Nikon Metrology

Automated wafer inspection with NEXIV video measurement

Automation, Nikon Metrology, Video & Microscope Measuring, Vision Systems, VMA, VMZ System

The NWL200 wafer loader is now available for automated wafer inspection with NEXIV video measuring systems.

The NWL200 series facilitates automated wafer inspection for NEXIV video measuring systems capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors. Improved wafer-sensing functions also help prevent damage to wafers. Watch the video below.





Take a look at the NEXIV systems available or find out more about the NWL200 for automated wafer inspection.

Continue reading and watch the Auto MeasureEyes software video.