The NWL200 wafer loader is now available for automated wafer inspection with NEXIV video measuring systems.
The NWL200 series facilitates automated wafer inspection for NEXIV video measuring systems capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors. Improved wafer-sensing functions also help prevent damage to wafers. Watch the video below.
Continue reading and watch the Auto MeasureEyes software video.