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For more on our Laser Radar technology Click here!
Click on the arrows on the bottom right corner to enlarge screen. Click on the (HD) Icon at the top right for better resolution quality.
For more on our Laser Radar technology Click here!
Nikon Metrology is exhibiting at one of the top racing shows in the industry this year on December 1-3, 2011 in Booth #4376. Nikon will be featuring an MCA portable CMM arm along with MMDx laser scanner and Optical CMM with K-Scan at this upcoming show. Stop by the booth and see these products in action.
Visit http://www.performanceracing.com/tradeshow/ for more details.
Improve your process and product quality with the next generation Laser Radar technology from Nikon Metrology!
For this and much more, attend this productive, informative and free webinar on Wednesday, November 30th at 2:00pm-3:00pm.
You’ll see:
Presenter:
Jon Koepl, Sr. Sales Specialist, Large-Scale Products
Nikon Corporation is pleased to announce the ShuttlePix Digital Microscope System has been awarded the “iF design award 2012: iF product design award”. The iF design award is
globally prestigious award sponsored by International Forum Design GmbH of Hanover Germany. Beside the ShuttlePix, Nikon was also awarded for 3 Nikon digital cameras and one digital camera has been awarded the ” iF communication design award”.
The “iF design award” has been sponsored by International Forum Design GmbH of Hanover Germany since 1953. Each year, recipients of these prestigious awards are selected from worldwide industrial products exhibiting superior design. The awards include the product design award, communication design award and packaging award, etc.
This year, 4,322 products from 48 countries were evaluated and the awards are presented to 1,218 products. In selecting recipients, product aspects including quality of design, functionality, degree of innovation, simplicity of operation and environmental impact are considered for the product design award, while usability, look and feel, and uniqueness are accounted for the communication design award.
Read the press release on www.nikon.com
Visit Nikon Metrology at Booth #1241 on November 2-3. Nikon will be featuring their line of vision systems and microscopes. Visit http://us.nikonmetrology.com/ for more details.
Medical Design & Manufacturing (MD&M) Minneapolis is the most comprehensive resource for every aspect of medical device development. It gathers medtech professionals and leading medical OEM suppliers together to provide you with immediate hands-on access to the tools you need to accelerate your new device to market, all in one convenient location. Visit the website!
Click here to view Nikon Metrology’s very own YouTube Channel where you can find company movies and product videos for your educational convenience. Don’t forget to subscribe to this channel to receive future updates. It’s just one more resource for all your metrology needs.
Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, handheld laser line probes, X-ray and Computed Tomography (CT), Optical CNC measuring systems, measuring microscopes, Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering. Our systems are employed in aerospace, automotive and other manufacturing industries.
BRIGHTON, MI. – October 27, 2011 –Nikon Metrology is pleased to announce that the SHUTTLEPIX Digital Microscope has been awarded the Good Design Award 2011 organized by the Japan Institute of Design Promotion. The Good Design Award is a comprehensive program for the evaluation and encouragement of design organized by the Japan Institute of Design Promotion (JDP).
This award system was originally established in 1957, out of the belief that design was essential in breaking out of the cycle of poverty in Japan. Since then, the Good Design Award has been given to outstanding designs for more than 50 years in the pursuit of industrial development. Approximately 37,000 Good Design Awards have been given in continuing these efforts.
JDP receives approximately 3,000 submissions from more than 1,000 companies and designers from inside / outside of Japan every year. These designs are screened by about 60 design experts, who select and recommend those designs worthy of the Good Design Awards. However, the Good Design Awards is not a beauty contest, nor is it an award that assesses the design’s outcome in economic terms. Rather, the Good Design Awards is a system that aims to channel the eminent powers of distinctive designs to build prosperous lives and encourage sound industrial development. It is a campaign to brighten and enrich society through design.
Link:
http://www.g-mark.org/english/index.html
BRIGHTON, MI. – October 18, 2011 – Nikon Metrology. Inc. (NMI) – More than 100 Metrology and Manufacturing Professionals gathered to visit the new Nikon Metrology, Inc. Technology Center, located at their Headquarters for the Americas in Brighton, Michigan. The purpose of the event was to introduce one of the most advanced technology centers in Livingston County, Michigan, a sentiment echoed by Brighton Mayor Ricci Bandkau, who was on-hand to cut the ribbon, opening the Technology Center. Also present was Gary Vasilash, Editor-in-Chief of Automotive Design and Production, who keynoted with a state of the Automotive Industry. The Theme of “Advances in Industrial Metrology” was evident in the number of new and updated products on display. These included the HN-6060, Nikon Metrology’s leading Multi-Sensor Metrology System; BW-H501 3D Surface Profiler; MMDx Laser Scanners featuring increased speed of operation; and the ShuttlePix portable, digital Microscope, among many others. Product demonstrations and Technology overviews were held throughout the day, along with customer presentations from Arizona State University and Joe Gibbs Racing.
Also on display was a range of products highlighting:
Traditional measuring systems
Bridge CMM
Horizontal arm CMM
Articulated arms
Optical CMMs
Camio software
CMM-Manager
Large scale metrology
Laser Radar
iSpace /iGPS
Gantry CMM
Laser scanning
CMM scanning
Handheld scanning
Walkaround scanning
Robotized scanning
Pointcloud software
X-ray /CT
Electronics X-ray inspection
Computed Tomography
CT inspection of turbine blades
Vision based systems
Industrial Microscopes
Measuring microscopes
Scanning electron microscopes
CNC Vision systems
Semiconductor inspection
Optical comparators
Autocollimators
Digital height gages
Vision measuring software
For more information, please visit http://www.nikonmetrology.com or call 810-220-4360.
A brand new Nikon Metrology inspection system is now in use at the microfocus X-ray radiography/tomography facility (MIXRAD) of the South African Nuclear Energy Corporation (Necsa). It is the first high-precision microfocus X-ray/CT system made available to South African researchers, engineers and students who can use this advanced technology free-of-charge. High-precision 2D radiography and 3D tomography renderings help them investigate diverse natural and industrial samples in a non-destructive fashion. With the microfocus X-ray/CT system readily available and upgraded Neutron and new Gamma radiation radiography/tomography laboratories underway, Necsa offers the edge in non-destructive inspection on micron level. These investments greatly advance research on mineral deposits in South Africa, or help motivate the application for beam time at nano-level Synchrotron facilities abroad if needed.
One system characterizing many different samples
Necsa recently took delivery of a new 225kV microfocus X-ray/CT system from Nikon Metrology. The instrument has been acquired through South Africa’s National Research Fund – Research Infrastructure Support Programme (NRF-RISP). “Our new system helps academic and industrial researchers in South Africa study mineral deposit samples and advance paleontology, archaeology, geology, biology, energy as well as numerous industrial applications including mechanical and chemical engineering,” says Frikkie de Beer, Necsa’s radiography/tomography chief scientist. “Making complementary advanced imaging methods accessible triggers more active cooperation with universities, research institutions and companies in South Africa and abroad.”
The Nikon Metrology system allows users to literally navigate through the 3D volumes of their samples. Pinpoint sharp magnified 3D volume renderings make the difference in evaluating internal surfaces, material densities and other valuable material characteristics that otherwise remain invisible. It is also possible to calculate the volumetric fraction and size distribution for any specific mineral material found in the sample.
Developing high-level research expertise
The application reach of researchers and scientists using the system is impressive. To suit different user requirements, the Nikon Metrology XT H system can be adapted to characterize samples of different size, material and weight. For future upgrade of the current system delivered to Necsa, Nikon Metrology offers the quite unique capability of the system to have the X-ray source equipped with a rotating reflection target. This X-ray source setup provides much better cooling performance, allowing increased X-ray flux to be generated in order to penetrate larger or denser samples.
Using the same electron beam, the machine can be set up to produce small focal spot sizes, such as spot sizes between 3 and 5 micron for reflection targets (as delivered to Necsa), 10 micron on rotating targets and 1 micron on transmission targets (two options considered by Necsa). This enables researchers to detect inclusions, voids or material properties in resolution of about the spot size, highlighting the machine’s versatility.
The microfocus X-ray instrument in the MIXRAD facility places South African capabilities on par with international standards,” De Beer concludes. “The South African research community benefits from this by developing high-level research expertise and changing the country’s socio-economic situation.”

A geology sample CT slice highlighting 2 types of mineral deposits (pseudo-colored), each measuring approximately 20 micron.

Necsa instrument scientists posing in front of the Nikon Metrology microfocus X-ray and CT inspection system. Back: Mr. Lunga Bam, Mr. Robert Nshimirimana, Mr. Evens Moraba, Mr. Jacob Radebe and Mr. Frikkie de Beer (Section Head). Front: Mr. Paul Keanly (Nikon Representative) and Mr. Kobus Hoffman.
The official judging for the 37th Annual Small World Photomicrography Competition took place on May 12, 2011. The winners will be announced in October, but we’re giving you the chance to pick your favorites among this year’s top entries. Vote up a photo by “liking” it or skipping ahead to the next one. Have fun, and check back in the fall to see who won!
Celebrating 37 years of excellence in photography through the microscope, The Nikon International Small World Competition is dedicated to furthering creativity and excellence in photomicrography. Combining microscopy and photography, a photomicrographer is able to capture an image of the world that the naked eye cannot see. Take a moment to browse the Small World galleries and have a look at our past winners.
Take a moment and place your vote today!

Dr. Jorge Bernardino de la Serna - MEMPHYS - Center for Biomembrane Physics, Department of Biochemistry and Molecular Biology, Odense, Denmark, Giant liposomes of pulmonary surfactant (40X), Confocal
Nikon Metrology is living large at CMSC 2011 – Booth #708
July 25-29th
Arizona Biltmore Hotel & Spa, Phoenix, AZ
At this year’s premiere metrology conference, Nikon Metrology is showcasing our large-scale products, including the hot, new G3 MV330/350 Laser Radar, the extremely versatile Optical CMM with MMDx Handheld Scanner and our revolutionary Digital Microscope ShuttlePix -400R.
These large-scale products bring your applications down to size – a productive, manageable size. Stop by the booth to see just how we do it! Technical experts are manning the booth to answer your questions and demo these large-scale products just for you. Stop by Booth #708 to experience 3D metrology at its best, brought to you from Nikon Metrology!
| MV330/350 Laser Radar |
Optical CMM w/MMDx Scanner |
Digital Microscope ShuttlePix -400R |
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Not attending CMSC this year? That’s okay, just contact us at Marketing_US@NikonMetrology.com and we will set up a demonstration at your facility.
When you visit Semicon West this year, be sure to stop by Nikon Metrology’s booth, #6146, and see the best that metrology has to offer. You’ll be glad you did. Featured products include:
We hope to see you at the show!
Contact us today to set up a demo at the show.
Click here for your complimentary registration to SEMICON West 2011!