Nikon Metrology

Nikon Metrology Exhibits at ISTFA 2010 in Dallas

Events, Nikon Metrology, X-ray and CT Inspection

ISTFA – International Symposium for Testing and Failure Analysis

Nikon Metrology, Inc
Dallas, TX
Intercontinental Hotel Dallas
November 16-17, 2010

Nikon Metrology will be featuring a wide variety of x-ray and CT inspection solutions at this event.

Enrich your career at the 36th International Symposium for Testing and Failure Analysis, November 14-18 in Dallas, Texas. Acquire the latest knowledge from the field’s leading professionals with six days of tutorials, short courses, technical presentations, panels, and user groups. Research leading edge instruments and solutions at the industry’s largest dedicated equipment expo. Meet and network with hundreds of your peers from novice to expert.

Visit to learn more about X-ray and CT inspection.

X-ray of Ball Grid Array