Nikon Metrology

Nikon BW-Series White Light Interferometric Microscope System

Building on Nikon’s Industry leading Double Beam Interferometry objectives, Nikon Metrology has launched a series of White Light Interferometry (WLI) Systems, which will set a new the standard in 2D and 3D surface profiling. Nikon’s new Focus Variation with White Light Interferometry (FVWLI) moves the technique in to new ground. With effective height resolution of 15 pm (picometer), more precise and accurate 3D surface height measurements are now achievable. Integrating Nikon’s existing industrial research grade microscope range with the latest Read more...

3D Engineering Solutions Forms Partnership with Nikon Metrology to Create an Industrial CT Scanning Center of Excellence

3D Engineering Solutions has agreed to form a strategic partnership with Nikon Metrology, Inc to create an industrial CT scanning laboratory and Center of Excellence, to meet the growing need for CT scanning engineering services. 3D Engineering Solutions (3DES), an advanced design engineering and metrology services company in Cincinnati, Ohio is pleased to announce their strategic partnership with Nikon Metrology, Inc (NMI) of Brighton, Read more...

First teaching laboratory in Denmark with scanning electron microscopes

Five Nikon Metrology SEMs will attract hundreds more students every year with the aim of promoting physics and nanotechnology Staff and students at schools and universities throughout Denmark are excited about a new facility housing multiple scanning electron microscopes that has opened within Nanoteket, a nanotechnology teaching laboratory at the Technical University of Denmark (DTU), near Copenhagen. The laboratory operates incollaboration with the university’s physics department andcentre for electron nanoscopy. The latest project has been Read more...

See what a soccer ball looks like on the inside

At the occasion of the World Cup Football, Chesapeake Testing takes a peek inside of a soccer ball using their Nikon Metrology CT Scanning system. Also watch: An overview of Chesapeake Testing’s Computed Tomography capabilities Click to share on Facebook (Opens in new window)Click to share on LinkedIn (Opens in new window)Click to share on Twitter (Opens in new Read more...

High voltage CT system advances inspection of automotive turbochargers

Computed Tomography transforms automotive turbocharger R&D at BorgWarner by non-destructively inspecting components and assemblies A microfocus computed tomography (CT) system from Nikon Metrology is being used by BorgWarner Poland to improve research and development of turbochargers for passenger cars, light trucks and commercial vehicles. The high power (450 kV) X-ray equipment is able to penetrate the dense materials used in turbocharger production, allowing the internal material quality of castings to be checked non-destructively and the Read more...

World’s first 750kV microfocus X-ray source for NDT inspection and measurement of high density parts

Nikon Metrology announces a unique 750 kV X-ray source with micron level spot size. This high power X-ray source enables non-destructive inspection or measurement of large or dense objects such as engine castings, turbine blades, large composite parts with unprecedented resolution. It is the only 750 kV microfocus source on the market providing superior resolution and accuracy compared to traditional minifocus sources. Nikon Metrology X-ray sources are at the heart of their X-ray and CT technology and have been designed and manufactured in-house. The 25 Read more...

Laser scanners replace tactile probing for body-in-white inspection at FIAT-TOFAS

Turkish automotive manufacturer FIAT-Tofaş is implementing new inspection methodologies for their diagnostic measurements of sheet metal components and body-in-white (BIW) assemblies. A key element involves the installation of Nikon Metrology XC65Dx-LS Cross Scanners and CAMIO multi-sensor metrology software, which are retrofitted on an existing Hexagon double-arm coordinate measuring machine (CMM) at Bursa. Inspection is now twice as fast compared to touch probes and provides better insight, reducing the time needed to diagnose problems and raising Read more...

Nikon Metrology presents NanoFocus X-ray inspection system for the most demanding electronics applications

XTV160NF

Nikon Metrology’s latest XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today. As such, the XT V 160 NF is indispensable for any electronics development and production Read more...

DS-Ri2 and DS-Qi2, microscopy digital cameras equipped with a Nikon digital SLR camera FX-format CMOS sensor optimized for microscopy

Nikon Metrology is pleased to announce the release of digital cameras for microscopes DS-Ri2 and DS-Qi2. These are the first Nikon digital cameras for microscopes in the Digital Sight series equipped with a Nikon FX-format CMOS sensor. They offer 16.25-megapixel high-definition images. The DS-Ri2 provides superior color reproduction and fast frame rates. The monochrome model DS-Qi2 enables high-sensitivity, low-noise images. Product information DS-Ri2 Microscope Camera Available from June 2, 2014 DS-Qi2 Monochrome Microscope Read more...

High voltage microfocus CT for inspection of dense, complex parts

By now most of us in the metrology world have seen beautifully rendered images from Computed Tomography (CT) data. We see images of bones, fossils, dinosaurs, teeth, and of archaeological treasures, and hear about various universities that use CT systems. But perhaps we are left wondering, is this a viable inspection tool in terms of capabilities and cost, or is it just an experimental toy? Don’t be fooled.  CT’s accuracy, ability to measure internal and external dimensions simultaneously without destroying the part, and the insight it provides Read more...