November 22, 2010
Nikon Metrology, Inc. Announces Opening of New Western Regional Sales Office in Irvine, California
Nikon Metrology Grand Opening in Irvine, California
Nikon Metrology, Inc. just announced the opening of its new Western regional sales office in Irvine, California. The facility will serve as a sales and demonstration center for current and potential Nikon Metrology customers in California, Arizona, New Mexico, Utah, Colorado, Nevada, Idaho, Wyoming, and Texas.
“We are always looking for ways to support our customers’ needs, and this new regional sales office exemplifies these efforts,” says Robert Wasilesky, senior vice president of sales and marketing, for Nikon Metrology, Inc. “It’s exciting to open this facility for our West Coast customers and ensure we are providing them the top level of service possible.”
A celebration for the grand opening of the facility was held October 20-21, 2010 with a ribbon cutting ceremony and a catered lunch. Nikon Metrology technical experts demonstrated a wide range of different products from the company’s diverse product line, including coordinate measuring machines, laser scanners, and vision measuring systems.
The office will be home to nearly a dozen Nikon Metrology employees who will provide customer support and sales demonstrations for customers.
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Events, General Buzz, Nikon Metrology, Press Release | Tagged: Bob Wasilesky, California, Coordinate Measuring Machines, Grand Opening, iNexiv, Irvine California, Laser Scanners, microscopes, NEXIV, Nikon Metrology, ribbon cutting ceremony, Robert Wasilesky, vision measuring machines, vision measuring systems, vision systems, Western Regional Sales Office | 
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Posted by Metrology Solutions Provider
November 12, 2010
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INUS Technology, Inc. just announced the release of Rapidform XOV2 Service Pack 2, which brings major improvements to the application’s reporting and 3D scan measurement capabilities. Rapidform XOV takes data from any 3D scanner, including Nikon Metrology 3D laser scanners, and enables manufacturers to quickly verify that parts are within specification. This latest release sharpens XOV’s focus on allowing fast, easy inspection of parts and seamless interoperability with popular CAD software. Highlights of the 50+ enhancements include:
- New 3D scan measurement tools: All of XOV’s extensive GD&T (geometric dimensioning and tolerancing) tools are available for use on 3D scan data, without the need for a CAD model. Users can now freely measure scanned parts, and XOV will automatically define features and calculate results for flatness, cylindricity, circularity, straightness, etc.
- Virtual calipers: Any part can be measured in the same way as with physical calipers inside the software. A part can quickly be scanned, and saved for future measurement at any time. Imagine taking a measurement on tooling that is on the factory floor, without having to stop the line!
- Streamlined virtual CMM: Like virtual calipers, XOV can also simulate a CMM’s measurements on a scanned part, offering the same time-saving benefits.
- Two new 3D scanners added to liveScan: XOV can control 18 of the most popular 3D scanners, and with SP2 that now includes Nikon Metrology’s handheld scanners.
- Enhanced automation: XOV’s batch process tool gains several enhancements, including the ability to process groups of scans automatically. It will also automatically print out complete inspection reports after processing each scan or group of scans.
The new service pack will be released the week of November 10, 2010. For more information or to request a demonstration of the new features, visit www.rapidform.com/xov2sp2. |
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Leave a Comment » | CMM Laser Scanning, Handheld Scanning, Nikon Metrology, Press Release, Software | Tagged: 3D scan measurement, CAD, calipers, cmm software, GD&T, Handheld scanners, INUS Technology, laser scanning, Nikon Metrology, part verification, quality inspection, Rapidform, Rapidform XOV2, software | Permalink
Posted by Metrology Solutions Provider
September 17, 2010
CMM-Manager 3.0 for Windows 7 is by far the most value-for-money tactile inspection software that runs on nearly all CNC and manual CMMs. The modern and intuitive Windows 7 graphical interface makes the software even more informative and interactive. Get more things done with CMM-Manager, by automating serial inspection or by easily taking a few points on the spot. And when combined with the new Renishaw 5-axis PH20 probe head, CMM-Manager 3.0 turns around inspection work up to 3 times faster.
Versatility to get the most out of your CMMs
The dashboard has been upgraded with intuitive new icons and a ribbon bar style layout. CMM-Manager 3.0 for Windows 7 also incorporates touch screen and multi-touch support and intuitive navigation paths. Simply walk up to the CMM, quickly align the part, and immediately measure geometric features and points on planes. When CAD is available, you can even take snap point measurements on the screen to eliminate manually probing the work piece – and automatically create dimensional charts with color-coded point deviations.
Docking and sliding panels provide a more open and simplified workspace, and inspection tools are simple to use. To create a serial inspection routine that runs on any CMM brand, you simply click points and features on a 3D part view and drag-and-drop them as icons on to a part program representation. CMM-Manager automatically converts the icon program into a collision-free touch probe motion path. Automated inspection results in graphic part-to-CAD comparison, a digital communication tool providing all the answers.
PH20 support triples CMM productivity
CMM-Manager 3.0 for Windows 7 supports the new Renishaw PH20 probe head that drives fast, infinite, rotary positioning for high-speed point measurement with minimal CMM movement. The new probe head brings five-axis inspection capability to smaller CMMs by optimizing the working volume of the measurement platform. Through PH20 support, CMM-Manager 3.0 for Windows increases touch-trigger CMM inspection throughput up to three times. CMM-Manager software operates on a PC or laptop running a Microsoft Windows 7 32-bit or 64-bit operating system.
Leave a Comment » | Coordinate Measuring Machines, Nikon Metrology, Press Release, Software | Tagged: automated inspection, CAD, CMM, CMM inspection, cmm software, CMM-Manager, CMM-Manager 3.0, IQ Form fit, measurement, Metris, Nikon, Nikon Metrology, Part-to-CAD comparison, PH20, Renishaw, software, Windows 7 | Permalink
Posted by Metrology Solutions Provider
September 14, 2010
Photo courtesy of Joe Gibbs Racing
In the high-octane, fast-paced world of NASCAR, there is no room for error – and the Joe Gibbs Racing (JGR) Team is no exception. More than 450 employees work to keep the team in top form, responsible for everything from hand-building engines to moving the entire racing fleet to competitions, which take place nearly every weekend of the year.
In the early part of 2010, the JGR engineers were facing a problem. The racecar engine’s rocker arms – reciprocating levers that convey radial movement from the cam lobe into linear movement at the poppet valve, and are responsible for helping the cars accelerate to their incredible speeds without blowing the engine – were experiencing excessive wear and tear, even though they were coated with lubricants to prevent just that type of damage. With their available tools, the JGR engineers could not see how or why the damage was occurring, so they contacted Nikon Metrology to see if they could help solve the issue.
Diagram courtesy of COMP Performance Group
To examine the problematic rocker arms, Nikon Metrology sent the JGR engineers its AZ100 model microscope, a multi-purpose zoom microscope that combines the wide field of view advantages of a stereoscopic zoom microscope with those of a metallographic microscope. The AZ100 system features high-resolution bright field and seamless digital documentation.
JGR engineers used the Nikon AZ100 with its high-resolution Plan Apochromat lens and the digital imaging system DS-Fi-L2 to capture and analyze images of the failed rocker arms. With this system, at 50X magnification, the engineers were able to capture images at a far greater resolution and contrast than with their previous system – and using the Ethernet connectivity of the Nikon DS-L2 Digital Camera Controller, were able to share and evaluate the live images with their vendor/technical partner.
Through video conferencing and image sharing, it only took the two groups 90 minutes to determine that inclusion and discoloration in the coating were responsible for the rocker arms’ damage – and that the excessive stress and heat placed on these parts were not being properly deflected. Immediately, the vendor/technical partner engineers were able to propose a solution to the problem, whereas with the previous system it would have taken anywhere from two to seven days to communicate and send the images to the engineers to determine a cause.
Richard Miller (pictured above), quality control engineer for Joe Gibbs Racing, best summarized the teamwork between the two companies by saying, “In this world, it’s all about speed, quality and reliability. Using Nikon Metrology’s equipment, we were able to return our cars and drivers to the track with the speed, accuracy and safety this sport requires.”
Leave a Comment » | Case Studies, Microscopes, Nikon Metrology, Press Release | Tagged: AZ100 microscope, digital imaging, engine rocker arms, high-resolution bright field, JGR, Joe Gibbs, Joe Gibbs Racing, metallographic microscope, NASCAR, Nikon Metrology, Plan Apochromat lens, quality control engineer, racecar, Richard Miller, sponsor, sponsorship, steroscopic zoom microscope, zoom microscope | Permalink
Posted by Metrology Solutions Provider
September 13, 2010
Nikon Metrology, Inc. announced today the release of its new ShuttlePix P-400R Digital Microscope, made for inspection, observation, simple measurement and recording of high-resolution images. For on-site analysis of samples, it serves as a handheld microscope that shoots high-resolution images as quickly and easily as taking pictures with a digital camera. For stationary use, the ShuttlePix microscope interfaces seamlessly with a motorized stand. With the equipped 17-inch touchscreen monitor, the user can easily control, display, measure or print images. The microscope also connects to a standard PC or laptop running dedicated 3D image reconstruction software.
“The versatility of the ShuttlePix system means the user can bring the microscope to large samples, such as an aircraft frame, turbine casting or pipe work that often cannot be reached with a standard microscope,” says Bob Wasilesky, Senior Vice President, Nikon Metrology Inc. “The unique ShuttlePix technology supports a wide range of inspection tasks in automotive, electronics, aerospace and other industries. In combination with its imaging capabilities, it’s a very versatile, extremely useful piece of equipment.”
The ShuttlePix addresses the market need for an easy-to-use device that magnifies samples and can record and save images as digital files. Nikon combined its technological excellence in optical technology with its expertise in digital image processing technology to enable the creation of the ShuttlePix.
The stand is equipped with a motorized Z, which does not require a PC for control. Operation of the stand is simple, allowing extended depth of focus (EDF) image capture with the touch of a button.
ShuttlePix offers a 20x zoom with a magnification range of 20x– 400x on a 17-inch monitor, which is double that of competitors’ models. For optimal lighting, the zoom head has built-in 4 section LED ring illumination. The ShuttlePix will be exhibited September 13 – 18 at IMTS 2010 in Chicago, and will become available in December 2010.
Leave a Comment » | Microscopes, Nikon Metrology, Press Release | Tagged: Bob Wasilesky, microscopes, Nikon, Nikon Instruments, Nikon Metrology, ShuttlePix, ShuttlePix P-400R Digital Microscope | Permalink
Posted by Metrology Solutions Provider
September 9, 2010
Nikon Metrology introduces its range of handheld 3D laser scanning solutions integrated into Rapidform XOR/Redesign and XOV/Verifier software. This solution enables design and manufacturing professionals to take full advantage of using premium Nikon Metrology scanners in combination with leading 3D point cloud analysis software to tackle reverse engineering or inspection tasks. Thanks to the new application programming interface (API), it becomes very straightforward for 3rd-party software vendors such as Rapidform to integrate Nikon Metrology 3D laser scanning.
Seamless integration for unmatched user experience
Collecting geometry data with Nikon Metrology’s leading-edge laser scanners is now easier than ever for Rapidform customers. Completely transparent to designers and manufacturers using Rapidform XOR/Redesign, the most comprehensive scan-to-CAD reverse engineering software and XOV/Verifier, the CAD-friendly inspection software, the Focus Handheld Scanning API manages point cloud acquisition by controlling all interaction between the ModelMaker laser scanners and handheld localizer of choice. As it handles all interfacing with the scanner, such as scanner parameter modifications or running a qualification routine, the API ensures the highest accuracy and reliability of the acquired data. The resulting point cloud data is fed directly into the Rapidform application in real time, ready for further processing.
Calvin J. Hur, CEO for INUS Technology Inc., remarked: “We’re very pleased to enhance our relationship with Nikon Metrology. By joining forces with Nikon Metrology, Rapidform offers designers and manufacturers the possibility to drive all handheld Nikon Metrology 3D scanners from XOR/Redesign and XOV/Verifier. Their favorite software environment allows them to acquire 3D scan data, and immediately run geometric inspection or directly create native, editable CAD models for reverse engineering purposes. Through our partnership with Nikon Metrology, a market leader in 3D scanning hardware, we are offering best-in-class reverse engineering, inspection and other engineering solutions to high-end customers worldwide. This further extends Rapidform software to support the sophisticated needs of high-end customers in automotive and aerospace industries.”
Rapidform XOR/Redesign is the only 3G (third-generation) reverse engineering software in the world. It is unique in the sense that you can collect data with any Nikon Metrology 3D scanner of choice and quickly create editable, parametric solid models of virtually any physical object. These models can be transferred from XOR into popular CAD applications with complete feature trees intact. This means that – unlike second generation reverse engineering software – the models from XOR are editable just like any other part designed in CAD. XOR, paired with a Nikon Metrology 3D scanner, is simply the fastest, most accurate way to create a design model of a real-world object that is ready for manufacturing.
API supporting MMDx scanner and MCA II arm
The Focus Handheld API supports Nikon Metrology’s latest-generation handheld scanning solution: the MMDx digital laser scanner on an MCA II articulated measuring arm. It also supports this scanner in combination with the K-Series Optical CMM as well as 3rd‑party measuring arms such as Romer/Cimcore and Faro. Nikon Metrology’s digital laser scanners offer superior optical and digital technology, translating into higher accuracy, automatic laser intensity adaptation and faster data acquisition.
With the new API, it becomes very straightforward for 3rd-party point cloud software vendors to integrate Nikon Metrology 3D laser scanning. This offers design and manufacturing engineers fast-lane access to world-class laser scanning, while enjoying the convenience of the point cloud engineering environment they know inside out.
Leave a Comment » | Nikon Metrology, Optical Scanning, Portable Metrology, Press Release, Software | Tagged: 3D point cloud analysis, 3d scanning, CAD models, Calvin J. Hur, Focus Handheld Scanning, geometric inspection, handheld scanning, inspection, INUS Technology, K-Series Optical CMM, MCA II articulated measuring arm, MMDx digital laser scanner, ModelMaker scanner, Nikon Metrology, parametric solid models, point cloud data, portable laser scanner, Rapidform, reverse engineering, scan-to-CAD, XOR/Redesign, XOV/Verifier | Permalink
Posted by Metrology Solutions Provider
July 20, 2010
Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series optical CMMs configured with scanners and probes, MCA II articulated arm configured with scanners and probes, and the iGPS.
“Verisurf is proud to partner with Nikon Metrology and offer engineers a major breakthrough in measurement and inspection,” said Ernie Husted, president of Verisurf. “Having advanced inspection software that can be used with all of their metrology devices will dramatically increase efficiency. Manufacturers will save countless hours otherwise spent learning and using multiple software interfaces, while significantly reducing software maintenance and technical support costs.”
“This partnership is a huge benefit to our metrology customers,” said Doug Kappler, Director of Nikon Metrology Large Scale Division. “In addition to being able to offer a single software platform for all Nikon Metrology portable metrology devices, the software provides fully automated and programmable measurements.” We hope customers of Verisurf will stop and see how this partnership with Nikon Metrology provides world-class products for the everyday user.
Verisurf’s new X platform is the latest release of its popular computer-aided inspection and reverse engineering software. The X platform gives engineers unprecedented value with new device interfaces, improved inspection guidance functionality and feature extraction for reverse engineering. An updated VDI has added many new non-contact measurement and automation controls for the Nikon Metrology Laser Radar, enabling this sophisticated metrology device to perform at its highest level.
Nikon Metrology and Verisurf exhibited the solution at the Coordinate Metrology Systems Conference (CMSC) in Reno from July 13-15.
Verisurf Software, Inc.
Verisurf Software, Inc. is a privately held metrology software development company committed to delivering advanced computer-aided inspection and reverse engineering solutions. Verisurf software lets manufacturers produce higher quality products in less time and at a lower cost by using highly automated paperless, 3D model-based inspection processes, rather than hand measurements and 2D paper drawings. For more information, visit www.verisurf.com.
Click here for more details
Leave a Comment » | Nikon Metrology, Press Release, Software | Tagged: cmsc, Doug Kappler, Ernie Husted, iGPS, K-Scan, K-Series Optical, Laser Radar, MCA II, Metris, Nikon, Nikon Metrology, optical CMM, Scanning Solutions, software, Verisurf, Verisurf Software, X platform | Permalink
Posted by Metrology Solutions Provider
July 16, 2010
Nikon Metrology, Inc. (www.nikonmetrology.com) introduces the new Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications. Developed on the strength of Nikon’s leading optical and mechanical technologies, the Confocal NEXIV-K6555 incorporates the latest Confocal, image processing and Through the Lens (TTL) laser technologies for faster and more accurate non-contact 3D measurements on larger size substrates, probe cards and other applications requiring large stage travel.
Nikon designed the Confocal NEXIV VMZ-K6555 with longer XY travel (650mm x 550mm) to cover the non-contact 3D measurement requirements of larger substrates, such as recent cutting-edge interposer substrates and probe cards with greater accuracy and faster measurement speed. In addition, the newly developed ZC objective lenses for height measurement can obtain height data for every pixel in the field of view in a single scan, allowing fast, accurate, repeatable and reproducible wide-area height measurements.
For faster measurement speed, Nikon has redesigned the standard confocal optics using lower magnifications such as 3x and 7.5x. The system can be configured either with built-in high magnification CF optical head or with built-in standard magnification CF optical head so that it can be optimized for broad variations of complicated and smaller measuring targets on measuring applications. It is particularly well-suited for micro-bumps on advanced IC packages; probe cards; substrate pattern height and size; advanced glass and polymer components, such as micro lenses and contact lenses, laser marks on semiconductor wafers; MEMS; wire bonding and advanced fine interconnection technology.
The new Confocal NEXIV VMZ-K6555 also allows for both 2D measurements on brightfield images with the CNC 15x zooming optics and 3D measurements on confocal images. Furthermore, the TTL scanning laser auto focus and video image auto focus functionalities add greater flexibility.
“The Nikon Confocal NEXIV VMZ-K6555 provides new measurement possibilities in a field with extremely demanding applications,” says Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc. “By combining advanced Nikon confocal optics with Nikon’s powerful image processing technology, the Confocal NEXIV VMZ-K6555 allows for the necessary versatility and functionality.”
Leave a Comment » | Microscopes, Nikon Metrology, Press Release | Tagged: 3D measurements on confocal images, Confocal NEXIV-K6555, confocal optics, Lens (TTL) laser technologies, Metris, Nikon, Nikon Instruments, Nikon Metrology, optical and mechanical technologies | Permalink
Posted by Metrology Solutions Provider
July 14, 2010
Nikon Metrology, Inc. introduced the Eclipse L300N/L300ND, a FPD/LSI inspection microscope at SEMICON WEST 2010 in San Francisco.The device has an enhanced Epi-Fluorescence function enabling 365nm UV excitation optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays (OLEDs). The system also incorporates Nikon’s world renowned infinity optics, CFI60, offering both image brightness through high NA and wider sample range and access with long working distance. 
The motorized universal nosepiece on the Eclipse L300/L300N is three times more durable than conventional models. It incorporates an anti-flash mechanism, which engages when the nosepiece is rotated to protect the operator’s eye. In addition, a centering mechanism is possible at three nosepiece positions to minimize image shifts when changing the objective magnification. USB interface is available for nosepiece position output to DS-L2 and U2 as well as control of nosepiece through Nikon’s NIS-Elements software.
“With the Epi-Fluorescence observation, UV excitation is now possible. This is highly beneficial in the inspection of semiconductor wafers and OLEDs,” said Koji Kiribuchi, Marketing Manager, Nikon Metrology, Inc.
The Eclipse L300/L300ND employs a high-intensity 12V-50W halogen illuminator that is brighter than that of a standard 12V-100W illuminator while consuming half the power. Incorporating a lamphouse rear mirror and optimizing the size of the lamp filament allows effective and uniform illumination on the pupil plane. Objectives with a magnification of 50x or higher benefit from an increased brightness of 20 percent compared to the 12V-100W illuminator. In addition, the Eclipse L300ND model employs a new light source and an advanced optical design, which provides diascopic illumination four times brighter than the conventional model.
In addition, the Eclipse L300N/L300ND feature antistatic coatings for stronger safeguards against contamination. Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls, helping prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
Leave a Comment » | Microscopes, Nikon Metrology, Press Release | Tagged: Eclipse L300N, inspection microscope, Metris, Nikon, Nikon Instruments, Nikon Metrology, NIS-Elements software, optics | Permalink
Posted by Metrology Solutions Provider
June 28, 2010
BELCAMP, MD – Kyle Herr, a metrologist with SURVICE Metrology—a division of the SURVICE Engineering Company, headquartered in Harford County, MD—recently supported NASA by collecting critical surface measurements of mounting locations for the various optical components that will be attached to the frame of the new James Webb telescope. The surveying crew used Nikon Metrology’s coherent laser radar (CLR) to collect the necessary high-precision measurements needed to ensure that all the mounting plates were correctly positioned within the structure of the frame.
Nikon Metrology’s CLR offers non-contact laser line scanning and single-point coordinate measuring machine (CMM) measurements. The CLR is available in two models, the MV224 and the MV260. The only difference between the two is the scanning range of 24 m and 60 m, respectively. With the CLR system, the user is able collect data over a large volume while maintaining high accuracy. The accuracy at a range of 1 m is 16 μm; and at 24 m, it is 240 μm. With the use of high-precision tooling balls, the CLR is able to be relocated multiple times during a survey while maintaining accuracy and the coordinate system of the component being measured.
Photo Courtesy of NASA Goddard Space Flight Center
NASA has its own CLR and metrology group, but given the time requirements for all of the measurements to be completed, a second CLR was needed. This is where SURVICE Metrology’s services came in. Because the CLR is a completely portable system, SURVICE was able to accommodate NASA’s measurement needs. All of the metrology work took place at the NASA Goddard Space Flight Center in Greenbelt, MD, inside one of the largest clean rooms in the world. The clean room uses laminar air flow with a combination of paper, carbon, and HEPA filters to ensure proper clean room levels. SURVICE’s CLR had to undergo a vigorous cleaning process before entering the facility. All of the raw data were collected and analyzed using the New River Kinematics Spatial Analyzer software package.
Learn more about Nikon Metrology’s Laser Radar
Leave a Comment » | Case Studies, Nikon Metrology, Press Release | Tagged: CLR, James Webb telescope, Kyle Herr, Laser Radar, Metris, MV224, MV260, Nikon, Nikon Metrology, Survice Metrology | Permalink
Posted by Metrology Solutions Provider
May 19, 2010
At the Rapid show, Nikon Metrology releases the ModelMaker MMDx series with digital ESP3 technology. MMDx now scans nearly all sample materials and surface finishes by automatically using the most optimal laser stripe settings. ModelMaker MMDx comes in different stripe widths and fits on Nikon Metrology and most other articulated arm brands.
Nikon Metrology, a new Nikon daughter company, markets the products of former Metris and the industrial inspection solutions of the Nikon Instruments division. Building on the legacy of being a leading innovator in non-contact metrology, Nikon Metrology introduces exciting laser scanning solutions for CMM and handheld applications.
ModelMaker MMDx scanners feature digital camera technology and Enhanced Sensor Performance of the 3rd generation (ESP3) to scan all sample materials and surface finishes. Through ESP3 technology, MMDx digitizes surfaces with varying color or abrupt surface finish transitions under any lighting conditions by dynamically adapting laser beam intensity point per point. ESP3 combined with a latest-generation reflection filter ensures that even highly reflective objects can be scanned without requiring spraying.
ModelMaker MMDx laser scanners come in 50, 100 and 200mm laser stripe widths, to suit every inspection need. The scanner is compatible with Nikon Metrology arms and most leading 3rd party articulated arms, including Faro and Romer / CimCore. For applications involving larger parts, modelMaker MMDx technology is also available as part of the K-Scan Optical CMM system. This unique scanning system allows the operator to freely walk around and take scans as desired. Nikon Metrology Focus Handheld software supports the MMDx scanner, in addition to most 3rd party point cloud software applications.
Click here for more information on the new MMDx handheld scanner.
Leave a Comment » | Nikon Metrology, Press Release | Tagged: digital camera technology, handheld scanning, K-Scan, laser scanning, Metris, MMDx, Nikon, Nikon Metrology, optical CMM, portable arms, portable scanning, Rapid Show, scanning, scanning all surface finishes, walk-around scanning | Permalink
Posted by Metrology Solutions Provider
May 14, 2010
Nikon Small World Photomicrography Competition. For 36 years, the competition has featured some of the most esteemed names in science and science journalism on its judging panel, and this year is no exception. Since its founding in 1974, Nikon Small World has seen consistent growth due in part to the amazing image submissions and the distinguished judges who have offered their insight to the contest.
Arabidopsis thaliana (thale cress) anther (10x) - 1st place, 2009
The judges for the 2010 Nikon Small World Photomicrography Competition are:
- Jeremy Kaplan, Science & Technology Editor, FoxNews.com
- Betsy Mason, Science Editor, Wired.com
- Alison J. North, Ph.D., Director of the Bio-Imaging Resource Center and Assistant Professor, Rockefeller University
- Shirley A. Owens, Ph.D., Retired Director of the Confocal Lab in the Center for Advanced Microscopy, Michigan State University
Sonchus asper (spiny sowthistle) flower stem (150x) - 2nd place, 2009
Nikon Small World recognizes the world’s best photomicrographers who are making key contributions to life sciences, bio-research and industrial science, while also demonstrating acute comprehension of the pleasing aesthetics when science and art come together. The competition is the preeminent forum for showcasing the beauty and complexity of life as seen through the light microscope and over the years has received international recognition in the science community, among art and photography lovers, and in the media.
Winners of the Nikon Small World Competition will be announced in October. For additional information, please visit www.nikonsmallworld.com, or follow the conversation on Facebook and Twitter @NikonSmallWorld.
Leave a Comment » | Events, General Buzz, Microscopes, Nikon Metrology, Press Release | Tagged: Alison J. North, Betsy Mason, Jeremy Kaplan, microscopes, Nikon, Nikon Instruments, Nikon Metrology, photography, photomicrographers, photomicrography, Shirley A. Owens, small world competition | Permalink
Posted by Metrology Solutions Provider
May 11, 2010
Nikon Metrology introduces the all-digital LC60Dx / LC50Cx scanners. The next-generation LC60Dx CMM laser scanner, evolved from the successful LC60D scanner, brings laser scanning in the accuracy range of tactile measurement. The affordable, yet powerful LC50Cx scanner features higher scanning rate and captures surfaces of varying color and high reflectivity without user interaction. Nikon Metrology also presents new subreleases of Focus and Camio.
Nikon Metrology, a new Nikon daughter company, markets the products of former Metris and the industrial inspection solutions of the Nikon Instruments division. Building on the legacy of being a leading innovator in non-contact metrology, Nikon Metrology introduces exciting laser scanning solutions for CMM and handheld applications.
Realizing high scanning accuracy and speed
Nikon Metrology introduces the all-digital LC60Dx scanner with powerful CMOS technology, an evolution from the LC60D CMM laser scanner. The major improvement for LC60Dx is higher accuracy, resulting in a typical MPEp value of 7 micron according to EN ISO 10360-5. This brings the scanner in the accuracy range of tactile measurement, while capturing 75,000 measurement points a second. By acquiring a multitude of measurement points, LC60Dx reliably digitizes freeform shapes and supports highly accurate feature extraction.
Also new in the LC family is the LC50Cx laser scanner. This entirely digital scanner benefits from an upgraded scanning rate of 45 stripes per second and Enhanced Sensor Performance of the 3rd generation (ESP3) as incorporated into the LC60Dx. Through ESP3 technology, LC scanners digitize surfaces with varying color, high reflectivity or abrupt transitions under any lighting conditions by dynamically adapting laser beam intensity point per point. Altogether, the LC50Cx is an affordable, yet powerful CMM scanner offering adequate productivity for a broad range of inspection and reverse engineering applications.
Faster and more versatile point metrology software
Defining scanner motion paths for a laser scanning inspection job is straightforward compared to the traditional programming of many touch sensor points. The new 6.3 sub-release of Camio software speeds up data acquisition even further. New in this regard is the so-called Fly-by Scanning mode. Using this mode, the software automatically calculates optimum and continuous scanner motion path curves, resulting in up to 25% faster scanning and simplified programming. Furthermore, Focus inspection 9.2 offers a complete set of functions for digital surface and feature inspection. It instantly delivers geometric feedback that is essential in tuning final part design and monitor product quality in the fabrication process. In addition to supporting infinite point cloud size on 64-bit computers, Focus introduces extended language support, CATIA V5 file import, enhanced feature extraction and new GD&T capabilities compliant with the ASME Y14.5M standard.
Click here to read more about the new LC60Dx/LC50c laser scanner.
Leave a Comment » | CMM Laser Scanning, Nikon Metrology, Press Release, Software | Tagged: 3D laser scanners, affordable scanning, digital laser scanners, digital scanning benefits, feature inspection, focus inspection, high sccuracy laser scanning, Laser scanner, laser scanning capabilities, laser scanning solutions, LC50c, LC60Dx, Metris, metrology software, Nikon, Nikon Metrology, tactile measurement | Permalink
Posted by Metrology Solutions Provider
May 5, 2010
Lockheed Martin, jointly with Magestic Systems, Inc. and Nikon Metrology, has won a first-place JEC Innovation Award in composites manufacturing for technology used in the production of the F-35 Lightning II stealth fighter.
The 2010 JEC Innovation Award was presented in Paris in recognition of the cured laminate compensation (CLC) process – an innovative composite manufacturing solution for achieving precision, as-built laminate thickness without costly post-cure machining. This new metrology-assisted process is used in the production of composite parts for the F-35 and was developed specifically to pre-measure and correct the thickness of cured composite wing skins for the F-35. The technology will result in significant cost savings to Lockheed Martin and its F-35 global supply network.
“The award spotlights a highly innovative process in the most innovative fighter production system ever devised,” said Mike Packer, Lockheed Martin vice president of Manufacturing Strategy & Processes. “This process increases production of right-first-time composite parts, using both MSI’s Ply Compensation™ System (PCS™) and Nikon Metrology’s Laser Radar technology.”
To read the full article on KTVN News, click the link below:
http://www.ktvn.com/Global/story.asp?S=12375549
For F-35 photos and videos, visit:
http://multivu.prnewswire.com/player/42215-lockheed-martin-f-35/
SOURCE Lockheed Martin Aeronautics Company
1 Comment | General Buzz, Nikon Metrology, Press Release | Tagged: BAE Systems, Composite parts, composites manufacturing, cured laminate compensation, F-35, F-35 Lightning II stealth fighter, F-35 stealth fighter, F135, F136, GE Rolls Royce, innovation, JEC, JEC innovation award, JEC show, Laser Radar, Lockheed Martin, Magestic Systems, Magestic Systems Inc., Metris, metrology assisted production, Mike Packer, new technology, Nikon Metrology, Northrop Grumman, ply compensation system, Pratt & Whitney, wing skins | Permalink
Posted by Metrology Solutions Provider
April 1, 2010
New Company Combines Nikon Industrial Instruments Business with Former Metris Business to Create Nikon Metrology, Inc.
BRIGHTON, MI – April 1, 2010 – Nikon today announced that it has formed Nikon Metrology, Inc., a new company that combines Nikon Instruments Inc.’s industrial instruments business with the former Metris business, acquired by Nikon Corp. in 2009. Nikon Metrology, Inc., headquartered in Brighton, Mich., will focus specifically on the industrial and manufacturing business markets for precision measuring and industrial microscopy.
“The formation of Nikon Metrology, Inc. strengthens Nikon’s commitment to the industrial marketplace and offers a renewed focus on the company’s industrial business,” says Myles Richard, Managing Director, Nikon Metrology, Inc. “This new company brings greater product offerings to the market while continuing Nikon’s tradition of top-quality customer service.”
For industrial customers who purchase or already own Nikon products, sales and support will be handled through the new Brighton office. Customer service can be reached through its new general number at 810-220-4360 or via email at Sales-Americas@nikonmetrology.com. Customers can also find more information online at www.nikonmetrology.com or www.nikoninstruments.com.
ABOUT NIKON METROLOGY, INC.
Nikon Metrology offers the most complete and innovative metrology product portfolio, including state-of-the-art vision measuring instruments complemented with optical inspection and mechanical 3D metrology solutions. These reliable and innovative products respond to the advanced inspection requirements of manufacturers active in consumer, automotive, aerospace, electronics, medical and other industries. For more information, visit www.nikonmetrology.com. Product-related inquiries may be directed to Nikon Metrology, Inc. at 810-220-4360 or Sales-Americas@NikonMetrology.com.
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