Nikon Metrology

Nikon Metrology takes Microscopy to the next level at the Evidence Conference in Washington D.C.

Nikon Metrology’s technical expert in microscopy, Koji Kiribuchi spoke about the Advances of Portable Digital Microscopy in the lab and in the field. The Evidence Conference was hosted in Washington D.C. at the Ronald Reagon Building and International Trade Center on October 1-2. The Evidence Conference is a comprehensive 2-day event covering evidence collection, handling, analysis, and chain of custody with tracks focused on Crime Scene, Read more...

Another Successful IMTS for Nikon Metrology

NIKON METROLOGY BOOTH #E-5371 Marrying the power of X-RAY/CT with Certified METROLOGY… Nikon Metrology introduced the MCT225, offering absolute accuracy for inside geometry. This new ‘absolute-accuracy’ Metrology-CT (MCT) system measures all internal and external geometry efficiently in a single non-destructive process. Since you visited our booth, we hope you were able to experience this newest product from Nikon Read more...

Using Laser Radar to Improve Production in Pipe Spool Fabrication

Article by: Masashi Sato and Hironori Kojima Published by: Quality Digest Magazine The main plant of Hitachi Engineering and Services (HES) has produced pipe spools for large-scale plants. The spools have complicated shapes and are made of various types of materials. High accuracy and throughput are required during the spools’ fabrication process. Because they are difficult to automate, the bending, assembling, and welding processes in Read more...

Nikon Metrology Sponsors CMSC Tour at NASA Michoud Assembly Facility in New Orleans

The NASA Michoud Assembly Facility was the chosen venue for this year’s annual CMSC (Coordinate Metrology Systems Conference) Tour. Close to 100 people from the metrology industry boarded buses to the facility at 8:00am on July 20th. The tour took people through the entire assembly facility featuring the metrology lab as well as the factory where people were able to view Nikon Metrology’s Laser Radar measuring the test article for Read more...

Nikon Metrology – Everywhere you look, and a few places you didn’t

Nikon Metrology exhibits at a wide range of shows and conferences this week as we head into the Memorial Day weekend. From the east coast to the west coast and all the way to Brazil, Nikon is making a splash as they feature various metrology solutions to every industry in the Americas. RAPID – 3D Imaging Conference and Exhibition – May 22nd – May 24th in Atlanta, GA Nikon Metrology exhibits in Booth #316 and will be featuring Read more...

Nikon Metrology Exhibits at MFG4 2012

NIKON METROLOGY BOOTH #1101 At MFG4 2012, located in Hartford, CT this year May 8-10, Nikon Metrology will feature our LK CMM with the new LC15Dx Digital Line Scanner, the iNexiv VMA-2520 Vision Measuring System, the Laser Radar for large volume metrology, the  ShuttlePix Digital Handheld Microscope, the Portable Measuring Arm with MMDx scanner, and the SMZ Zoom Stereomicroscope. Please contact us for more information on any Read more...

A New Wave in Inspection

Article by Alex Lucas, Business Development Manager – Scanning Products Laser scanning and other optical measurement methods are crucial to many aerospace manufacturers.  Nikon Metrology offers a complete and innovative metrology product portfolio, including state-of-the-art vision measuring instruments complemented with optical inspection and mechanical 3D metrology solutions. Non-contact measurement technology has proliferated. Read more...