December 9, 2010
Nikon Metrology offers a complete range of examination and measurement services for the inspection of medical devices and components. These include microscopy, manual metrology, automated non-contact video measuring, non-contact geometry inspection, X-ray radiography and computed tomography.

Accurate inspection of small medical components
With medical devices, failure is not an option. Reproducible examination and measurement of key components and specified tolerances play a key role in ensuring the reliable and repeatable performance needed for items such as simple, single-use catheters right through to the most advanced drug delivery systems. In order to avoid the rejection of rogue batches, examination and measurement methods also need to be able to verify the quality of purchased materials prior to release from inventory, and provide a complete audit trail for regulatory purposes.
Microscopy examination of medical devices
Microscopy is a key tool in the examination of medical devices and components as it provides the means to produce the high-contrast images needed to spot small imperfections on and below the surface of samples such as catheters and surgical blades. It can also prove beneficial in examining failures, to assess whether they are due to a manufacturing error or misuse.
Manual metrology for medical device quality control
Manual metrology provides an accurate means to assess prototypes, check the performance of new injection-molding tools and perform lower-volume quality control checks.
Automated non-contact video measuring of medical components
Automated non-contact video measuring allows multiple measurements to be reliably made on large numbers of small and complex components at a rate that can keep pace with demanding production schedules. With the correct illumination settings, and repeatable and reproducible edge detection, even the edges on dark and clear parts can be correctly refracted, detected and reproducibly measured. Non-contact video measurement can also be used to compare CAD versus actual data and perform real-time SPC.
Non-contact geometry inspection of medical components
For some components, like knee, hip or dental implants and hearing aids, the as-built shape of the component is crucial for fast patient recovery and maximum comfort. State-of-the art digital laser scanners create high-accuracy, high-density 3D digital copies of the part with a minimum of effort. These point clouds can be used for the inspection of the surface geometry.
Color diagrams instantly highlight deviations and facilitate the communication with the production department. Alternatively, these copies can be used to create CAD surface models from components that have been tuned manually or where no CAD file is available.
X-ray radiography and computed tomography for inspection of complex medical devices
Medical devices are highly complex components where critical parts can’t be reached by touch probes or seen by video and laser systems; think about the dimensions of an inhaler chamber or any other drug delivery system. Of course, you want to be sure that all components in a pacemaker are connected properly before it is implanted.
In this case X-ray radiography and computed tomography (CT) is the ideal solution. CT is a non-destructive technique that creates full 3D copies of the test specimen that not only allows dimensional inspection but also fault detection, failure analysis and the assembly inspection of complex mechanisms.
Nikon Metrology offers a wide range of CT solutions that all feature in-house-built X-ray sources that give very sharp, high-resolution images. Real-time radiography enables interactive visual inspection, but automation capabilities are available for the inspection of larger batches.
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CMM Laser Scanning, Microscopes, Nikon Metrology, Optical Scanning, X-ray and CT Inspection | Tagged: 3D digital copy, assembly inspection, automated non-contact video measurement, CAD, CAD models, CT, digital laser scanners, dimensional inspection, drug delivery system, edge detection, failure analysis, fault detection, iNexiv, injection-molding tools, inspect surgical blades, manual metrology, measurement, medical components, medical devices, medical inspection, microscopes, microscopy, NEXIV, Nikon Instruments, Nikon Metrology, non-contact geometry inspection, part deviation, point cloud, quality control, radiography, SPC, surface geometry, x-ray |
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November 22, 2010
Nikon Metrology, Inc. Announces Opening of New Western Regional Sales Office in Irvine, California

Nikon Metrology Grand Opening in Irvine, California
Nikon Metrology, Inc. just announced the opening of its new Western regional sales office in Irvine, California. The facility will serve as a sales and demonstration center for current and potential Nikon Metrology customers in California, Arizona, New Mexico, Utah, Colorado, Nevada, Idaho, Wyoming, and Texas.
“We are always looking for ways to support our customers’ needs, and this new regional sales office exemplifies these efforts,” says Robert Wasilesky, senior vice president of sales and marketing, for Nikon Metrology, Inc. “It’s exciting to open this facility for our West Coast customers and ensure we are providing them the top level of service possible.”
A celebration for the grand opening of the facility was held October 20-21, 2010 with a ribbon cutting ceremony and a catered lunch. Nikon Metrology technical experts demonstrated a wide range of different products from the company’s diverse product line, including coordinate measuring machines, laser scanners, and vision measuring systems.
The office will be home to nearly a dozen Nikon Metrology employees who will provide customer support and sales demonstrations for customers.
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Events, General Buzz, Nikon Metrology, Press Release | Tagged: Bob Wasilesky, California, Coordinate Measuring Machines, Grand Opening, iNexiv, Irvine California, Laser Scanners, microscopes, NEXIV, Nikon Metrology, ribbon cutting ceremony, Robert Wasilesky, vision measuring machines, vision measuring systems, vision systems, Western Regional Sales Office |
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November 8, 2010

The new MM-200 measuring microscope from Nikon Metrology is specially designed for engineers, inspectors and operators, who require highly accurate measurements for precision parts. Offering economies in size, weight and price, this compact product also offers precision and accuracy for measuring a variety of metal, plastic and electronic parts in all industries, especially the automotive and electronics industries. Its space-saving and lightweight design allows the MM-200 to be used on the shop floor and inspection rooms alike.
Precise and easy-to-use, the MM-200 enables quick and accurate non-contact optical measurement. An integrated stage reduces the MM-200 footprint by 50%, while offering the same stage-travelling accuracy as the current high quality MM400/800 series. The MM-200’s economic, compact and lightweight design makes it ideal for machine tool shops and inspection rooms. The MM-200 is suitable for a wide variety of parts including: small-size die and molds, drill bits, inserts, fine pitch connectors, medical devices, watch parts, gears and optical fiber parts.
A dedicated monocular optical head for the MM-200 is available for immediate measurement on the eyepiece on the production line, while a C-mount video head provides easy video monitoring. XY stage scale readout, illumination control and communication ports to external devices such as a PC or digital readout unit are operated via a control interface unit. Long-life, environmentally friendly, high-intensity white LED light sources are used for all illumination. Nikon’s DS-2Mv camera and E-Max software packages provide semi-automated measurement, guiding easy geometric dimensioning and tolerancing. The E-Max DS-V system allows easy- to-use advanced video edge-detection technologies. New digital templates for concentric patterns, threads and involute gear teeth with different modules, made from 2D CAD data, enable quick go/no-go comparison inspection as well as digital image archiving.
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Microscopes, Nikon Metrology | Tagged: E-Max software, edge detection, electronic part measurement, GD&T, gear inspection, geometric dimensioning and tolerancing, go/no-go, inspection, inspection rooms, machine tool shops, Measuring Microscope, medical device inspection, microscopes, MM-200, MM-400, MM-800, Nikon Instruments, Nikon Metrology, non-contact measurement, optical fiber inspection, optical measurement, precision parts, semi-automated measurement, shop floor |
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October 22, 2010
LOCATION:
GE Van Wert Company, Inc.
461 Boston Street, Suite B4
Topsfield, MA 01983



Experience metrology solutions first-hand as our experts provide product demonstrations and technical expertise regarding your most difficult applications. Products displayed will be microscopes, video measuring systems, optical CMMs, portable arms, and handheld scanners.
Refreshments Provided
Tuesday & Wednesday, October 26th & 27th | 9:00am-4:00pm
Please RSVP by October 22nd by contacting Eric Pearsall at (978) 887-3389 or email GEVanWert@aol.com.
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Events, General Buzz, Nikon Metrology | Tagged: GE Van Wert Company, iNexiv, microscopes, Nikon, Nikon Metrology, optical CMM, portable arms |
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October 21, 2010
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Events, General Buzz, Nikon Metrology | Tagged: Elgin, Illinois, iNexiv, K-Scan, microscopes, Nikon, Nikon Metrology, optical CMM, portable arms, Technology Event, vision measuring systems |
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October 13, 2010

Design of food packaging films has become increasingly complex in recent years. Most films consist of layers laminated together, each designed to act as a barrier to oxygen, moisture and other external influences that can cause the food to spoil. Individual layers may be aluminum foil, plastic film or even metallized plastic. Each layer must be a specific thickness – too thin and it will fail to protect the contents of the package, too thick and material will be wasted, increasing the cost of the package. As design and manufacturing requirements for these films have become more intricate, the need for faster, more accurate and more highly automated inspection of layered laminates has also increased.
System Challenge:
Manual methods of inspection are limited in their ability to:
• Maintain operator comfort during prolonged periods of use
• Image individual layers
• Accommodate larger sample holders
• Achieve high throughput
Nikon’s Solution:
NIS-Elements D Software
• Wide variety of CFI60 lenses with different magnifications for different films
• Large maximum specimen thickness capacity to accommodate tall sample holders
• High resolution Nikon digital camera with NIS-Elements D to isolate individual layers
• Elements software allowing creation of macros for repetitive measurements
• Ability to capture images to document the various film layers
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Microscopes, Nikon Metrology | Tagged: automated inspection, food packaging, food packaging design, food packaging films, food packaging inspection, inspection, layered laminates, LV-UDM, microscopes, Nikon Metrology, NIS-Elements D software |
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October 12, 2010
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Events, General Buzz, Nikon Metrology | Tagged: iNexiv, MD&M Minneapolis, Medical Design show, microscopes, MM-200, Nikon, Nikon Instruments, SMZ745T, vision measuring systems |
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September 24, 2010
Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, handheld laser line probes, X-ray and Computed Tomography (CT), Optical CNC measuring systems, measuring microscopes, Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering. Our systems are employed in aerospace, automotive and other manufacturing industries.
To learn more about Nikon Metrology, watch our company video:

Click here to contact us for more information.
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General Buzz, Nikon Metrology | Tagged: CMM Scanners, CMMs, Handheld scanners, iGPS, large-scale metrology, Laser Radar, Laser Scanners, Metris, microscopes, Nikon, Nikon Metrology, Optical CMMs, robotics, software, video measuring systems |
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September 13, 2010
Nikon Metrology, Inc. announced today the release of its new ShuttlePix P-400R Digital Microscope, made for inspection, observation, simple measurement and recording of high-resolution images. For on-site analysis of samples, it serves as a handheld microscope that shoots high-resolution images as quickly and easily as taking pictures with a digital camera. For stationary use, the ShuttlePix microscope interfaces seamlessly with a motorized stand. With the equipped 17-inch touchscreen monitor, the user can easily control, display, measure or print images. The microscope also connects to a standard PC or laptop running dedicated 3D image reconstruction software.
“The versatility of the ShuttlePix system means the user can bring the microscope to large samples, such as an aircraft frame, turbine casting or pipe work that often cannot be reached with a standard microscope,” says Bob Wasilesky, Senior Vice President, Nikon Metrology Inc. “The unique ShuttlePix technology supports a wide range of inspection tasks in automotive, electronics, aerospace and other industries. In combination with its imaging capabilities, it’s a very versatile, extremely useful piece of equipment.”
![19_withdoorim[1]](http://metrisusa.files.wordpress.com/2010/09/19_withdoorim1.jpg?w=300&h=199)
The ShuttlePix addresses the market need for an easy-to-use device that magnifies samples and can record and save images as digital files. Nikon combined its technological excellence in optical technology with its expertise in digital image processing technology to enable the creation of the ShuttlePix.
The stand is equipped with a motorized Z, which does not require a PC for control. Operation of the stand is simple, allowing extended depth of focus (EDF) image capture with the touch of a button.
ShuttlePix offers a 20x zoom with a magnification range of 20x– 400x on a 17-inch monitor, which is double that of competitors’ models. For optimal lighting, the zoom head has built-in 4 section LED ring illumination. The ShuttlePix will be exhibited September 13 – 18 at IMTS 2010 in Chicago, and will become available in December 2010.
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Microscopes, Nikon Metrology, Press Release | Tagged: Bob Wasilesky, microscopes, Nikon, Nikon Instruments, Nikon Metrology, ShuttlePix, ShuttlePix P-400R Digital Microscope |
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August 9, 2010
When it comes to surface engineering, competition in the automotive industry is high. From the initial design of components to full-scale manufacturing and inspection, rigorous standards must be kept for the consistent, high quality production of all machined parts. International pressures for more economical and fuel efficient designs have also furthered the need for low-wear and better fitting components that can help to improve performance and reduce the overall environmental impact of every vehicle. Adhering to such high standards of production not only increases the longevity of components, it protects the reputation of the manufacturer that builds them.
To verify the alignment, surface quality, dimensional profile and functional qualities of machined parts, automotive manufacturers must rely on a wide variety of microscopy techniques. These can include such fundamentals as stereomicroscopy and the use of inverted microscopes to more complex analytical instruments such video measuring systems, dedicated metrology microscopes and polarized light microscopy. These can each be employed to assess the key functional parameters of components including:
• camshaft and crankshafts bearings
• fuel injectors and injection nozzles
• plastic moldings
• cylinder surfaces
• brake disks
• transmission components
• pistons, pins and rings
• connecting rods
Ensuring the accurate manufacture of parts can extend their operational lifetime and allow for more economical, production-oriented manufacture, which, in the end, can improve quality while improving bottom lines.
To read more, click here.
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Microscopes, Nikon Metrology | Tagged: automotive manufacturing, improve performance, inspection, inverted microscopes, manufacturing, microscopes, Nikon Metrology, polarized light microscopy, stereomicroscopy, surface engineering, transmission components, video measuring systems |
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June 8, 2010
At the MD&M East show this year, Nikon Metrology – Booth #1672, will feature the most complete and innovative metrology product portfolio, including:
We hope to see you at the show!
Contact us today to set up a demo at the show.
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Events, General Buzz, Microscopes, Nikon Metrology, X-ray and CT Inspection | Tagged: ct inspection, iNexiv, MD&M East, microscopes, MM-200, Nikon, SMZ745T, x-ray |
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May 25, 2010
At Eastec this year, Nikon Metrology – Booth #3233, will feature the most complete and innovative metrology product portfolio, including:
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The iNEXIV Multi-Sensor Measuring System, a high-speed, fully-automated benchtop metrology and imaging system ideal for measuring dimensional features. |
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The K-Series Optical CMM, a portable and highly accurate optical motion measurement system suitable for measuring the 3D positions of multiple targets in space. |
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The MM-200 Measuring Microscope, a powerful toolmakers microscope ideal for measuring a variety of metal, plastic and electronic parts. |
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The SMZ745 Digital Stereomicroscope System, a trinocular stereoscopic microscope ideally suited for observation and digital imaging. Featuring an impressive 7.5x zoom range. |
We hope to see you at the show!
Contact us today to set up a demo at the show.
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Events, General Buzz, Nikon Metrology | Tagged: Eastec, iNexiv, K-Scan, K-Series, K600, Measuring Microscope, Metris, microscopes, MM-200, Nikon, Nikon Metrology, optical CMM, scanning products, SMZ745T, Stereomicroscope system, vision measuring system |
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May 14, 2010
Nikon Small World Photomicrography Competition. For 36 years, the competition has featured some of the most esteemed names in science and science journalism on its judging panel, and this year is no exception. Since its founding in 1974, Nikon Small World has seen consistent growth due in part to the amazing image submissions and the distinguished judges who have offered their insight to the contest.

Arabidopsis thaliana (thale cress) anther (10x) - 1st place, 2009
The judges for the 2010 Nikon Small World Photomicrography Competition are:
- Jeremy Kaplan, Science & Technology Editor, FoxNews.com
- Betsy Mason, Science Editor, Wired.com
- Alison J. North, Ph.D., Director of the Bio-Imaging Resource Center and Assistant Professor, Rockefeller University
- Shirley A. Owens, Ph.D., Retired Director of the Confocal Lab in the Center for Advanced Microscopy, Michigan State University

Sonchus asper (spiny sowthistle) flower stem (150x) - 2nd place, 2009
Nikon Small World recognizes the world’s best photomicrographers who are making key contributions to life sciences, bio-research and industrial science, while also demonstrating acute comprehension of the pleasing aesthetics when science and art come together. The competition is the preeminent forum for showcasing the beauty and complexity of life as seen through the light microscope and over the years has received international recognition in the science community, among art and photography lovers, and in the media.
Winners of the Nikon Small World Competition will be announced in October. For additional information, please visit www.nikonsmallworld.com, or follow the conversation on Facebook and Twitter @NikonSmallWorld.
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Events, General Buzz, Microscopes, Nikon Metrology, Press Release | Tagged: Alison J. North, Betsy Mason, Jeremy Kaplan, microscopes, Nikon, Nikon Instruments, Nikon Metrology, photography, photomicrographers, photomicrography, Shirley A. Owens, small world competition |
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May 13, 2010

OrthoTec is a new conference this year hosted by Canon Communications, the world’s leading exposition organizer. OrthoTec is a dedicated exposition and conference for orthopaedic manufacturers.
Nikon Metrology is exhibiting at the conference this year featuring a product line that is prominent in the medical field including the iNexiv TP, the MM200V/Emax, and the SMZ-745T/DS-Vi1.
Come visit us at booth #120

Nikon Metrology Booth #120 at OrthoTec 2010
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Events, General Buzz, Microscopes, Nikon Metrology | Tagged: Exhibition, iNexiv, Metris, microscopes, MM200, Nikon, Nikon Events, Nikon Instruments, Nikon Metrology, Orthopeadic conference, OrthoTec, SMZ745T |
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May 11, 2010

At the international 2010 Control trade fair for quality assurance, Nikon Metrology introduced the broadest range of non-contact metrology solutions for applications ranging from miniature electronics to large aircraft.
Metrology solutions shown at the booth included X-ray and CT systems, coordinate measuring machines, 3D laser scanners, vision inspection systems, automation and adaptive control technology, and metrology software.
The XT H 225 shown here offers powerful X-ray sources, a large inspection volume, and high X-ray and CT imaging resolution, perfect for detailed measurement of internal component and assembly features.
XT H systems are available with 225kV with optional rotating target and suit a wide range of applications, including inspection of small castings, and plastic parts as well as material research.
Adaptive Robot Control introduces full 6D closed loop feedback for industrial robots. Whether the robot is used for machining, inspection, applying beads or manipulating objects, roboting tasks are now executed with 0.1mm absolute accuracy, irrespective of degrading phenomena like play, mechanical Flexibility, backlash or thermal behavior.
Nikon Metrology is a world leader in the development and manufacture of optical and digital imaging technology for biomedical and industrial applications. Nikon provides complete optical systems that offer optimal versatility, performance and productivity. Cutting-edge instruments include microscopes, precision measuring equipment, digital imaging products and software.
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Coordinate Measuring Machines, Microscopes, Nikon Metrology, X-ray and CT Inspection | Tagged: 3D laser scanners, adaptive robot control, automation, CMM, Control 2010, Control show, Coordinate Measuring Machines, CT, industrial robots, Kuka robot, measuring equipment, Metrology, metrology software, microscopes, Stuttgart, vision inspection, x-ray, XT H 225 |
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