CMSC “Call for Papers” for 2011 Coordinate Metrology Systems Conference

December 14, 2010

The Coordinate Metrology Society, the eminent membership association for measurement professionals, today announced their “Call for Papers” in anticipation of their 2011 Coordinate Metrology Systems Conference (CMSC). Their 27th annual event will be held in Phoenix, Arizona from July 25-29, 2011. Metrology professionals from leading manufacturers, science laboratories, and academia are invited to submit abstracts for presentations and technical papers covering industry best practices, scientific research and developments, and successful applications of 3D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.

Abstract submissions will be peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2011. The deadline for abstracts is March 1, 2011. For guidelines or more information about presenting a technical paper at CMSC 2011, contact Michael Raphael, Technical Presentations Coordinator at presentations@cmsc.org. Guidelines for presentations and technical papers can be downloaded at 2011 CMSC Guidelines.

At the 2010 CMSC, 25 expert presentations were delivered by industry leaders from Northrop Grumman, NIST, Lawrence Livermore, National Physical Laboratory (NPL), Spirit AeroSystems, Hitachi Engineering & Services Corp., Harris Corporation, Argonne National Laboratory, ISRO Satellite Centre, Institute of Measurement and Automatic Control, Voith Hydro Inc., Sigma Space Corporation, Royal Institute of Technology, and other companies and educational institutions covering technology, theory, and practice to advance the field of 3D metrology. 

The Coordinate Metrology Society convenes each year to gather information and attend presentations delivered by their peers. Attendees include novice and veteran technology users, service providers, and OEM manufacturers of close-tolerance, portable industrial coordinate measurement systems, software, and peripherals. In the Exhibition Hall, visitors explore the latest in laser projection systems, laser trackers, laser radar, articulating arms, photogrammetry/videogrammetry systems, scanners, and indoor GPS.


High-Quality Inspection with the ShuttlePix Portable Microscope

December 13, 2010

Reprinted from Quality Magazine

The ShuttlePix P-400R Digital Microscope from Nikon Metrology is a portable digital microscope that has a sleek, compact design well suited for onsite use. This new concept in digital microscopy allows for much simpler remote inspection of large samples that previously had been too challenging.

Operators can use the ShuttlePix for inspection, observation, simple measurement and recording of high-resolution images in industrial applications, as well as other practical imaging applications where an object needs to be inspected on site and in its correct position without risk of damage.

Launched opening day at Chicago’s IMTS 2010 show in September, the microscope comes with a built-in four section LED oblique ring light that allows the observer to capture images without shadows by optimizing the light output. It can be operated on a Lithium-ion battery for handheld use. The cordless design allows the operator to bring the microscope to large samples, such as turbine castings, aircraft frames or pipe work that cannot be reached with conventional microscopes.

The technology can be used for a broad range of inspection tasks in aerospace, electronics, automotive, biomedical and other industries.

“The ShuttlePix is truly a portable microscope that can be easily used handheld, which enables the microscope to be brought to locations where conventional microscopes could not be taken,” says Koji Kiribuchi, marketing manager, vision products, Nikon Metrology.

“Previously, samples that were either too large, remote, or part of a large structure had to be sampled, cut or cross-sectioned in order to be analyzed under the microscope. The ShuttlePix enables a nondestructive analysis of samples. Additionally, the ShuttlePix can be used on the production floor without disrupting the manufacturing process. Prior to this, samples had to be brought to QA/QC testing labs, where the microscopes were typically stationed,” says Kiribuchi.

The ShuttlePix is equipped with a 2.5-inch LCD monitor where the operator can frame, focus and capture images.  Images are then saved to SD memory cards to be displayed on a PC for further analysis. The ShuttlePix also features 20x zoom optics, and operators are able to achieve a 20x to 400x magnification range without having to change the objective lens.

The microscope is very easy to operate. Just by holding down the capture button, a “best-shot selector” automatically starts up and saves only the best shot from a string of continuously shot images. There is also automatic selection of optimal camera mode based on the sample. Previous experience with using a microscope is not necessary, since the ShuttlePix operates the same way as a compact digital camera.

Kiribuchi says that Nikon’s ability to bring over its advanced optical technology, combine it with their advanced digital image process technology and package it in a very compact stylish design is one of the key features that makes the portable microscope so innovative.

A motorized focusing stand controller accompanies the ShuttlePix in combination with a 17-inch touch screen monitor that has motorized Z focusing, simple measurement analysis, extended depth of focus (EDF) and three types of stage options for a multitude of applications. Its application software offers 3-D image reconstruction and measurement.

In response to a growing demand for a truly portable microscope that could magnify samples and record and save images as digital files, Nikon started product development two years ago and will start shipping the ShuttlePix in December 2010.

So far, the response has been overwhelmingly positive. Nikon Metrology has received numerous inquiries from potential customers for a multitude of applications and inspection tasks, as well as for personal use. ShuttlePix P-400R will be available individually as a cordless microscope, or as a system unit by adapting onto the motorized focusing stand controller.

Watch a ShuttlePix video

Click here to request more information


Nikon Metrology partners with Measurement Supply Company at Performance Racing Industry Show 2010

December 10, 2010

 

Measurement Supply Company will be featuring a Nikon Metrology CMM portable scanning arm at the show this year in Orlando, Florida.
 
Visit Measurement Supply Company at Booth #5991.
 
 

 

Visit www.nikonmetrology.com to learn more about the portable scanning arm.

 

 

Visit http://www.performanceracing.com/tradeshow/ for more details.

Don’t miss the three biggest business days in motorsports when the worldwide racing industry gathers in Orlando, December 9-11, 2010, for the 23rd Annual Performance Racing Industry Trade Show.

Taking up nearly 1,000,000 square feet, 1000+ companies will display the latest advances in racing products and race engineering. Engine parts, suspension components, data acquisition, safety gear, new metal alloys and coatings, machining equipment, race electronics…it’s all part of the world’s largest racing trade show.

Information reprinted from www.performanceracing.com


Nikon Metrology features MCA II Portable Scanning CMM Arm at the International Motorsports Industry Show

December 3, 2010

 

Full flexibility – Portable productivity
The MCA II, Manual Coordinate measuring Arm, is a precise, reliable and comfortable portable measuring system available in a 6- or 7-axis version. It feels perfectly at home in the metrology lab as well as on the shop floor.

The  MCA II  can  be  equipped  with  a  wide  range of  probing systems  for laser scanning, touch  trigger measurements and  continuous scanning. Its flexibility makes this measurement arm the perfect partner for a wide range of measurement tasks

Learn more about Nikon Metrology’s articulated scanning arm at www.nikonmetrology.com


Hoskin Scientific Features Nikon Metrology Solutions at Canadian Manufacturing Week – Booth # 5022

October 5, 2010

October 5-7, 2010
Toronto Congress Centre, North Building
650 Dixon Road
Toronto, Ontario, Canada

Canada’s LARGEST and MOST COMPREHENSIVE MANUFACTURING SHOW is back and packed with MORE NEW TECHNOLOGIES than ever before!

Canadian Manufacturing Week (CMW), is the event that Canadian manufacturers have relied on for over 20 years to improve and strengthen their business. The show you look to for innovative products, technology, equipment and services has evolved into something even better. A new, state-of-the-art venue, convenient location, and more new technologies than ever before combines to form the most efficient and effective way to source the solutions you need to succeed – all under one roof.

  

 

 

 

 

 

 

Hoskin Scientific will be exhibiting at CMW 2010, Booth#5022. In their booth they will feature the Nikon Metrology 6-axis portable arm with touch probe and CMM-Manager software as well as the SMZ-745T stereoscopic microscope.

Visit http://www.hoskin.ca/ for more information or visit http://us.nikonmetrology.com/ to learn more about our products.


Rapidform to Interface Directly with Nikon Metrology Handheld Laser Scanners

September 9, 2010

Nikon Metrology introduces its range of handheld 3D laser scanning solutions integrated into Rapidform XOR/Redesign and XOV/Verifier software. This solution enables design and manufacturing professionals to take full advantage of using premium Nikon Metrology scanners in combination with leading 3D point cloud analysis software to tackle reverse engineering or inspection tasks. Thanks to the new application programming interface (API), it becomes very straightforward for 3rd-party software vendors such as Rapidform to integrate Nikon Metrology 3D laser scanning.

Seamless integration for unmatched user experience

Collecting geometry data with Nikon Metrology’s leading-edge laser scanners is now easier than ever for Rapidform customers. Completely transparent to designers and manufacturers using Rapidform XOR/Redesign, the most comprehensive scan-to-CAD reverse engineering software and XOV/Verifier, the CAD-friendly inspection software, the Focus Handheld Scanning API manages point cloud acquisition by controlling all interaction between the ModelMaker laser scanners and handheld localizer of choice. As it handles all interfacing with the scanner, such as scanner parameter modifications or running a qualification routine, the API ensures the highest accuracy and reliability of the acquired data. The resulting point cloud data is fed directly into the Rapidform application in real time, ready for further processing.

Calvin J. Hur, CEO for INUS Technology Inc., remarked: “We’re very pleased to enhance our relationship with Nikon Metrology. By joining forces with Nikon Metrology, Rapidform offers designers and manufacturers the possibility to drive all handheld Nikon Metrology 3D scanners from XOR/Redesign and XOV/Verifier. Their favorite software environment allows them to acquire 3D scan data, and immediately run geometric inspection or directly create native, editable CAD models for reverse engineering purposes. Through our partnership with Nikon Metrology, a market leader in 3D scanning hardware, we are offering best-in-class reverse engineering, inspection and other engineering solutions to high-end customers worldwide. This further extends Rapidform software to support the sophisticated needs of high-end customers in automotive and aerospace industries.”

Rapidform XOR/Redesign is the only 3G (third-generation) reverse engineering software in the world. It is unique in the sense that you can collect data with any Nikon Metrology 3D scanner of choice and quickly create editable, parametric solid models of virtually any physical object. These models can be transferred from XOR into popular CAD applications with complete feature trees intact. This means that – unlike second generation reverse engineering software – the models from XOR are editable just like any other part designed in CAD. XOR, paired with a Nikon Metrology 3D scanner, is simply the fastest, most accurate way to create a design model of a real-world object that is ready for manufacturing.

API supporting MMDx scanner and MCA II arm

The Focus Handheld API supports Nikon Metrology’s latest-generation handheld scanning solution: the MMDx digital laser scanner on an MCA II articulated measuring arm. It also supports this scanner in combination with the K-Series Optical CMM as well as 3rd‑party measuring arms such as Romer/Cimcore and Faro. Nikon Metrology’s digital laser scanners offer superior optical and digital technology, translating into higher accuracy, automatic laser intensity adaptation and faster data acquisition.

With the new API, it becomes very straightforward for 3rd-party point cloud software vendors to integrate Nikon Metrology 3D laser scanning. This offers design and manufacturing engineers fast-lane access to world-class laser scanning, while enjoying the convenience of the point cloud engineering environment they know inside out.


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