Nikon Metrology

Nikon Metrology exhibits at Performance Racing Industry Show in Orlando, FL

Nikon Metrology is exhibiting at one of the top racing shows in the industry this year on December 1-3, 2011 in Booth #4376. Nikon will be featuring an MCA portable CMM arm along with MMDx laser scanner and Optical CMM with K-Scan at this upcoming show. Stop by the booth and see these products in action. Visit http://www.performanceracing.com/tradeshow/ for more details. Learn more….. Click to share on Facebook (Opens in new Read more...

Nikon Metrology Exhibits at CMSC 2011

Nikon Metrology is living large at CMSC 2011 – Booth #708 July 25-29th Arizona Biltmore Hotel & Spa, Phoenix, AZ At this year’s premiere metrology conference, Nikon Metrology is showcasing our large-scale products, including the hot, new G3 MV330/350 Laser Radar, the extremely versatile Optical CMM with MMDx Handheld Scanner and our revolutionary Digital Microscope ShuttlePix -400R. These large-scale products bring your Read more...

Penn State to Face Florida in 25th Anniversary Outback Bowl

The Penn State Nittany Lions and Florida Gators will square-off in the 25th Anniversary Outback Bowl on New Year’s Day. “When you talk about tradition and history of college football it just doesn’t get any better than Penn State and the University of Florida,” said Outback Bowl President/CEO Jim McVay. “It’s our 25th anniversary game and we can’t think of a better way to celebrate it on New Year’s Day than with Coach Paterno’s Read more...

Robot Control Brings Aerospace Tolerances to Automotive Robots

A major Airbus research project to develop greater levels of accuracy in automated drilling and riveting has led to the formation of a consortium to build a robotic platform incoporating a Nikon Metrology K-series Optical CMM. Since industrial robots do not meet Airbus process specifications; Airbus, Nikon Metrology, KUKA and Delmia have formed a consortium to build a new aerospace grade robotic platform. This patent-applied-for solution Read more...

Nikon Metrology and GE Van Wert Company team up to host an Open House Event

LOCATION: GE Van Wert Company, Inc. 461 Boston Street, Suite B4 Topsfield, MA 01983       Experience metrology solutions first-hand as our experts provide product demonstrations and technical expertise regarding your most difficult applications. Products displayed will be microscopes, video measuring systems, optical CMMs, portable arms, and handheld scanners. Refreshments Provided Tuesday & Wednesday, October 26th & 27th | Read more...

Join us for our Nikon Metrology Technology Event in Elgin, Illinois

Nikon Metrology 2130 Point Blvd., Suite 300 Elgin, Illinois  60123  CLICK HERE to RSVP to this event!     Experience metrology solutions first-hand as our experts provide product demonstrations and technical answers to your most difficult applications. Products displayed will be optical CMMs, portable arms, handheld scanners, microscopes and video measuring systems. Refreshments Provided Tuesday, October 26th | Read more...

3D Laser Scanning Accelerates Inspection

  Instead of numerous indexing head rotations and multiple CMM axes displacements that are needed to operate a touch probe, the CMM scanner performs inspection along straightforward linear and polygon motion paths. Every second pinched off from the inspection cycle is multiplied by the number of cycles run on the CMM, adding up to time savings. 3-D laser scanning speeds up part inspection while capturing freeform surfaces and Read more...

Visit Nikon Metrology at IMTS 2010 – Booth #E-5325 and #N-6260

Booth #E-5325 will be featuring Nikon Metrology’s wide range of metrology solutions including: CMMs with both touch probe and 3D laser scanning capabilities, video measuring systems, Industrial microscopes, portable CMM arms with both touch probe and 3D scanning capabilities, X-ray and CT inspection systems and the latest in metrology software. Nikon Metrology has a second booth at the IMTS show this year. Booth #N-6260, located in Read more...

John Deere Uses Optical CMM for Inspection of Agricultural Machines

When measuring large objects such as tractors, it’s a challenge to use traditional coordinate measuring machines (CMMs). Not only is a large and expensive CMM required, but any position change of the measurement object during the inspection measurement will result in losing the alignment. This challenge can be met by the Nikon Metrology K-Series optical CMM, a portable optical CMM that auto-aligns the measurement object by tracking Read more...

Solar Team crosses Australian desert without a single drop of fuel

Covering 3000 km between Darwin and Adelaide   The challenge is simple. Cross the Australian desert as fast as you can without one drop of fuel. Fourteen selected engineering students of Groep T Engineering School in Leuven, Belgium, took up the challenge to hunt for a medal in the World Solar Challenge, the world championship for solar-driven vehicles. From their predecessor team they inherited a solid, proven vehicle design along with Read more...