, a technique called feature-based alignment. The fixed points can be part of the scanned application, but it is also possible to use references in the same coordinate system of the part. These points are also scanned and incorporated as part of the model. By overlaying these points with the CAD model, a direct compare is immediately possible.
The industrial process of online painted car fenders contains process stages that affect the dimensions of the fender. Most important stages occur during the injection molding-, the assembly- and the paint bake processes. To get an understanding of the dimensional behavior each critical step is analyzed by scanning the fender and comparing it to the closest theoretical model. After molding, the fender is positioned on a frame as freely as possible, excluding effects of assembly and even gravity on the dimensions. A scan can be compared with the tool CAD model (scaled for mold shrinkage). In this phase the advised part to the CAD alignment method is a best fit. In the next step the fender is mounted on a body frame (or actual body), using the appropriate assembly technique (fixing to the body); before the application goes through an e-coat paint bake, the fender is scanned. After cooling down from the e-coat bake, the part is re-scanned. Effects of assembly can be analyzed – as well as the dimension change resulting from post shrinkage of the material – by comparing both point clouds. Additionally, the final scan can be compared with the nominal CAD model of the application and its final performance can be judged. The preferred method for the alignment is the feature based alignment.
In the example used, three metal spheres are mounted on the body frame as reference points. By knowing the 3D coordinates of those spheres, they can also be added to the CAD model. By overlaying the spheres from the point cloud to the spheres in the CAD model, the absolute deviation (i.e. in assembly location and due to deformation from applied stresses) is calculated.
When the comparisons indicate unsatisfactory part defects, it is then possible to find the root cause of the possible defects in the process. This method is much faster and delivers many more details than ever before since the user is able to analyze the 3D scanning results of every step in the process. Another advantage is that with single point measurements most of the part is not measured, possibly hiding potential defects. As such the tooling, including different processing conditions, can be optimized more efficiently. Another advantage is that the assembly or fixing technology can be developed at a faster rate. The final evaluations on the fender are reported in easy to understand color plots where the part behavior can be interpreted at a single glance.
Another application based on point cloud technology is the reverse engineering. Reverse engineering allows the creation of a surface model or CAD file from a scanned part. This is a value-added technique for the marketing units of GE Advanced Materials since the engineering and design units can use digitized products (metal, thermo-sets, etc.) for a redesign of the application toward the use of thermoplastic materials.
The Nikon Metrology LC50 scanner has proved in several projects to deliver high value to both internal and external customers (application developers, molders, Auto OEMs, etc.). The main advantage is that this technology brings more specificity and accuracy to 3D dimensional performance at a much faster rate.
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Case Studies, CMM Laser Scanning | Tagged: 3D digitizing, 3d scanning, CAD comparison, car body panels, CMM, Coordinate metrology, feature-based alignment, GE, GE Advanced Materials, laser scanning, Nikon Metrology, plastics technology, Renishaw probe, reverse engineering |
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July 20, 2010
Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series optical CMMs configured with scanners and probes, MCA II articulated arm configured with scanners and probes, and the iGPS.
“Verisurf is proud to partner with Nikon Metrology and offer engineers a major breakthrough in measurement and inspection,” said Ernie Husted, president of Verisurf. “Having advanced inspection software that can be used with all of their metrology devices will dramatically increase efficiency. Manufacturers will save countless hours otherwise spent learning and using multiple software interfaces, while significantly reducing software maintenance and technical support costs.”
“This partnership is a huge benefit to our metrology customers,” said Doug Kappler, Director of Nikon Metrology Large Scale Division. “In addition to being able to offer a single software platform for all Nikon Metrology portable metrology devices, the software provides fully automated and programmable measurements.” We hope customers of Verisurf will stop and see how this partnership with Nikon Metrology provides world-class products for the everyday user.
Verisurf’s new X platform is the latest release of its popular computer-aided inspection and reverse engineering software. The X platform gives engineers unprecedented value with new device interfaces, improved inspection guidance functionality and feature extraction for reverse engineering. An updated VDI has added many new non-contact measurement and automation controls for the Nikon Metrology Laser Radar, enabling this sophisticated metrology device to perform at its highest level.
Nikon Metrology and Verisurf exhibited the solution at the Coordinate Metrology Systems Conference (CMSC) in Reno from July 13-15.
Verisurf Software, Inc.
Verisurf Software, Inc. is a privately held metrology software development company committed to delivering advanced computer-aided inspection and reverse engineering solutions. Verisurf software lets manufacturers produce higher quality products in less time and at a lower cost by using highly automated paperless, 3D model-based inspection processes, rather than hand measurements and 2D paper drawings. For more information, visit www.verisurf.com.
Click here for more details
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Nikon Metrology, Press Release, Software | Tagged: cmsc, Doug Kappler, Ernie Husted, iGPS, K-Scan, K-Series Optical, Laser Radar, MCA II, Metris, Nikon, Nikon Metrology, optical CMM, Scanning Solutions, software, Verisurf, Verisurf Software, X platform |
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July 19, 2010
Nikon Metrology was proud to take part in the Coordinate Metrology Systems Conference in Reno, NV this past week. Nikon Metrology featured the Laser Radar for large volume metrology applications, the Optical CMM, and iSpace for tracking and positioning.
Quality Digest’s Dirk Dusharme talks about CMSC 2010
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Nikon Metrology also exhibited at the Semicon West tradeshow this past week. The following products were featured:
NeoScope benchtop SEM - Extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.
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| The XT V 160 - A versatile tool that allows an operator to easily make use of the system’s manual and programmable inspection capabilities. On top of it is ready for Computed Tomography CT inspection to reconstruct the test sample in full 3D image. |
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| iNEXIV Multi-Sensor Measuring System – High-speed, fully-automated benchtop metrology and imaging system ideal for measuring dimensional features. |
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3 CCD Real Color Confocal Microscope -
The Optelics H1200 is a real color confocal microscope with high image quality and resolution. The optional functions such as wavelength selection, Interferometery, Differential Interference Contrast (DIC) realizes vertical resolution of 1nm as well as satisfies the needs of vast industrial areas. |
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| SMZ745 Digital Stereomicroscope – Trinocular stereoscopic microscope ideally suited for observation and digital imaging. Features an impressive 7.5x zoom range. |
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If you didn’t get a chance to go to either of these shows, or didn’t stop by our booth, please contact us to find out how one of these solutions can assist you with your specific application. marketing_us@nikonmetrology.com.
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Events, Large-scale, Nikon Metrology | Tagged: cmsc, Coordinate Metrology Systems Conference, iGPS, iSpace, large-scal metrology, Laser Radar, Metris, Nikon Metrology, Optical scanning, Semicon, Semicon West 2010, tracking and positioning, vision systems |
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July 16, 2010
Nikon Metrology, Inc. (www.nikonmetrology.com) introduces the new Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications. Developed on the strength of Nikon’s leading optical and mechanical technologies, the Confocal NEXIV-K6555 incorporates the latest Confocal, image processing and Through the Lens (TTL) laser technologies for faster and more accurate non-contact 3D measurements on larger size substrates, probe cards and other applications requiring large stage travel.

Nikon designed the Confocal NEXIV VMZ-K6555 with longer XY travel (650mm x 550mm) to cover the non-contact 3D measurement requirements of larger substrates, such as recent cutting-edge interposer substrates and probe cards with greater accuracy and faster measurement speed. In addition, the newly developed ZC objective lenses for height measurement can obtain height data for every pixel in the field of view in a single scan, allowing fast, accurate, repeatable and reproducible wide-area height measurements.
For faster measurement speed, Nikon has redesigned the standard confocal optics using lower magnifications such as 3x and 7.5x. The system can be configured either with built-in high magnification CF optical head or with built-in standard magnification CF optical head so that it can be optimized for broad variations of complicated and smaller measuring targets on measuring applications. It is particularly well-suited for micro-bumps on advanced IC packages; probe cards; substrate pattern height and size; advanced glass and polymer components, such as micro lenses and contact lenses, laser marks on semiconductor wafers; MEMS; wire bonding and advanced fine interconnection technology.
The new Confocal NEXIV VMZ-K6555 also allows for both 2D measurements on brightfield images with the CNC 15x zooming optics and 3D measurements on confocal images. Furthermore, the TTL scanning laser auto focus and video image auto focus functionalities add greater flexibility.
“The Nikon Confocal NEXIV VMZ-K6555 provides new measurement possibilities in a field with extremely demanding applications,” says Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc. “By combining advanced Nikon confocal optics with Nikon’s powerful image processing technology, the Confocal NEXIV VMZ-K6555 allows for the necessary versatility and functionality.”
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Microscopes, Nikon Metrology, Press Release | Tagged: 3D measurements on confocal images, Confocal NEXIV-K6555, confocal optics, Lens (TTL) laser technologies, Metris, Nikon, Nikon Instruments, Nikon Metrology, optical and mechanical technologies |
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July 15, 2010
Nikon Metrology, Inc. (www.nikonmetrology.com) announces that it will distribute Lasertec’s Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed that Nikon Metrology, Inc. will distribute the system in the United States and Canada.

The H1200’s 3-CCD sensor system enables fast, accurate acquisition of 12 million pixel color images. Its advanced optics provide for high-resolution height measurement over a wide range of magnifications, as well as allowing samples of semi-sphere or samples with V-shape trench to be expressed in 3D without any noise. The H1200’s clear image mode realizes very clear observation and measurement of samples, including areas of totally different reflected light intensities within one field.
The system has a wide range of features working in concert to achieve high resolution, including a variable frame rate setting from 0.1 frames per second to 120 frames per second, making the microscope adaptable to a multitude of purposes such as high-resolution observation to high-speed measurement. Additionally, an intuitive GUI enables simple operation, including a simple “one click” acquisition of full color confocal images.
“Nikon Metrology, Inc. is pleased with the agreement to distribute Lasertec’s Optelics H1200 and bring this Confocal technology to customers throughout North America,” says Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc. “The addition of the Optelics H1200 will complement Nikon Metrology’s product portfolio and help to better serve customers with a wider product offering.”
The prime applications for the scope are semiconductor, such as color CCD measurement, high aspect trench measurement, SIC wafer pattern and bump measurement; electronic parts and materials, including Cu pattern, cross section of fractured ceramics, ink jet printer head, digital camera parts, prismatic metal mold, tip of drill and nano-imprints; medical and medical devices, including printing on medicine pills, surface measurement of medical implants and cosmetics; and automotive, including automotive chip, layer thickness measurement of paint and fuel injector nozzle measurement.
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Microscopes, Nikon Metrology | Tagged: CCD measurement, confocal microscope, H1200, Lasertec’s Optelics H1200, Nikon, Nikon Instruments, Nikon Metrology, SIC wafer pattern and bump measurement |
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July 14, 2010
Nikon Metrology, Inc. introduced the Eclipse L300N/L300ND, a FPD/LSI inspection microscope at SEMICON WEST 2010 in San Francisco.The device has an enhanced Epi-Fluorescence function enabling 365nm UV excitation optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays (OLEDs). The system also incorporates Nikon’s world renowned infinity optics, CFI60, offering both image brightness through high NA and wider sample range and access with long working distance. 
The motorized universal nosepiece on the Eclipse L300/L300N is three times more durable than conventional models. It incorporates an anti-flash mechanism, which engages when the nosepiece is rotated to protect the operator’s eye. In addition, a centering mechanism is possible at three nosepiece positions to minimize image shifts when changing the objective magnification. USB interface is available for nosepiece position output to DS-L2 and U2 as well as control of nosepiece through Nikon’s NIS-Elements software.
“With the Epi-Fluorescence observation, UV excitation is now possible. This is highly beneficial in the inspection of semiconductor wafers and OLEDs,” said Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc.
The Eclipse L300/L300ND employs a high-intensity 12V-50W halogen illuminator that is brighter than that of a standard 12V-100W illuminator while consuming half the power. Incorporating a lamphouse rear mirror and optimizing the size of the lamp filament allows effective and uniform illumination on the pupil plane. Objectives with a magnification of 50x or higher benefit from an increased brightness of 20 percent compared to the 12V-100W illuminator. In addition, the Eclipse L300ND model employs a new light source and an advanced optical design, which provides diascopic illumination four times brighter than the conventional model.
In addition, the Eclipse L300N/L300ND feature antistatic coatings for stronger safeguards against contamination. Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls, helping prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
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Microscopes, Nikon Metrology, Press Release | Tagged: Eclipse L300N, inspection microscope, Metris, Nikon, Nikon Instruments, Nikon Metrology, NIS-Elements software, optics |
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July 13, 2010
Archaeologists digging on a Norfolk beach found stone tools that show the first humans were living in Britain much earlier than previously thought. Scientists at the Natural History Museum are now able to utilize CT scanning for inspection of ancient fossils that are able to tell them when humans actually arrived in Britain.

A spectacular haul of ancient flint tools has been recovered from a beach in Norfolk, pushing back the date of the first known human occupation of Britain by up to 250,000 years.
While digging along the north-east coast of East Anglia near the village of Happisburgh, archaeologists discovered 78 pieces of razor-sharp flint shaped into primitive cutting and piercing tools.
The stone tools were unearthed from sediments that are thought to have been laid down either 840,000 or 950,000 years ago, making them the oldest human artefacts ever found in Britain.
The flints were probably left by hunter-gatherers of the human species Homo antecessor who eked out a living on the flood plains and marshes that bordered an ancient course of the river Thames that has long since dried up. The flints were then washed downriver and came to rest at the Happisburgh site.
The early Britons would have lived alongside sabre-toothed cats and hyenas, primitive horses, red deer and southern mammoths in a climate similar to that of southern Britain today, though winters were typically a few degrees colder.
“These tools from Happisburgh are absolutely mint-fresh. They are exceptionally sharp, which suggests they have not moved far from where they were dropped,” said Chris Stringer, head of human origins at the Natural History Museum in London. The population of Britain at the time most likely numbered in the hundreds or a few thousand at most.
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Nikon Metrology, X-ray and CT Inspection | Tagged: andrew ramsey, Britain history, Briton history, ct scanning, fossils, Metris, Natural History Museum, Nikon, Nikon Metrology, Norfolk, stone tools, X-Tek |
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Posted by Metrology Solutions Provider
July 12, 2010
A GPS device based on lasers instead of satellite transmissions lets manufacturers double-check the dimensions and positioning of big parts and assemblies. Laser-based metrology isn’t new. Manufacturers have been using laser trackers and interferometers for years. However, they may be limited to the line-of-sight of a single laser, or may require unique and complex setups for each new part.
In contrast, laser-guided indoor GPS (iGPS) from Nikon Metrology relies on infrared-laser transmitters, each broadcasting three signals, and sensors connected to software that renders a 3D image with x, y, and z coordinates accurate to within 200 μm or less. The device can handle an unlimited number of transmitters, permitting flexibility and accurate operation in areas larger than 1,000 sq ft.
Nikon-designed software maps part surface and volume onto a preloaded geometric model. The map lets engineers catalog location, length, shape, and orientation of scratches, gouges, bubbles, holes, and cracks. Engineers can also continuously monitor a variety of parts, jigs, and other items in the work envelope, which precisely join large assemblies.
Nikon recently upgraded the device, tapping Lincoln Laser, Phoenix, to redesign the transmitters.

“Lincoln provided insight on the optics and lasers,” says Jarrad Morden, general manager of North American Operations for Nikon Metrology. “And the company’s approach to manufacturing the assemblies made the overall design more cost effective.”
The iGPS sends out encoded laser beams in a 360° horizontal pattern. The previous limit was 270°. Transmitter spin-up to the operational speed (3,000 rpm) is also faster and has less vibration.
“We built in rotary transformers with magnetic couplings that would not affect the spinning velocities or put drag on the unit,” says Sean Coleman, Lincoln Laser design engineer.
Each transmitter continually generates three signals: two rotating fanned IR beams and an omnidirectional IR LED strobe. The fanned beams are tilted ±30° with respect to the rotation axis to permit ±60° vertical coverage. The strobe fires whenever the transmitter head reaches a predetermined angular position in its rotation.
The strobe establishes the transmitter’s identity and location, a necessity because each transmitter in the constellation rotates at a slightly different speed. Receivers on objects in the work envelope pick up the pulses about 50 times/sec.
Amplifiers convert analog signals to digital pulses. Then, an algorithm in the Nikon software determines the relative position and orientation of each transmitter and establishes an index that becomes the basis for azimuth angle measurements. The fanned laser beams provide elevation-angle data. The software maps receiver positions on the shop floor by triangulating elevation and azimuth data detected by the receivers.

To inspect a part, engineers load its geometric model into the software. The software orients the model to the transmitter-receiver device’s field coordinates with the help of a sensor probe placed on a predetermined spot on the part. In addition, the software superimposes any manual measurement data on the geometric model.
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Large-scale, Nikon Metrology | Tagged: 3D Images, iGPS, Infrared Laser Guidance, Jarrad Morden, Large Scale, large volume measurement, large-volume inspection, laser transmitters, Lincoln Laser, Metris, Metrology, Nikon, Nikon Metrology, satellite transmissions, Sean Coleman, tracking and positioning, transmitters |
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Posted by Metrology Solutions Provider
July 9, 2010
If you missed our Laser Radar webinar on July 7th, you can now view it in our webinar archive. Click on the video below to view this webinar.
What will you learn during this webinar?
-What is Laser Radar
-What is the accuracy
-How does it work
-What specific applications require a Laser Radar
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Large-scale, Nikon Metrology, Webinar Archive | Tagged: Laser Radar, Metris, Nikon, Nikon Metrology, Pete Morken, webinar |
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Posted by Metrology Solutions Provider