Compact precision GD&T on the shop floor

November 8, 2010

The new MM-200 measuring microscope from Nikon Metrology is specially designed for engineers, inspectors and operators, who require highly accurate measurements for precision parts.  Offering economies in size, weight and price, this compact product also offers precision and accuracy for measuring a variety of metal, plastic and electronic parts in all industries, especially the automotive and electronics industries.  Its space-saving and lightweight design allows the MM-200 to be used on the shop floor and inspection rooms alike.

Precise and easy-to-use, the MM-200 enables quick and accurate non-contact optical measurement.   An integrated stage reduces the MM-200 footprint by 50%, while offering the same stage-travelling accuracy as the current high quality MM400/800 series.  The MM-200’s economic, compact and lightweight design makes it ideal for machine tool shops and inspection rooms.  The MM-200 is suitable for a wide variety of parts including: small-size die and molds, drill bits, inserts, fine pitch connectors, medical devices, watch parts, gears and optical fiber parts.

A dedicated monocular optical head for the MM-200 is available for immediate measurement on the eyepiece on the production line, while a C-mount video head provides easy video monitoring.   XY stage scale readout, illumination control and communication ports to external devices such as a PC or digital readout unit are operated via a control interface unit.  Long-life, environmentally friendly, high-intensity white LED light sources are used for all illumination.  Nikon’s DS-2Mv camera and E-Max software packages provide semi-automated measurement, guiding easy geometric dimensioning and tolerancing.  The E-Max DS-V system allows easy- to-use advanced video edge-detection technologies.  New digital templates for concentric patterns, threads and involute gear teeth with different modules, made from 2D CAD data, enable quick go/no-go comparison inspection as well as digital image archiving.


Improved observation and imaging of wafers

November 5, 2010
The Nikon LSI series of  inspection microscopes, Eclipse L200N and L200ND,  builds on the high resolution and precision of the Eclipse L200 and L200D series. The L200N and L200ND offer improved observation and operating performance, providing images with greater contrast and higher resolving power.  Used independently or in combination with wafer loaders, the L200 series performs precise optical inspection of wafers, photo masks, reticules and other substrates.

Featuring an ergonomic design, main controls are located at the front of the base for easy access, allowing stage movements and focusing to be carried out with ease and minimizing fatigue during lengthy observations. A tilting trinocular eyepiece tube enables observation at optimum eye level to ensure a comfortable viewing position.  Quick and easy microscope operation while viewing samples is possible. The L200N series allows easy and accurate focusing on low-contrast samples, such as bare wafers, simply by inserting a focusing target in the optical path. Up to six objectives can be mounted on the robust motorized nosepiece, which also minimizes image shifting even between high magnifications.

Control of the camera, peripherals and microscope are all integrated within NIS-Elements imaging software, which offers high-quality advanced image acquisition, processing and analysis.  Easy USB connection offers high-speed data transfer.


Industrial Rubber quality-checks rubber road stud reflectors with iNexiv video measuring system

November 3, 2010

Industrial Rubber has been manufacturing rubber moldings since 1975. One of its best known products, the “Light Dome” road stud reflector, is approved by the Department of Transport for use on all of the UK’s roads and highways. Industrial Rubber invested in a Nikon Metrology iNexiv VMA-2520 inspection system to assure its customers of consistent high quality products, no matter where in the world they are manufactured.

Simon Elgar, quality manager at Industrial Rubber explains: “In addition to plants and machinery in the UK, Industrial Rubber also has sister companies in China, enabling dual manufacturing at home and abroad. This is a great advantage in meeting large batch orders and in ensuring continuity of supply even when customers have exceptional demand.”

Quality-checking rubber components can be challenging as rubber is a dynamic material that can compress under its own weight, can be flexible and can deform on contact. Non-contact vision metrology systems are, therefore, the only realistic inspection option. All quality checks are carried out centrally at Industrial Rubber’s UK site.  When Industrial Rubber decided recently to upgrade its QC facilities, it chose to invest in an iNexiv VMA-2520 vision metrology system.

“The iNexiv VMA-2520 has given us a whole new level of accuracy and precision. We can now measure to four decimal places of accuracy and can check the pieces visually with minute detail. This is an excellent quality control tool for some of our precision pieces destined for life-critical medical devices. It allows us to monitor the quality and repeatability of manufacture with great precision.”

Once the initial set-up has been completed, measuring becomes much faster, and many more measurement tasks can be completed in any given time. To ensure that the system was up and running in the shortest time possible, Nikon provided training sessions for all the users both individually and in a group. Nikon Metrology also provides ongoing support and in case of questions, the answer is just a telephone call away.

A new quality control room was built around the iNexiv VMA-2520, providing the ideal environment in which to demonstrate Industrial Rubber’s quality processes to customers. “Our customers have been impressed with our new facilities, and have gained further confidence in our manufacturing capabilities. The manufacture of rubber components is a highly competitive market in the UK that has been shrunk by the lure of off-shore manufacturing. Having this level of quality control in one central location means that we can take advantage of these markets without compromising quality,” Simon concluded.


Inspection and Measurement of Food Packaging

October 13, 2010

Design of food packaging films has become increasingly complex in recent years. Most films consist of layers laminated together, each designed to act as a barrier to oxygen, moisture and other external influences that can cause the food to spoil.  Individual layers may be aluminum foil, plastic film or even metallized plastic. Each layer must be a specific thickness – too thin and it will fail to protect the contents of the package, too thick and material will be wasted, increasing the cost of the package. As design and manufacturing requirements for these films have become more intricate, the need for faster, more accurate and more highly automated inspection of layered laminates has also increased.

 System Challenge:

 Manual methods of inspection are limited in their ability to:

• Maintain operator comfort during prolonged periods of use

• Image individual layers

• Accommodate larger sample holders

• Achieve high throughput

Nikon’s Solution:

LV-UDM Microscope with
NIS-Elements D Software 
 
• Wide variety of CFI60 lenses with different magnifications for different films 
• Large maximum specimen thickness capacity to accommodate tall sample holders
• High resolution Nikon digital camera with NIS-Elements D to isolate individual layers

• Elements software allowing creation of macros for repetitive measurements
 
• Ability to capture images to document the various film layers
  
 

 

 
 

Hoskin Scientific Features Nikon Metrology Solutions at Canadian Manufacturing Week – Booth # 5022

October 5, 2010

October 5-7, 2010
Toronto Congress Centre, North Building
650 Dixon Road
Toronto, Ontario, Canada

Canada’s LARGEST and MOST COMPREHENSIVE MANUFACTURING SHOW is back and packed with MORE NEW TECHNOLOGIES than ever before!

Canadian Manufacturing Week (CMW), is the event that Canadian manufacturers have relied on for over 20 years to improve and strengthen their business. The show you look to for innovative products, technology, equipment and services has evolved into something even better. A new, state-of-the-art venue, convenient location, and more new technologies than ever before combines to form the most efficient and effective way to source the solutions you need to succeed – all under one roof.

  

 

 

 

 

 

 

Hoskin Scientific will be exhibiting at CMW 2010, Booth#5022. In their booth they will feature the Nikon Metrology 6-axis portable arm with touch probe and CMM-Manager software as well as the SMZ-745T stereoscopic microscope.

Visit http://www.hoskin.ca/ for more information or visit http://us.nikonmetrology.com/ to learn more about our products.


Nikon Metrology Helps Joe Gibbs Racing Drive for the Checkered Flag

September 14, 2010
 

Photo courtesy of Joe Gibbs Racing

In the high-octane, fast-paced world of NASCAR, there is no room for error – and the Joe Gibbs Racing (JGR) Team is no exception.  More than 450 employees work to keep the team in top form, responsible for everything from hand-building engines to moving the entire racing fleet to competitions, which take place nearly every weekend of the year.

In the early part of 2010, the JGR engineers were facing a problem. The racecar engine’s rocker arms – reciprocating levers that convey radial movement from the cam lobe into linear movement at the poppet valve, and are responsible for helping the cars accelerate to their incredible speeds without blowing the engine – were experiencing excessive wear and tear, even though they were coated with lubricants to prevent just that type of damage.  With their available tools, the JGR engineers could not see how or why the damage was occurring, so they contacted Nikon Metrology to see if they could help solve the issue.

Diagram courtesy of COMP Performance Group

To examine the problematic rocker arms, Nikon Metrology sent the JGR engineers its AZ100 model microscope, a multi-purpose zoom microscope that combines the wide field of view advantages of a stereoscopic zoom microscope with those of a metallographic microscope. The AZ100 system features high-resolution bright field and seamless digital documentation.

JGR engineers used the Nikon AZ100 with its high-resolution Plan Apochromat lens and the digital imaging system DS-Fi-L2 to capture and analyze images of the failed rocker arms.  With this system, at 50X magnification, the engineers were able to capture images at a far greater resolution and contrast than with their previous system – and using the Ethernet connectivity of the Nikon DS-L2 Digital Camera Controller, were able to share and evaluate the live images with their vendor/technical partner.

Through video conferencing and image sharing, it only took the two groups 90 minutes to determine that inclusion and discoloration in the coating were responsible for the rocker arms’ damage – and that the excessive stress and heat placed on these parts were not being properly deflected. Immediately, the vendor/technical partner engineers were able to propose a solution to the problem, whereas with the previous system it would have taken anywhere from two to seven days to communicate and send the images to the engineers to determine a cause.

Richard Miller (pictured above), quality control engineer for Joe Gibbs Racing, best summarized the teamwork between the two companies by saying, “In this world, it’s all about speed, quality and reliability.  Using Nikon Metrology’s equipment, we were able to return our cars and drivers to the track with the speed, accuracy and safety this sport requires.”


Portable ShuttlePix Digital Microscope for recording high-resolution images

September 13, 2010

Nikon Metrology, Inc. announced today the release of its new ShuttlePix P-400R Digital Microscope, made for inspection, observation, simple measurement and recording of high-resolution images.  For on-site analysis of samples, it serves as a handheld microscope that shoots high-resolution images as quickly and easily as taking pictures with a digital camera.  For stationary use, the ShuttlePix microscope interfaces seamlessly with a motorized stand.  With the equipped 17-inch touchscreen monitor, the user can easily control, display, measure or print images. The microscope also connects to a standard PC or laptop running dedicated 3D image reconstruction software.

“The versatility of the ShuttlePix system means the user can bring the microscope to large samples, such as an aircraft frame, turbine casting or pipe work that often cannot be reached with a standard microscope,” says Bob Wasilesky, Senior Vice President, Nikon Metrology Inc. “The unique ShuttlePix technology supports a wide range of inspection tasks in automotive, electronics, aerospace and other industries. In combination with its imaging capabilities, it’s a very versatile, extremely useful piece of equipment.”

The ShuttlePix addresses the market need for an easy-to-use device that magnifies samples and can record and save images as digital files. Nikon combined its technological excellence in optical technology with its expertise in digital image processing technology to enable the creation of the ShuttlePix.

The stand is equipped with a motorized Z, which does not require a PC for control. Operation of the stand is simple, allowing extended depth of focus (EDF) image capture with the touch of a button.

ShuttlePix offers a 20x zoom with a magnification range of 20x– 400x on a 17-inch monitor, which is double that of competitors’ models. For optimal lighting, the zoom head has built-in 4 section LED ring illumination.  The ShuttlePix will be exhibited September 13 – 18 at IMTS 2010 in Chicago, and will become available in December 2010.


Improve Automotive Manufacturing with Microscopy Techniques

August 9, 2010

Automotive Manufacturing

When it comes to surface engineering, competition in the automotive industry is high. From the initial design of components to full-scale manufacturing and inspection, rigorous standards must be kept for the consistent, high quality production of all machined parts. International pressures for more economical and fuel efficient designs have also furthered the need for low-wear and better fitting components that can help to improve performance and reduce the overall environmental impact of every vehicle. Adhering to such high standards of production not only increases the longevity of components, it protects the reputation of the manufacturer that builds them.

To verify the alignment, surface quality, dimensional profile and functional qualities of machined parts, automotive manufacturers must rely on a wide variety of microscopy techniques. These can include such fundamentals as stereomicroscopy and the use of inverted microscopes to more complex analytical instruments such video measuring systems, dedicated metrology microscopes and polarized light microscopy. These can each be employed to assess the key functional parameters of components including:

• camshaft and crankshafts bearings
• fuel injectors and injection nozzles
• plastic moldings
• cylinder surfaces
• brake disks
• transmission components
• pistons, pins and rings
• connecting rods

Ensuring the accurate manufacture of parts can extend their operational lifetime and allow for more economical, production-oriented manufacture, which, in the end, can improve quality while improving bottom lines.

To read more, click here.


Sleep: Spring Cleaning For The Brain?

July 30, 2010
Researchers at the University of Wisconsin-Madison School of Medicine and Public Health take three-dimensional photos using confocal microscopy to examine the brains of sleep-deprived flies

From ScienceDaily  — If you’ve ever been sleep-deprived, you know the feeling that your brain is full of wool. 

Now, a study published in the journal Science has molecular and structural evidence of that woolly feeling — proteins that build up in the brains of sleep-deprived fruit flies and drop to lower levels in the brains of the well-rested. The proteins are located in the synapses, those specialized parts of neurons that allow brain cells to communicate with other neurons. 

On the left, the brain of the well-rested blue fly has low levels of a synaptic protein called BRP in this 3D view from a confocal mircoscope. On the right, the brain of the sleep-deprived fly glows orange in areas of BRP concentration. (Bruchpilot or BRP is a protein involved in communication between neurons.) In the tired fly, the protein is present at high concentrations in three major areas of the fly's brain that are associated with learning. Sleep reduces the levels of this protein, an indication that synapses get smaller and/or weaker. This process of "downscaling" may be important so the brain is reset to normal levels of synaptic activity and can begin learning again the next day. (Credit: Courtesy of UW Health Public Affairs)

 

Sleep researchers at the University of Wisconsin-Madison School of Medicine and Public Health believe it is more evidence for their theory of “synaptic homeostasis.” This is the idea that synapses grow stronger when we’re awake as we learn and adapt to an ever-changing environment, and that sleep refreshes the brain by bringing synapses back to a lower level of strength. This is important because larger synapses consume a lot of energy, occupy more space and require more supplies, including the proteins examined in this study. 

Sleep — by allowing synaptic downscaling — saves energy, space and material, and clears away unnecessary “noise” from the previous day, the researchers believe. The fresh brain is then ready to learn again in the morning. 

The researchers — Giorgio Gilestro, Giulio Tononi and Chiara Cirelli, of the Center for Sleep and Consciousness — found that levels of proteins that carry messages in the synapses (or junctions) between neurons drop by 30 to 40 percent during sleep. 

In the Science paper, three-dimensional photos using confocal microscopy show the brains of sleep-deprived flies filled with a synaptic protein called Bruchpilot (BRP), a component of the machinery that allows communication among neurons. In well-rested flies, levels of BRP and four other synaptic proteins drop back to low levels, providing evidence that sleep resets the brain to allow more growth and learning the next day. 

“We know that sleep is necessary for our brain to function properly, to learn new things every day, and also, in some cases, to consolidate the memory of what we learned during the day,” says Cirelli, associate professor of psychiatry. “During sleep, we think that most, if not all, synapses are downscaled: at the end of sleep, the strongest synapses shrink, while the weakest synapses may even disappear.” 

The confocal microscope views show this happening in all three major areas of the fruit-fly brain, which are known to be very plastic (involved in learning). 

In a paper published last year, Tononi, Cirelli and their co-investigators found similar chemical changes in the synapses of rats’ brains. They also showed that rats’ brains have a stronger “evoked response” to electrical stimulation after being awake, and a weaker one after sleep. That finding provided more evidence, using electrophysiological rather than molecular techniques, consistent with the idea that synapses grow stronger during the day, then weaker during sleep. 

Because sleep performs the same function in the brains of species as diverse as fruit flies and rats, Cirelli says it was likely conserved by evolution because it is so important to an animal’s health and survival. 

Click here to read more in Science Daily 

For more information on microscopy, visit Nikon Microscopy U 


Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications

July 16, 2010

Nikon Metrology, Inc. (www.nikonmetrology.com) introduces the new Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications. Developed on the strength of Nikon’s leading optical and mechanical technologies, the Confocal NEXIV-K6555 incorporates the latest Confocal, image processing and Through the Lens (TTL) laser technologies for faster and more accurate non-contact 3D measurements on larger size substrates, probe cards and other applications requiring large stage travel.

Nikon designed the Confocal NEXIV VMZ-K6555 with longer XY travel (650mm x 550mm) to cover the non-contact 3D measurement requirements of larger substrates, such as recent cutting-edge interposer substrates and probe cards with greater accuracy and faster measurement speed. In addition, the newly developed ZC objective lenses for height measurement can obtain height data for every pixel in the field of view in a single scan, allowing fast, accurate, repeatable and reproducible wide-area height measurements.

For faster measurement speed, Nikon has redesigned the standard confocal optics using lower magnifications such as 3x and 7.5x. The system can be configured either with built-in high magnification CF optical head or with built-in standard magnification CF optical head so that it can be optimized for broad variations of complicated and smaller measuring targets on measuring applications. It is particularly well-suited for micro-bumps on advanced IC packages; probe cards; substrate pattern height and size; advanced glass and polymer components, such as micro lenses and contact lenses, laser marks on semiconductor wafers; MEMS; wire bonding and advanced fine interconnection technology. 

The new Confocal NEXIV VMZ-K6555 also allows for both 2D measurements on brightfield images with the CNC 15x zooming optics and 3D measurements on confocal images. Furthermore, the TTL scanning laser auto focus and video image auto focus functionalities add greater flexibility. 

“The Nikon Confocal NEXIV VMZ-K6555 provides new measurement possibilities in a field with extremely demanding applications,” says Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc. “By combining advanced Nikon confocal optics with Nikon’s powerful image processing technology, the Confocal NEXIV VMZ-K6555 allows for the necessary versatility and functionality.”


Optelics H1200 Real Color Confocal Microscope Now Available

July 15, 2010

 

Nikon Metrology, Inc. (www.nikonmetrology.com) announces that it will distribute Lasertec’s Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed that Nikon Metrology, Inc. will distribute the system in the United States and Canada.

The H1200’s 3-CCD sensor system enables fast, accurate acquisition of 12 million pixel color images. Its advanced optics provide for high-resolution height measurement over a wide range of magnifications, as well as allowing samples of semi-sphere or samples with V-shape trench to be expressed in 3D without any noise. The H1200’s clear image mode realizes very clear observation and measurement of samples, including areas of totally different reflected light intensities within one field.

The system has a wide range of features working in concert to achieve high resolution, including a variable frame rate setting from 0.1 frames per second to 120 frames per second, making the microscope adaptable to a multitude of purposes such as high-resolution observation to high-speed measurement. Additionally, an intuitive GUI enables simple operation, including a simple “one click” acquisition of full color confocal images.

“Nikon Metrology, Inc. is pleased with the agreement to distribute Lasertec’s Optelics H1200 and bring this Confocal technology to customers throughout North America,” says Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc. “The addition of the Optelics H1200 will complement Nikon Metrology’s product portfolio and help to better serve customers with a wider product offering.”

The prime applications for the scope are semiconductor, such as color CCD measurement, high aspect trench measurement, SIC wafer pattern and bump measurement; electronic parts and materials, including Cu pattern, cross section of fractured ceramics, ink jet printer head, digital camera parts, prismatic metal mold, tip of drill and nano-imprints; medical and medical devices, including  printing on medicine pills, surface measurement of medical implants and cosmetics; and automotive, including automotive chip, layer thickness measurement of paint and fuel injector nozzle measurement.

Read more>>


Nikon Metrology Enhances Observation Performance and Operation with Introduction of Eclipse L300N/L300ND

July 14, 2010

Nikon Metrology, Inc.  introduced the Eclipse L300N/L300ND, a FPD/LSI inspection microscope at SEMICON WEST 2010 in San Francisco.The device has an enhanced Epi-Fluorescence function enabling 365nm UV excitation optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays (OLEDs). The system also incorporates Nikon’s world renowned infinity optics, CFI60, offering both image brightness through high NA and wider sample range and access with long working distance.  

The motorized universal nosepiece on the Eclipse L300/L300N is three times more durable than conventional models. It incorporates an anti-flash mechanism, which engages when the nosepiece is rotated to protect the operator’s eye. In addition, a centering mechanism is possible at three nosepiece positions to minimize image shifts when changing the objective magnification. USB interface is available for nosepiece position output to DS-L2 and U2 as well as control of nosepiece through Nikon’s NIS-Elements software.  

 
“With the Epi-Fluorescence observation, UV excitation is now possible. This is highly beneficial in the inspection of semiconductor wafers and OLEDs,” said Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc.  
The Eclipse L300/L300ND employs a high-intensity 12V-50W halogen illuminator that is brighter than that of a standard 12V-100W illuminator while consuming half the power. Incorporating a lamphouse rear mirror and optimizing the size of the lamp filament allows effective and uniform illumination on the pupil plane. Objectives with a magnification of 50x or higher benefit from an increased brightness of 20 percent compared to the 12V-100W illuminator. In addition, the Eclipse L300ND model employs a new light source and an advanced optical design, which provides diascopic illumination four times brighter than the conventional model.    
 
In addition, the Eclipse L300N/L300ND feature antistatic coatings for stronger safeguards against contamination. Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls, helping prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
View this Press Release in U.S. Tech Magazine online

Solutions for Plastic Manufacturing Applications

June 23, 2010

Quality control in plastics manufacturing presents a real challenge as out-of-specification components represent a financial burden to the manufacturer, not only because of materials and machine time involved with re-running the batch, but also because of disposal and recycling charges.

With injection-moulding batches of plastics components stretching into the millions, identifying when key dimensions are threatening to drift out of tolerance is crucial. However, in addition to plastic conversion processes being subject to natural fluctuations, the sheer speed of the injection moulding process poses a real challenge in terms of effective quality control. Equally challenging is the range of colors, textures, sizes and complexity of components that need to be measured. Manufacturers need to be able to check statistically valid numbers of samples yet avoid compromizing demanding production schedules.

In addition to edge-to-edge dimensions, the position, diameter, depth and profile of apertures may also need to be checked. Also, since plastics form the outer cover of many high quality items, their surfaces need to be completely blemish-free.

Stereomicroscopy plays a key role in allowing staff to examine surface finishes and spot minute imperfections.

Manual metrology provides an accurate means to assess prototypes, check the performance of injection moulding dyes and perform lower volume quality control checks. Non-contact z-height measurement can also be a useful asset on manual measuring microscopes used for lower volume QC work.

Automated, non-contact video-based measuring not only allows multiple edge-to-edge measurements to be reliably made on large numbers of simple plastic components, but also the position, diameter, depth and profile of apertures on lower volume, complex work pieces.

With the correct illumination settings, repeatable and reproducible edge detection, even the edges on dark and clear parts can be correctly refracted, detected and reproducibly measured. Non-contact video measurement can also be used to compare CAD vs actual data and perform real-time SPC.

Key techniques for QC in plastics manufacturing include:stereomicroscopy; extended depth of field; polarizing microscopy; phase contrast; non-contact z-height measurement; non-contact video measuring systems; twin-ring LED illumination; through-the-lens laser autofocusing (TTL AF); laser scanning; and automated edge detection.

For more information on plastic manufacturing visit www.nikoninstruments.com.


Nikon Metrology exhibits at the Medical Device and Manufacturing show

June 8, 2010

At the MD&M East show this year, Nikon Metrology – Booth #1672, will feature the most complete and innovative metrology product portfolio, including:

130-inexiv-email.jpg  The iNEXIV Multi-Sensor Measuring System, a high-speed, fully-automated benchtop metrology and imaging system ideal for measuring dimensional features.
Nikon Metrology offers a complete product range for X-ray and Computed Tomography or CT inspection systems. These systems offer a non-destructive inspection method to visualize the inner side of test objects.
144-mm-200.jpg The MM-200 Measuring Microscope, a powerful toolmakers microscope ideal for measuring a variety of metal, plastic and electronic parts.
smz745t_ds.jpg The SMZ745 Digital Stereomicroscope System, a trinocular stereoscopic microscope ideally suited for observation and digital imaging. Featuring an impressive 7.5x zoom range. 

We hope to see you at the show!

Contact us today to set up a demo at the show.


Gene VanPatten talks about iNEXIV VMA-2520

June 7, 2010

Eugene J. VanPatten, manager of Nikon Metrology’s Midwest Industrial Department, talks about the newly formed company, Nikon Metrology, and the company’s iNEXIV VMA-2520 digital metrology and imaging system.

The interview was conducted during ICOMM/4M 2010, the 5th International Conference on MicroManufacturing, which focuses on the processes, equipment, and systems for fabricating miniature parts with micro-scale features.


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