Nikon Metrology

Spooky goings on this Halloween at Nikon Metrology

Computed tomography, Handheld Scanning, Microscopes, Nikon Metrology, X-ray and CT Inspection

This Halloween, Nikon Metrology uses its technology to explore some creepy items… take a look at some of the haunting images, and find out more about how the technology works.

 

Scanning skulls with the ModelMaker H120

 

Picture shows raw point cloud data points, STL mesh and Colour Map of a laser scanned plastic skull, following the Halloween theme.

Scanning skulls with the ModelMaker H120. Left to right: point cloud data points, STL mesh, colour map.

 

The raw point cloud data points (pictured left) captured by the ModelMaker H120, are converted to an STL mesh (pictured centre) which is used for subsequent inspection. It can be exported and used in many other software packages for purposes such as 3D printing. The third image, the colour map (pictured right) provides an instant picture of the conformity of the entire component as a result of comparing the mesh to a CAD model.

The colour map details the 3D deviation of every point in relation to the adjacent CAD surface. This highlights which areas are within tolerance (usually green on the colour map) and which areas are above and below the CAD surface (usually red and blue respectively). In an industrial scenario this would give the Quality Inspector an insight into the conformity of the component within minutes, and any areas of concern could then be investigated in greater detail.

Find out more about the ModelMaker H120 here.

 


 

Observing a spider under a Scanning Electron Microscope

 

An image of a house spider under observation in a scanning electron microscope (SEM) at various magnifications.

Observing a spider under a Scanning Electron Microscope (SEM).

 

The images of this house spider were produced using the JEOL JCM-7000 Benchtop SEM NeoScope. The system has a seamless transition from Optical to SEM imaging, as well as a Live Analysis function. The JCM-7000 is typically used for materials applications, and can take samples up to 80 mm. However, this spider sample was uncoated / unprepared, and taken at 5 kV, magnification 400 x and no sign of charging.

The new JCM-7000 Benchtop SEM has a small footprint which enables it to be used in any laboratory without special requirements. Many material scientists struggle at present to have instant access to SEM capabilities, the JCM-7000 is the answer to this. It has the ability to go to a magnification of 100,000 x at a resolution around 8 Nm. The JCM-7000 is easy to use and does not need a dedicated person to drive the instrument. In less than half an hour most users will be able to take quality SEM images and also obtain relevant EDS spectra.

Find out more about the Benchtop JEOL JCM-7000 here.

 


 

Exploring the inside of a pumpkin with X-ray CT

 

An image revealing the inside of a complete, solid pumpkin by using CT (computed tomography).

Exploring the inside of a pumpkin with X-ray CT

 

This X-ray CT scan of a Pumpkin Jack-o’-Lantern was acquired by Dr. Andrew Mathers at 100 µm voxel resolution and 245 Watts, using a Nikon XT H 225 LC. The system houses a Nikon 225 kV microfocus X-ray source fitted with a rotating tungsten target and a 1 mm Copper beam filter, coupled with a Varex 1621 EHS flat panel detector. For this scan the detector acquired 3141 projections at an exposure of 500 mS and a gain of 6 dB. X-ray CT data was reconstructed using a modified Filtered Back Projection algorithm in Nikon CT Pro 3D and rendered in 3D using the Phong renderer in Volume Graphics Studio Max 3.3.

A picture of a pumpkin with a Halloween face carved in, scanned using CT (computed tomography).

Carved pumpkin, scanned using CT (computed tomography).

X-ray CT is a non-destructive imaging technique to help visualise and quantify the structure of materials at the microscale in 3D. This approach is therefore extremely useful for inspecting the build quality of components without the need for destructive sampling, coupled with microscopy analysis, which traditional inspection methods rely on. Following the acquisition of X-ray CT scans, a wide range of analyses can be performed to evaluate each component, including but not limited to: defect analysis (porosity, inclusions and cracks), wall thickness, CAD comparison, structural mechanics simulation and conventional metrology. X-ray CT has a wide range of industrial applications including aerospace, electronics, metal casting, plastic moulding, 3D printing, automotive manufacturing and food production, and continues to grow rapidly each year.

Find out more about Nikon’s X-ray and CT solutions here.

 


 

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