Nikon Metrology

Nikon celebrates American Football

Dr. Andrew Mathers (X-ray CT Project Manager) scanned an American Football helmet to showcase the key components that help aid player safety in the modern game. X-ray CT enables us to non-destructively visualise the different components of the fully assembled helmet and inspect them to assess their build quality and conformity with design, each of which plays a vital role in protecting the athlete. X-ray CT scans of the facemask and helmet were acquired at 143 and 156 µm voxel resolution and 450 and 350 Watts respectively, using a Nikon C2 Large Read more...

Ask our experts – the Eclipse LV issue

Our Microscope expert – Michael Hallewell has been working within Material Microscopy for over 15 years, so has a lot of expertise under his belt. We spoke to him about the Nikon Eclipse LV Microscope & how it is futureproofed for a huge range of tasks.   What is an LV Microscope? The LV is Nikon’s Upright Microscope System for extensive optical analysis of materials. The system offers massive flexibility on components because Read more...

Working with gears? Nikon Metrology can help support your gear production….

Here at Nikon Metrology we offer a wide range of products to support your gear production Perform gear analysis using Nikon’s range of Stereo and Metallurgical Microscopes, precisely measure gears time after time with Nikon’s NEXIV video measurement systems and even using the JEOL NeoScope JCM-7000 benchtop Scanning Electron Microscope for both chemical composition, defect inspection or failure studies.   VIDEO MEASUREMENT NEXIV – Nikon’s non-contact video measuring system, which is changing the way we measure. The Nikon Read more...