Nikon Metrology exhibits at Medical Design and Manufacturing Minneapolis this week!

November 2, 2011

Visit Nikon Metrology at Booth #1241 on November 2-3. Nikon will be featuring their line of vision systems and microscopes. Visit http://us.nikonmetrology.com/ for more details.

Medical Design & Manufacturing (MD&M) Minneapolis is the most comprehensive resource for every aspect of medical device development. It gathers medtech professionals and leading medical OEM suppliers together to provide you with immediate hands-on access to the tools you need to accelerate your new device to market, all in one convenient location. Visit the website!

Register today!


Nikon Metrology creates dedicated YouTube Channel for product videos

October 31, 2011

Click here to view Nikon Metrology’s very own YouTube Channel where you can find company movies and product videos for your educational convenience. Don’t forget to subscribe to this channel to receive future updates. It’s just one more resource for all your metrology needs.

Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, handheld laser line probes, X-ray and Computed Tomography (CT), Optical CNC measuring systems, measuring microscopes, Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering. Our systems are employed in aerospace, automotive and other manufacturing industries.

Check out our website!


Nikon Metrology Celebrates Grand Opening of Newly Renovated Technology Center

October 24, 2011

BRIGHTON, MI. – October 18, 2011 Nikon Metrology. Inc. (NMI) – More than 100 Metrology and Manufacturing Professionals gathered to visit the new Nikon Metrology, Inc. Technology Center, located at their Headquarters for the Americas in Brighton, Michigan.  The purpose of the event was to introduce one of the most advanced technology centers in Livingston County, Michigan, a sentiment echoed by Brighton Mayor Ricci Bandkau, who was on-hand to cut the ribbon, opening the Technology Center.  Also present was Gary Vasilash, Editor-in-Chief of Automotive Design and Production, who keynoted with a state of the Automotive Industry.  The Theme of “Advances in Industrial Metrology” was evident in the number of new and updated products on display.  These included the HN-6060, Nikon Metrology’s leading Multi-Sensor Metrology System; BW-H501 3D Surface Profiler; MMDx Laser Scanners featuring increased speed of operation; and the ShuttlePix portable, digital Microscope, among many others.  Product demonstrations and Technology overviews were held throughout the day, along with customer presentations from Arizona State University and Joe Gibbs Racing.

Also on display was a range of products highlighting:

Traditional measuring systems
Bridge CMM
Horizontal arm CMM
Articulated arms
Optical CMMs
Camio software
CMM-Manager

Large scale metrology
Laser Radar
iSpace /iGPS
Gantry CMM

Laser scanning
CMM scanning
Handheld scanning
Walkaround scanning
Robotized scanning
Pointcloud software

X-ray /CT
Electronics X-ray inspection
Computed Tomography
CT inspection of turbine blades

Vision based systems
Industrial Microscopes
Measuring microscopes
Scanning electron microscopes
CNC Vision systems
Semiconductor inspection
Optical comparators
Autocollimators
Digital height gages
Vision measuring software

For more information, please visit http://www.nikonmetrology.com or call 810-220-4360.


necsa opens up South African research opportunities with microfocus Nikon Metrology x-ray and CT system

September 6, 2011

A brand new Nikon Metrology inspection system is now in use at the microfocus X-ray radiography/tomography facility (MIXRAD) of the South African Nuclear Energy Corporation (Necsa). It is the first high-precision microfocus X-ray/CT system made available to South African researchers, engineers and students who can use this advanced technology free-of-charge. High-precision 2D radiography and 3D tomography renderings help them investigate diverse natural and industrial samples in a non-destructive fashion. With the microfocus X-ray/CT system readily available and upgraded Neutron and new Gamma radiation radiography/tomography laboratories underway, Necsa offers the edge in non-destructive inspection on micron level. These investments greatly advance research on mineral deposits in South Africa, or help motivate the application for beam time at nano-level Synchrotron facilities abroad if needed.

One system characterizing many different samples

Necsa recently took delivery of a new 225kV microfocus X-ray/CT system from Nikon Metrology. The instrument has been acquired through South Africa’s National Research Fund – Research Infrastructure Support Programme (NRF-RISP). “Our new system helps academic and industrial researchers in South Africa study mineral deposit samples and advance paleontology, archaeology, geology, biology, energy as well as numerous industrial applications including mechanical and chemical engineering,” says Frikkie de Beer, Necsa’s radiography/tomography chief scientist. “Making complementary advanced imaging methods accessible triggers more active cooperation with universities, research institutions and companies in South Africa and abroad.”

The Nikon Metrology system allows users to literally navigate through the 3D volumes of their samples. Pinpoint sharp magnified 3D volume renderings make the difference in evaluating internal surfaces, material densities and other valuable material characteristics that otherwise remain invisible. It is also possible to calculate the volumetric fraction and size distribution for any specific mineral material found in the sample.

Developing high-level research expertise

The application reach of researchers and scientists using the system is impressive. To suit different user requirements, the Nikon Metrology XT H system can be adapted to characterize samples of different size, material and weight. For future upgrade of the current system delivered to Necsa, Nikon Metrology offers the quite unique capability of the system to have the X-ray source equipped with a rotating reflection target. This X-ray source setup provides much better cooling performance, allowing increased X-ray flux to be generated in order to penetrate larger or denser samples.

Using the same electron beam, the machine can be set up to produce small focal spot sizes, such as spot sizes between 3 and 5 micron for reflection targets (as delivered to Necsa), 10 micron on rotating targets and 1 micron on transmission targets (two options considered by Necsa). This enables researchers to detect inclusions, voids or material properties in resolution of about the spot size, highlighting the machine’s versatility.

The microfocus X-ray instrument in the MIXRAD facility places South African capabilities on par with international standards,” De Beer concludes. “The South African research community benefits from this by developing high-level research expertise and changing the country’s socio-economic situation.”

A geology sample CT slice highlighting 2 types of mineral deposits (pseudo-colored), each measuring approximately 20 micron.

 

 

 

 

 

 

 

 

 

Necsa instrument scientists posing in front of the Nikon Metrology microfocus X-ray and CT inspection system. Back: Mr. Lunga Bam, Mr. Robert Nshimirimana, Mr. Evens Moraba, Mr. Jacob Radebe and Mr. Frikkie de Beer (Section Head). Front: Mr. Paul Keanly (Nikon Representative) and Mr. Kobus Hoffman.

 


Search Your Engines: NASCAR Engineers Zoom In on Motor Problems with Powerful Microscope

August 12, 2011

Article written by Larry Greenemeier

Joe Gibbs Racing is using a powerful Nikon microscope to help solve the mystery of engine failures that have cost the team several races.

Sunday’s NASCAR race was bittersweet for Joe Gibbs Racing (JGR). After dominating the early part of the 200-lap Good Sam RV Insurance 500 at Pennsylvania’s Pocono Raceway, only one of JGR’s drivers—Kyle Busch—managed to finish in the top 10, thanks to a long rain delay and problems in the pits. Yet even more important than Busch’s second-place finish (and the 15th- and 26th-place finishes of teammates Denny Hamlin and Joey Logano, respectively) was the absence of engine problems that have plagued JGR all season.

ZOOMING IN ON THE PROBLEM: JGR engineers used a Nikon AZ100 microscope to capture and analyze images of failed rocker arms. These arms, designed to help the cars accelerate to high speeds without damaging the engine, were experiencing excessive wear and tear even though they were coated with lubricant to prevent just that type of problem.

NASCAR racers cover hundreds of kilometers at any given event at speeds at times exceeding 300 kilometers per hour. Tires, suspension and hundreds of other components must work together flawlessly to keep a driver in contention, but without an engine reliably delivering upward of 700 horsepower, that driver will struggle to keep up with the pack. Whereas many problems can be addressed in the pit area during a race, major engine failure—the result of a cracked engine block, broken valve, damaged piston or any of a dozen other causes—is not one of them. Once the race starts a “blown” engine cannot be replaced, although a problematic engine may be replaced prior to a race.

Hamlin, ranked 11th in the NASCAR standings this year going into this weekend’s race, has had to swap out engines before two of his past three races, including the Brickyard 400 in late July. JGR, which won more  Sprint Cup races last season than any other, has experienced nine engine failures so far this season prior to races. In the past two seasons, bad engines have cost the team five DNFs (did not finish). These problems put the team’s engineers on the spot to diagnose the issue and devise a solution.

With the season well past the halfway point, JGR engineers are hoping upgrades in their lab have helped them turn the corner. Foremost among the new equipment is a high-power Nikon AZ100 Multizoom microscope more likely to be used by scientists to examine biological specimens than by mechanics conducting forensic investigations of car engines and other equipment.

Following an engine failure, JGR engineers thoroughly examine the motor’s major internal components—this could be a lifter, a piston or any number of small parts. Precise engineering is crucial to performing well in NASCAR races. “This has been a particularly challenging year as no two failures have been related,” JGR Quality Control Engineer Richard Miller says.

In 2010 JGR engineers built 322 motors at $80,000 a piece. “Our target is plus or minus two horsepower at 875 horsepower, and last year we hit it every time but twice,” says Mark Bringle, JGR technical sponsor manager. “We’re getting 875 horsepower out of 358-cubic-inch motors. If you know anything about motors, that’s not supposed to happen. There’s really, really violent conditions taking place inside these motors so not only do we look at the parts before assembly, we also look at the parts under a microscope after assembly for stress, cracks and things like that.”

To provide some context, a 2012 Chevy Corvette with a 6.2-liter V-8 engine delivers about 430 horsepower. Your, ahem, “friend’s” Chrysler Town and Country V-6 minivan gets about 280 horsepower, whereas your neighbor’s four-cylinder Toyota Prius maxes out at about 135 horsepower.

JGR began using the Nikon microscope early last season to diagnose problems with their engines’ rocker arms, which are reciprocating levers that convey radial movement from the camshaft into linear movement. These arms, designed to help the cars accelerate to high speeds without damaging the engine, were experiencing excessive wear and tear even though they were coated with lubricant to prevent just that type of problem.

After being contacted by the racing team, Nikon shipped JGR an AZ100, which combines the wide-field-of-view advantages of a stereoscopic zoom microscope (from 5x to 400x) with those of a metallographic microscope typically used by materials scientists. JGR engineers used the microscope, with its high-resolution lens and the digital imaging system, to capture and analyze images of failed rocker arms. Through video conferencing and image sharing with the manufacturer of the rocker arms, it took the two groups only 90 minutes to determine that “inclusion and discoloration in the coating were responsible for the rocker arms’ damage—and that the excessive stress and heat placed on these parts were not being properly deflected,” according to Nikon.

Since then, JGR engineers have used the microscope to zoom in on other problem areas in engines, take digital snapshots and send them to parts-makers. Previously, JGR had used a crude microscope that could not take photos, which meant engineers had to describe what they were seeing to engine part–makers. Most car owners, NASCAR or otherwise, can relate to this: “That was the problem. When you’re trying to describe something to someone as abnormal, it’s very difficult a lot of times to describe,” Bringle says.

This season, the AZ100 has been instrumental in helping JGR diagnose issues related to valve-train components, among others. “We were able to very quickly identify an issue with our valve springs and with [the] coating on our valve stems,” Miller says. “As you can imagine, the quicker we can identify an issue, the quicker we can implement a corrective action internally and convey our findings to the vendor.”

JGR attributes this fast turnaround to helping the team stay in contention this year, despite its engine issues. The team’s next shot to test its progress comes at this weekend’s race in Watkins Glen, N.Y.

Visit www.scientificamerican.com to read similar articles.

Visit www.nikonmetrology.com to learn more about Nikon Metrology Microscopes.


Nikon Metrology Exhibits at CMSC 2011

July 25, 2011

Nikon Metrology is living large at CMSC 2011 – Booth #708

July 25-29th

Arizona Biltmore Hotel & Spa, Phoenix, AZ

At this year’s premiere metrology conference, Nikon Metrology is showcasing our large-scale products, including the hot, new G3 MV330/350 Laser Radar, the extremely versatile Optical CMM with MMDx Handheld Scanner and our revolutionary Digital Microscope ShuttlePix -400R.

These large-scale products bring your applications down to size – a productive, manageable size.  Stop by the booth to see just how we do it!  Technical experts are manning the booth to answer your questions and demo these large-scale products just for you. Stop by Booth #708 to experience 3D metrology at its best, brought to you from Nikon Metrology!

MV330/350 Laser Radar

Optical CMM w/MMDx Scanner

Digital Microscope ShuttlePix -400R
 

Not attending CMSC this year? That’s okay, just contact us at Marketing_US@NikonMetrology.com and we will set up a demonstration at your facility.


Nikon Metrology Exhibits at Semicon West 2011

July 11, 2011
     

 

 

 

 

 

When you visit Semicon West this year, be sure to stop by Nikon Metrology’s booth, #6146, and see the best that metrology has to offer.  You’ll be glad you did.  Featured products include: 

Nexiv VMA

NeoScope

L200N

X-Ray / CT Inspection

ShuttlePix

 

We hope to see you at the show!

Contact us today to set up a demo at the show.

Click here for your complimentary registration to SEMICON West 2011!  


Xtreme Scanning Webinar Archive – 062211 – Missed our Webinar? Watch it here……

June 24, 2011

Click on the arrows on the bottom right corner to enlarge screen. Click on the (HD) Icon at the top right for better resolution quality.

 

For more on 3D laser scanners Click here!


Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection

June 15, 2011

Geomagic® and Nikon Metrology have announced a new cooperative agreement that enables Nikon Metrology to fully integrate and offer its entire range of handheld 3D laser scanners with Geomagic Studio®, Geomagic Qualify™, and Geomagic Wrap®.

This partnership enables customers to seamlessly collect scan data directly from Nikon scanners into Geomagic Studio software for processing 3D polygon, surface and parametric models for reverse engineering, product design, rapid prototyping and analysis. Similarly, scan data is immediately passed to Geomagic Qualify to graphically and rapidly compare as-built parts with digital reference models for first-article inspection, production inspection and supplier quality management.

As a plug-in to Geomagic, the Nikon Metrology API manages point cloud acquisition by controlling all interaction between the new generation digital ModelMaker laser scanners and handheld localizer of choice. Highly accurate and reliable, it delivers control tools for the laser scanner, including scanner parameter modification or running of qualification routines. The resulting point cloud data is fed directly into Geomagic in real time, ready for processing into usable 3D data and models.

“This integration of Nikon Metrology data with Geomagic software products aligns with our belief that obtaining and using 3D data should be as easy and simple as possible,” said Tom Kurke, COO, Geomagic. “As part of our continuous efforts to integrate leading handheld point cloud digitizers, we see it as a big step forward that ModelMaker scanners can be interfaced with and directly controlled from within Geomagic.”

Jos Jans, Nikon Metrology Executive VP Marketing, adds that Geomagic software users now have direct access to the best digital laser scanning technology, offering high accuracy, fast data capture and automatic laser intensity adaptation to scan nearly all surfaces. “The plug-in offers design and manufacturing engineers fast-lane access to first-class laser scanners, while enjoying the convenience of the point cloud software environment they know inside out.”

Geomagic Wrap, Geomagic Studio and Geomagic Qualify are all available as 30-day free trial downloads. To register, visit www.geomagic.com. Geomagic, Geomagic Studio, Geomagic Qualify, Wrap and Geomagic Wrap are registered trademarks or trademarks of Geomagic Inc.  Other brand names, product names or trademarks belong to their respective holders.


Xtreme Scanning Webinar: LC60Dx and MMDx

June 8, 2011

 Find out how to improve your products using the next generation of CMM Laser Scanner Metrology

 Join us for a webinar on June 22nd!

 

 

We invite you to attend Nikon Metrology’s webinar, where you’ll witness the breadth of our product line, including:

• The latest advancements in CMM and Handheld Scanners
• The tremendous advantages of our MMDx and LC60Dx scanners
• Typical applications that benefit immensely from our scanners
• Online demos of our Focus Inspection Software, increasing productivity and improving results 

 

 

 

 

Sign up for this exclusive, but complimentary event!

Title: Xtreme Scanning: LC60Dx and MMDx – The next generation of Nikon Metrology’s laser scanners

Date: Wednesday, June 22, 2011

Time: 2:00 PM – 3:00 PM EDT

Meet your presenter:

Alex Lucas, Business Development Manager, Scanning Products

Bio

 

 

 

 

 

 

We hope to see you there!


Philips Lighting Turnhout pushes innovation using Nikon Metrology X-ray and CT

June 1, 2011

Radiography imaging and metrology drives research, quality, productivity and a reduced ecological footprint

Philips Lighting in Turnhout, Belgium, recently took delivery of a Nikon Metrology XT V system for X-ray and computer tomography (CT) inspection. Engineers investigate electrodes and other parts of high-intensity discharge (HID) lamp prototypes, to push the boundaries of lamp performance, lifespan and ecological material usage. They inspect lamps from every angle, and repeat the inspections on the same units after extended lighting periods. Deeper insight into the progression of glass corrosion, component wear and deposit formation allows Philips Lighting to reduce extensive life testing, thus saving tremendously on energy cost.

A tradition of X-ray inspection carried forward

The Philips Lighting business division produces billions of bulbs a year. Philips Lighting kicked off X-ray inspection in 2003 to support the design-through-manufacturing process of high-intensity discharge (HID) lamps. The multinational’s division in Turnhout, Belgium, manufactures long-lasting HID lamps from 20 to 4000 Watt offering high light output and premium light quality. These innovative illumination solutions raise comfort standards in offices, public buildings and factory halls; enhance traffic safety through street lights and passenger car headlights; and add entertainment value with splashing light shows toning up rock stars’ performances.

X-ray machine

Philips lighting decided to make X-ray and CT an integral part of its internal processes.

 

HID lamp

X-ray helps Philips Lighting to successfully respond to the tight electrode requirements imposed on HID lamp engineering.

“There is no doubt that X-ray inspection presents the best strategy to study the feasibility of new technologies, assemblies and materials and maintain high production quality,” says Chris Dries from Philips Innovative Applications in Turnhout. “For this reason we decided to further increase and sharpen our non-destructive testing (NDT) capability. To select a new system, we performed a thorough evaluation involving systems from most major X-ray and CT system vendors. Ultimately, the benchmark resulted in the purchase of a Nikon Metrology XT V 160 machine. We use the new system for critical measurement tasks and automated inspection jobs whereas the older system is still suitable for visual checks.”

Getting a grip on performance-critical aspects

The ability to literally look inside HID lamps is a great asset for Philips Lighting. X-rays penetrate the lamp and subsequently hit a 13×13-inch Varian flat panel, which generates radiography images with different shades of gray depending on material and geometry. On these translucent images, all the lamp’s constituent components are displayed in their entirety. The proprietary X-ray source incorporated into the system is equipped with a 1 micron transmission target. The XT V 160 is a high-precision imaging system that recognizes hidden features as tiny as 500nm, ideal for engineers to deduce structural, dimensional and connectivity related facts.

HID lamp electrodes are performance-critical components that undergo detailed X-ray research. Chris Dries explains that electrode characteristics influence the light the lamp produces by passing an electric arc through a compact tube filled with a high-pressure mixture of gases. “We measure the size and shape of electrodes contained in lamp prototypes as well as the distance between both electrodes. Inspect-X software allows us to automatically measure the distance between the electrodes’ tip planes. X-ray helps us a great deal in studying the way electrodes’ shape and structural characteristics evolve after every so many lighting hours. This is why Philips Lighting is able to successfully respond to the tight electrode requirements imposed on HID lamp engineering.”

Philips Lighting
NDT insight allows Philips toreduce the number of prototyping rounds and downscale life test activity.

 

Philips Lighting

X-ray proves technical facts that are indispensible in stretching the performance limits of lamps.

Chris Dries mentions that submicron image resolution provides great insight into other internal lamp phenomena, such as wall corrosion, glass frit, crazes and salt and mercury fillings. The XT V 160 system also supports the reconstruction of a CT volume, generated on the basis of hundreds of X-ray images. “By navigating CT volumes, we are able to locate and investigate crazes that may develop in ceramic discharge tubes. Similarly, we change position, angle and zoom as desired to take a close look at the otherwise invisible welds connecting electrodes with their supports. High image quality and magnification make it even possible to detect minuscule cavities in salt particles, something we were unable to do in the past.”

Automation and off-line inspection

To allow engineers to focus on their research and production work, most measuring tasks are delegated to system operators. They slide a tray with an array of lamps in the X-ray and CT system and start automatic data capture. The tray is indexed from one lamp to the next in order to subject all items to the same X-ray imaging routine. “Zoom level consistency and flux normalization maximize the repeatability of X-ray imaging, generating output that is truly operator independent,” says Dries. “This offers us the possibility to reliably set up macros for X-ray jobs that can run unattended at any time.”

All acquired imaging data can be sent to an offline station that runs Inspect-X software for inspection and macro preparation purposes. Engineers analyze X-ray graphics or navigate a CT volume to drill down on a particular detail, while having all relevant numerical information available at their fingertips. They value the fact that they can easily include X-ray shots and CT sections in their engineering reports.

Philips Lighting

Nearly all Olympic Game sports stadiums use Philips high-intensity discharge (HID) lamps.

 

CDM lamp

Philips Turnhout produces HID lamps from 20 to 4000 Watt offering high light output and premium light quality.

Philips Lighting benefits from decades of experience in X-ray and CT system design, development and production that is present at Nikon Metrology. In addition to high-quality imaging, the system’s proprietary open-tube X-ray source is almost maintenance free compared with conventional closed-tube microfocus sources. Nikon Metrology is renowned for controlling all aspects of the technology, and in the unlikely case of failure, service engineers come on site and solve the problem.

A resolute choice for extended NDT

“The Nikon Metrology system is part of a strategic decision of Philips Lighting to make X-ray and CT an integral part of internal processes,” says Dries. “Angled views in highest resolution prove technical facts that are indispensible in stretching the performance limits of HID lamps. Important in this regard is studying the use of environmentally friendly materials and their impact on light, yield and reliability. With the insight gained, the number of prototyping rounds can be reduced and life test activity can be downscaled to some extent, saving both time and money. The resulting decrease in power consumption also contributes to greener economics. By extending NDT capabilities, Philips Lighting underlines its position of leading innovator and supplier of high-quality illumination solutions.”

Visit www.nikonmetrology.com for details.


Nikon Metrology invites you to set up a demonstration at Rapid, OrthoTec or SAMPE this week

May 24, 2011

Nikon Metrology reaches out to customers all over the U.S. this week by exhibiting at the following three trade shows:

Nikon Metrology teams up with Magestic Systems, Inc. at the SAMPE conference in Long Beach, CA on May 24-26. Booth #350.

You will be able to see the Nikon Metrology G3 Laser Radar MV330 in action. Visit the booth and set up a demo!

 

 

 

 

 

 

 

 

Nikon Metrology exhibits at OrthoTec 2011 this year on May 24-25 in Warsaw, IN. Booth #T16.

Nikon Metrology will be featuring their extensive line of microscopes and video measuring systems. Visit the booth to set up a demo!

 

 

 

 

 

 

 

 

Nikon Metrology will also be exhibiting at Rapid 2011 in Minneapolis, MN this week from May 24-26. Booth #112

 

Nikon Metrology will be featuring the Portable CMM Arm with Reverse Engineering software capabilities at this show.  Learn more at www.nikonmetrology.com.


Nikon Metrology Exhibits at Eastec 2011

May 17, 2011
At Eastec this year, Nikon Metrology will feature the most complete and innovative metrology product portfolio, including:
 
 

The ShuttlePix P-400R is based on a new shuttle concept allowing much easier remote inspection for samples, an idea which originally was considered to be too difficult for large scale products. This will allow not only Industrial applications to be the target but also an effective solution for many other practical, imaging problems.

The iNEXIV VMA-2520 is a new multi-sensor measuring system that’s lightweight and compact enough to be used in the factory on the bench top, with fast, fully automatic and high accuracy features that make it ideally suited for a wide variety of industrial measuring, inspection and quality control applications.

 

K-Series cameras measure the position of infrared LEDs by means of linear CCD cameras. Through triangulation, the 3D position of each LED is calculated. 9 LEDs are built into the handheld SpaceProbe, an ergonomically designed device that enables an inspector to measure the actual 3D data of an inspection part in single point or scanning mode. The optical measuring CMMs are available in a portable and a mobile configuration.

 

The MCA II, Manual Coordinate measuring Arm, is a precise, reliable and comfortable portable measuring system available in a 6- or 7-axis version. It feels perfectly at home in the metrology lab as well as on the shop floor.

The MCA II can be equipped with a wide range of probing systems for laser scanning, touch trigger measurements and continuous scanning. Its flexibility makes this measurement arm the perfect partner for a wide range of measurement tasks.

For the latest in metrology, visit booth #3135 first!

Contact us today to set up a demo at the show.

Visit www.nikonmetrology.com for more details.


CMM inspection is faster and easier with CAMIO7

May 9, 2011

May 9, 2011 – Brighton, MI – CAMIO7 is a major software release in many ways. This multi-sensor CMM software now reflects the latest from Microsoft Windows, featuring the ribbon style toolbar. This serves as the central location where all software functions are logically grouped into tabbed sections, containing all required operations. This eliminates the need to search through long menu structures. For example, GD&T tolerances are located within the Inspect group so that feature output is always available.

The standard for CMM programming

CAMIO metrology software

CAMIO7 was developed with every user profile in mind. One important design criterion was to combine powerful functionalities with easy-to-use workflows. Users can select any combination of features to measure by using ‘teach and learn’ from the handbox, picking from a CAD model, or typing coordinates from the component drawing. CAMIO7 automatically programs the touch points for each feature.  However specific touch points can be defined if required.

CAMIO ribbon bar

Easy use to Windows 7 style ribbon toolbar

When highlighting a group of multiple features, their properties are automatically filtered down to allow global modifications to all the remaining common properties from within this group in a single operation. There is no faster way to modify the nominal coordinates, measurement mode, fitting algorithms or add GD&T tolerances, etc.

Offering true multi-sensor capability Laser scanning with CAMIO7 is now easier to use for feature inspection. The new software interface allows both feature related measurement and reporting to be defined together. Such improvements reduce programming time drastically, especially for more complex parts that exhibit hundreds of features.

 

CAMIO metrology software
Full graphical representation of the planned scanner over the surface 

For measuring surface areas, CAMIO7 users can simply cover the target area with a configurable grid to automatically define the measurement points. Also, CAMIO7 includes full support for laser scan area definition, making it possible to use the scan data for reverse engineering or surface analysis.  CAMIO7 offers true multi-sensor capability and simplified probe management to change between contact and non-contact probing within the same measurement program. In this way, the best CMM inspection routine for the application is achieved.

Comprehensive off-line programming capabilities

CAMIO7 planning provides the ability to open inspection plans either directly from CAD (Product Manufacturing Information) or a customer-specific format. The plan data can then be used to easily create a DMIS program including planned inspection routines and the application of GD&T tolerance data. In this regard, the software supports the latest versions of all popular CAD formats available.

To support the off-line programming environment, the software provides full machine simulation and collision detection. CAMIO7 creates true DMIS output without translation, which also makes it the ideal stand-alone solution to create programs to run in compatible 3rd party DMIS software including PC-DMIS and Metrology.

 
Making informed decisions faster with CAMIO7

CAMIO7 offers an integrated approach to the quality control process of CMM inspection. This true multi-sensor CMM metrology software supports traditional touch-trigger probes, continuous contact (or analog) scanning probes as well as the full range of Nikon Metrology laser probes. This way, CAMIO7 supports design and manufacturing teams to efficiently maintain control over production processes and to make informed decisions.

About Nikon Metrology


Nikon Metrology and JEOL team up to exhibit at SPIE Conference 2011

April 27, 2011

 

At SPIE this year in Orlando, FL (April 25-29), Nikon Metrology and JEOL, Inc. will feature the latest and greatest in SEM technology including:

The NeoScope benchtop SEM microscope features the powerful electron optics of an SEM, but is as simple to operate as a digital camera. Offering the high resolution and depth of field of a powerful SEM, NeoScope helps accelerate the pace of failure analysis of manufacturing materials.

Basic operation of the NeoScope is simple with auto focus, auto contrast and auto brightness controls. Samples can be loaded and imaged in less than three minutes, without requiring any special sample preparation. Pre-stored parameter files (recipes) allow the user to quickly and automatically set up the NeoScope for a wide variety of material samples.

Visit www.NikonMetrology.com for more details or contact marketing_us@nikonmetrology.com to set up a Demo.


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