Nikon Metrology

Upcoming Webinar: Taking Micro-CT out of the Research Lab and onto the Production Line

Computed tomography, Metrology CT, Nikon Metrology, Uncategorized, Upcoming Webinars, Webinars, X-ray and CT Inspection

Industrial micro-CT: From the research lab to the production line.
Feb 17th, 2016 (2:00 PM – 3:00 PM EST — 8:00PM – 9:00PM CET)

Typically X-ray micro computed tomography (CT) has been seen as a slow process carried out in the research lab to evaluate failures or spot defects. It has never been fast enough to be used on a production line – that is until now! Recent advances in high-resolution high-flux rotating targets for X-ray sources, coupled with easy automation of CT scanning parameters and analysis techniques allow samples to be scanned, reconstructed and evaluated in under two minutes, opening many new CT applications.

Register Now