Nikon Metrology

Configurable CT | Everything starts at the source

Computed tomography, Metrology CT, Nikon Metrology, X-ray and CT Inspection

Multiple sources & infinite possibilities with configurable CT

Nikon Metrology microfocus sources offer unmatched versatility for objects big and small. Featuring a wide range of spot sizes and power ratings, these open-tube sources are fully configurable and interchangeable to accommodate a wide range of density and material requirements. Expect precise measurements and stunning spatial resolution with every scan.

 

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Microfocus accuracy for a broad spectrum of materials.

Nikon Metrology’s configurable CT systems are optimized for high accuracy CT inspection of different materials, such as metals, composites, plastics and rock. The ultra-robust structure, microfocus sources and high resolution detectors are perfectly matched to deliver high image fidelity with micron accuracy.

Stunning image clarity

To reduce undesired scatter and noise when scanning dense samples, Nikon Metrology’s Curved Linear Diode Array (CLDA) technology optimizes the collection of X-rays traveling through objects and cuts down on scattered X-rays. Each CLDA crystal is positioned parallel to the X-ray beam for optimum efficiency, unbelievable image contrast and reduced scan time. Like a carefully selected camera filter, the CLDA eliminates scatter pollution and results in an image worth framing.

The world’s only 450 kV high brilliance microfocus source

The 450 kV microfocus source combines continuous power with stunning resolution. This source features an 80 μm spot size and incredible spatial resolution for faster CT scanning, faster data collection and the highest accuracy and precision available. Perfect for high-density objects – never miss a detail with the 450 kV microfocus source.

 

Nikon Metrology introduces its configurable X-ray/CT systems

(Click on the associated image to learn more about each inspection system.)

configurable ct

M1 configurable X-Ray/CT inspection system

M1 configurable X-Ray/CT inspection system

The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of sample setup.

Supporting sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with flat-panel detector technology and Nikon micro focus sources.

 

 

Configurable ct

M2 high-precision X-ray CT inspection system

M2 high-precision X-ray CT inspection system

The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator.

Supporting dual sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Diode Array (CLDA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

 

Configurable CT

C2 Extra large-envelope X-ray/CT inspection system

C2 Extra large-envelope X-ray/CT inspection system

The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.

Supporting dual sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

 

 


 

Interested in learning more about Nikon Metrology’s configurable X-ray/CT systems?

Click the link below to download the CT Versatility brochure now, or head over to the website here.

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